Author: Richard Lee Sutherland
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 358
Book Description
The proliferation of lasers and systems employing lasers has brought with it the potential for adverse effects from these bright, coherent light sources. This includes the possibility of damage from pulsed lasers, as well as temporary blinding by continuous-waver lasers. With nearly every wavelength possible being emitted by these sources, there exists a need to develop optical limiters and tunable filters which can suppress undesired radiation of any wavelength. This book addresses a number of materials and devices which have the potential for meeting the challenge. The proceedings is divided into five parts. Parts I and II cover research in organic and inorganic materials primarily based on nonlinear absorption or phase transitions for optical limiting of pulsed lasers. Part III includes photo-refractive materials and liquid crystals which find primary applications in dynamic filters. Part IV covers various aspects of device and material characterization, including nonlinear beam propagation effects. Theoretical modelling of materials properties is the subject of Part V.
Materials for Optical Limiting II: Volume 479
Author: Richard Lee Sutherland
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 358
Book Description
The proliferation of lasers and systems employing lasers has brought with it the potential for adverse effects from these bright, coherent light sources. This includes the possibility of damage from pulsed lasers, as well as temporary blinding by continuous-waver lasers. With nearly every wavelength possible being emitted by these sources, there exists a need to develop optical limiters and tunable filters which can suppress undesired radiation of any wavelength. This book addresses a number of materials and devices which have the potential for meeting the challenge. The proceedings is divided into five parts. Parts I and II cover research in organic and inorganic materials primarily based on nonlinear absorption or phase transitions for optical limiting of pulsed lasers. Part III includes photo-refractive materials and liquid crystals which find primary applications in dynamic filters. Part IV covers various aspects of device and material characterization, including nonlinear beam propagation effects. Theoretical modelling of materials properties is the subject of Part V.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 358
Book Description
The proliferation of lasers and systems employing lasers has brought with it the potential for adverse effects from these bright, coherent light sources. This includes the possibility of damage from pulsed lasers, as well as temporary blinding by continuous-waver lasers. With nearly every wavelength possible being emitted by these sources, there exists a need to develop optical limiters and tunable filters which can suppress undesired radiation of any wavelength. This book addresses a number of materials and devices which have the potential for meeting the challenge. The proceedings is divided into five parts. Parts I and II cover research in organic and inorganic materials primarily based on nonlinear absorption or phase transitions for optical limiting of pulsed lasers. Part III includes photo-refractive materials and liquid crystals which find primary applications in dynamic filters. Part IV covers various aspects of device and material characterization, including nonlinear beam propagation effects. Theoretical modelling of materials properties is the subject of Part V.
Gallium Nitride and Related Materials II: Volume 468
Author: C. R. Abernathy
Publisher: Materials Research Society
ISBN: 9781558993723
Category : Technology & Engineering
Languages : en
Pages : 534
Book Description
This book from MRS dedicated to III-Nitrides, focuses on developments in AlN, GaN, InN and their alloys that are now finding application in short-wavelength lasers (~400nm, cw at room temperature) and high-power electronics (2.8W/mm at GHz). Experts from fields including crystal growth, condensed matter theory, source chemistry, device processing and device design come together in the volume to address issues of both scientific and technological relevance. And while much of the book reports on advances in material preparation and the understanding of defect issues, similar advances in material and device processing are also reported. Topics include: growth and doping; substrates and substrate effects; characterization; processing and device performance and design.
Publisher: Materials Research Society
ISBN: 9781558993723
Category : Technology & Engineering
Languages : en
Pages : 534
Book Description
This book from MRS dedicated to III-Nitrides, focuses on developments in AlN, GaN, InN and their alloys that are now finding application in short-wavelength lasers (~400nm, cw at room temperature) and high-power electronics (2.8W/mm at GHz). Experts from fields including crystal growth, condensed matter theory, source chemistry, device processing and device design come together in the volume to address issues of both scientific and technological relevance. And while much of the book reports on advances in material preparation and the understanding of defect issues, similar advances in material and device processing are also reported. Topics include: growth and doping; substrates and substrate effects; characterization; processing and device performance and design.
Handbook of Optics, Volume IV
Author: Optical Society of America
Publisher: McGraw Hill Professional
ISBN: 0071414797
Category : Technology & Engineering
Languages : en
Pages : 944
Book Description
A new volume in the field's bestselling optics reference--an entirely new opus focusing exclusively on fiber-optics. Contains an ultra-handy, comprehensive index to all four Handbook of Optics volumes.
Publisher: McGraw Hill Professional
ISBN: 0071414797
Category : Technology & Engineering
Languages : en
Pages : 944
Book Description
A new volume in the field's bestselling optics reference--an entirely new opus focusing exclusively on fiber-optics. Contains an ultra-handy, comprehensive index to all four Handbook of Optics volumes.
Materials for Optical Limiting
Author:
Publisher:
ISBN:
Category : Eyeglasses, Protective
Languages : en
Pages : 360
Book Description
Publisher:
ISBN:
Category : Eyeglasses, Protective
Languages : en
Pages : 360
Book Description
Thin Films for Optical Waveguide Devices and Materials for Optical Limiting: Volume 597
Author: Keiichi Nashimoto
Publisher: Mrs Proceedings
ISBN:
Category : Science
Languages : en
Pages : 496
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher: Mrs Proceedings
ISBN:
Category : Science
Languages : en
Pages : 496
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Infrared Applications of Semiconductors II: Volume 484
Author: Donald L. McDaniel
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 720
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 720
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Electrically Based Microstructural Characterization II: Volume 500
Author: Rosario A. Gerhardt
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 394
Book Description
Fifty papers from the December 1997 symposium which covered the application of electrical measurements for the detection of microstructural features at all length scales. In addition to the topics covered in the first symposium--dc and ad resistivity measurements, impedance/admittance analysis, multiplane analysis and various other methods such as electron energy loss spectroscopy, ellipsometry, and capacitance voltage measurements--there are several papers which combine electrical measurements with STM, AFM, NSOM and electroluminescence techniques so that more localized information may be obtainable. Annotation copyrighted by Book News, Inc., Portland, OR
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 394
Book Description
Fifty papers from the December 1997 symposium which covered the application of electrical measurements for the detection of microstructural features at all length scales. In addition to the topics covered in the first symposium--dc and ad resistivity measurements, impedance/admittance analysis, multiplane analysis and various other methods such as electron energy loss spectroscopy, ellipsometry, and capacitance voltage measurements--there are several papers which combine electrical measurements with STM, AFM, NSOM and electroluminescence techniques so that more localized information may be obtainable. Annotation copyrighted by Book News, Inc., Portland, OR
International Aerospace Abstracts
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1016
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1016
Book Description
Materials Reliability in Microelectronics VII: Volume 473
Author: J. Joseph Clement
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 488
Book Description
The inexorable drive for increased integrated circuit functionality and performance places growing demands on the metal and dielectric thin films used in fabricating these circuits, as well as spurring demand for new materials applications and processes. This book directly addresses issues of widespread concern in the microelectronics industry - smaller feature sizes, new materials and new applications that challenge the reliability of new technologies. While the book continues the focus on issues related to interconnect reliability, such as electromigration and stress, particular emphasis is placed on the effects of microstructure. An underlying theme is understanding the importance of interactions among different materials and associated interfaces comprising a single structure with dimensions near or below the micrometer scale. Topics include: adhesion and fracture; gate oxide growth and oxide interfaces; surface preparation and gate oxide reliability; oxide degradation and defects; micro-structure, texture and reliability; novel measurement techniques; interconnect performance and reliability modeling; electromigration and interconnect reliability and stress and stress relaxation.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 488
Book Description
The inexorable drive for increased integrated circuit functionality and performance places growing demands on the metal and dielectric thin films used in fabricating these circuits, as well as spurring demand for new materials applications and processes. This book directly addresses issues of widespread concern in the microelectronics industry - smaller feature sizes, new materials and new applications that challenge the reliability of new technologies. While the book continues the focus on issues related to interconnect reliability, such as electromigration and stress, particular emphasis is placed on the effects of microstructure. An underlying theme is understanding the importance of interactions among different materials and associated interfaces comprising a single structure with dimensions near or below the micrometer scale. Topics include: adhesion and fracture; gate oxide growth and oxide interfaces; surface preparation and gate oxide reliability; oxide degradation and defects; micro-structure, texture and reliability; novel measurement techniques; interconnect performance and reliability modeling; electromigration and interconnect reliability and stress and stress relaxation.
Power Semiconductor Materials and Devices: Volume 483
Author: S. J. Pearton
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 478
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 478
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.