Introduction to Aberrations in Optical Imaging Systems PDF Download
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Author: José Sasián
Publisher: Cambridge University Press
ISBN: 1107006333
Category : Science
Languages : en
Pages : 285
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Book Description
An accessible, well presented introduction to the theory of optical aberrations, covering key topics that are often missing from comparable books.
Author: José Sasián
Publisher: Cambridge University Press
ISBN: 1107006333
Category : Science
Languages : en
Pages : 285
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Book Description
An accessible, well presented introduction to the theory of optical aberrations, covering key topics that are often missing from comparable books.
Author: Virendra N. Mahajan
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819486998
Category : Aberration
Languages : en
Pages : 0
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Book Description
Ten years have passed since the publication of the first edition of this classic text in April 2001. Considerable new material amounting to 100 pages has been added in this second edition. Each chapter now contains a Summary section at the end. The new material in Chapter 4 consists of a detailed comparison of Gaussian apodization with a corresponding beam, determination of the optimum value of the Gaussian radius relative to that of the pupil to yield maximum focal-point irradiance, detailed discussion of standard deviation, aberration balancing, and Strehl ratio for primary aberrations, derivation of the aberration-free and defocused OTF, discussion of an aberrated beam yielding higher axial irradiance in a certain defocused region than its aberration-free focal-point value, illustration that aberrated PSFs lose the advantage of Gaussian apodizaton in reducing the secondary maxima of a PSF, and a brief description of the characterization of the width of a multimode beam. In Chapter 5, the effect of random longitudinal defocus on a PSF is included. The coherence length of atmospheric turbulence is calculated for looking both up and down through the atmosphere. Also discussed are the angle of arrival of a light wave propagating through turbulence, and lucky imaging where better-quality short-exposure images are selected, aligned, and added to obtain a high-quality image.
Author: José Sasián
Publisher: Cambridge University Press
ISBN: 1108494323
Category : Medical
Languages : en
Pages : 251
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Book Description
A concise introduction to lens design, including the fundamental theory, concepts, methods and tools used in the field. Covering all the essential concepts and providing suggestions for further reading at the end of each chapter, this book is an essential resource for graduate students working in optics and photonics.
Author: Virendra N. Mahajan
Publisher: SPIE Press
ISBN: 9780819405364
Category : Science
Languages : en
Pages : 192
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Book Description
This book provides a clear, concise, and consistent exposition of what aberrations are, how they arise in optical imaging systems, and how they affect the quality of images formed by them. The emphasis of the book is on physical insight, problem solving, and numerical results, and the text is intended for engineers and scientists who have a need and a desire for a deeper and better understanding of aberrations and their role in optical imaging and wave propagation. Some knowledge of Gaussian optics and an appreciation for aberrations would be useful but is not required.
Author: Joseph Braat
Publisher: Cambridge University Press
ISBN: 1108428088
Category : Medical
Languages : en
Pages : 987
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Book Description
This comprehensive and self-contained text for researchers and professionals presents a detailed account of optical imaging from the viewpoint of both ray and wave optics.
Author: KOJI SUGIOKA.
Publisher:
ISBN: 9783319695372
Category : Lasers in engineering
Languages : en
Pages :
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Book Description
This handbook provides a comprehensive review of the entire field of laser micro and nano processing, including not only a detailed introduction to individual laser processing techniques but also the fundamentals of laser-matter interaction and lasers, optics, equipment, diagnostics, as well as monitoring and measurement techniques for laser processing. Consisting of 11 sections, each composed of 4 to 6 chapters written by leading experts in the relevant field. Each main part of the handbook is supervised by its own part editor(s) so that high-quality content as well as completeness are assured. The book provides essential scientific and technical information to researchers and engineers already working in the field as well as students and young scientists planning to work in the area in the future. Lasers found application in materials processing practically since their invention in 1960, and are currently used widely in manufacturing. The main driving force behind this fact is that the lasers can provide unique solutions in material processing with high quality, high efficiency, high flexibility, high resolution, versatility and low environmental load. Macro-processing based on thermal process using infrared lasers such as CO2 lasers has been the mainstream in the early stages, while research and development of micro- and nano-processing are becoming increasingly more active as short wavelength and/or short pulse width lasers have been developed. In particular, recent advances in ultrafast lasers have opened up a new avenue to laser material processing due to the capabilities of ultrahigh precision micro- and nanofabrication of diverse materials. This handbook is the first book covering the basics, the state-of-the-art and important applications of the dynamic and rapidly expanding discipline of laser micro- and nanoengineering. This comprehensive source makes readers familiar with a broad spectrum of approaches to solve all relevant problems in science and technology. This handbook is the ultimate desk reference for all people working in the field.
Author: Charles Sumner Williams
Publisher: SPIE Press
ISBN: 9780819443366
Category : Science
Languages : en
Pages : 436
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Book Description
This work covers spatial frequency, spread function, wave aberration, and transfer function - and how these concepts are related in an optical system, how they are measured and calculated, and how they may be useful.
Author: Joseph M. Geary
Publisher: SPIE Press
ISBN: 9780819413772
Category : Technology & Engineering
Languages : en
Pages : 168
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Book Description
This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations.
Author: Virendra N. Mahajan
Publisher: Society of Photo Optical
ISBN: 9780819499981
Category : Technology & Engineering
Languages : en
Pages : 472
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Book Description
Optical imaging starts with geometrical optics, and ray tracing lies at its forefront. This book starts with Fermat’s principle and derives the three laws of geometrical optics from it. After discussing imaging by refracting and reflecting systems, paraxial ray tracing is used to determine the size of imaging elements and obscuration in mirror systems. Stops, pupils, radiometry, and optical instruments are also discussed. The chromatic and monochromatic aberrations are addressed in detail, followed by spot sizes and spot diagrams of aberrated images of point objects. Each chapter ends with a summary and a set of problems. The book ends with an epilogue that summarizes the imaging process and outlines the next steps within and beyond geometrical optics.
Author: Rolf Erni
Publisher: World Scientific Publishing Company
ISBN: 1783265302
Category : Technology & Engineering
Languages : en
Pages : 432
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Book Description
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.
