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Category :
Languages : en
Pages :

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Author:
Publisher:
ISBN:
Category : Microfabrication
Languages : en
Pages :

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Author: Michael T. Postek
Publisher: Society of Photo Optical
ISBN: 9780819472625
Category : Technology & Engineering
Languages : en
Pages : 200

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Book Description
Includes Proceedings Vol. 7821

Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178

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Book Description
Includes Proceedings Vol. 7821

Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132

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Book Description
Includes Proceedings Vol. 7821

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Author: Michael T. Postek
Publisher:
ISBN: 9780819491831
Category : Microfabrication
Languages : en
Pages : 194

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Book Description
Includes Proceedings Vol. 7821

Author: Michael T. Postek
Publisher:
ISBN: 9780819496690
Category : Technology & Engineering
Languages : en
Pages : 110

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Book Description
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Author: Michael T. Postek
Publisher:
ISBN: 9781628412000
Category : Microfabrication
Languages : en
Pages : 277

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Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Author: Günter Wilkening
Publisher: John Wiley & Sons
ISBN: 3527606874
Category : Technology & Engineering
Languages : en
Pages : 541

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Book Description
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing