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Languages : en
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In situ high-voltage electron microscope (HVEM) studies have shown that the highly focused electron beams normally employed for irradiation purposes in the HVEM can cause easily measurable composition changes in the irradiated volume of thin alloy films (Ni-Al). The kinetics of this ''beam-induced'' composition change has been investigated and found to exhibit a strong dependence not only on temperature and peak electron flux, but also on the beam diameter. The dependence on beam diameter has far reaching implications for HVEM studies of radiation effects in alloys, and for microchemical analysis techniques such as EDX and EELS.
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Languages : en
Pages :
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Book Description
In situ high-voltage electron microscope (HVEM) studies have shown that the highly focused electron beams normally employed for irradiation purposes in the HVEM can cause easily measurable composition changes in the irradiated volume of thin alloy films (Ni-Al). The kinetics of this ''beam-induced'' composition change has been investigated and found to exhibit a strong dependence not only on temperature and peak electron flux, but also on the beam diameter. The dependence on beam diameter has far reaching implications for HVEM studies of radiation effects in alloys, and for microchemical analysis techniques such as EDX and EELS.
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Category : Power resources
Languages : en
Pages : 584
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Author: Florian Banhart
Publisher: World Scientific
ISBN: 9814471461
Category : Technology & Engineering
Languages : en
Pages : 318
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Book Description
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
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Languages : en
Pages : 13
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Book Description
Motivated at least initially by materials needs for nuclear reactor development, extensive irradiation effects studies employing TEMs have been performed for several decades, involving irradiation-induced and irradiation-enhanced, microstructural changes, including phase transformations such as precipitation, dissolution, crystallization, amorphization, and order-disorder phenomena. From the introduction of commercial high voltage electron microscopes (HVEM) in the mid-1960s, studies of electron irradiation effects have constituted a major aspect of HVEM application in materials science. For irradiation effects studies two additional developments have had particularly significant impact: (1) The availability of TEM specimen holders in which specimen temperature can be controlled in the range 10--2200 K; and (2) the interfacing of ion accelerators which allows in situ TEM studies of irradiation effects and the ion beam modification of materials within this broad temperature range. This paper treats several aspects of in situ studies of electron and ion beam-induced and enhanced phase changes, including the current state of in situ ion beam capability internationally, and presents two case studies involving in situ experiments performed in an HVEM to illustrate the dynamics of such an approach in materials research.
Author: Hiroshi Fujita
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 576
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Category : Aeronautics
Languages : en
Pages : 836
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Book Description
Author: Renu Sharma
Publisher: John Wiley & Sons
ISBN: 3527347984
Category : Science
Languages : en
Pages : 389
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Book Description
In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.
Author: D. B. Poker
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 940
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Book Description
Several beam-solid interaction techniques have been developed that can either stand alone or be used in connection with others for materials processing, for fabrication of devices with enhanced electro-optical and mechanical properties, and with enhanced resistance to corrosion and erosion. For example, advances in focused ion beams (FIB) have brought out-of-reach ideas and applications to fruition. This book from MRS focuses on the developments in ion-beam-assisted processing of materials and reviews successful applications of the techniques. Topics include: fundamentals of ion-solid interactions; ion-beam mixing; radiation damage; insulators and wide bandgap materials; polymers; optical materials; plasma and ion-assisted techniques; metals and tribology; focused ion beams; fundamental semiconductor processing and compound semiconductors.
Author: Renu Sharma
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 250
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Book Description
Electron microscopy techniques are among the most powerful methods for characterization of materials, with the ability to reveal both the atomic-scale structure and composition. This information may be used to elucidate macroscopic properties or to optimize materials synthesis and processing. Instrumentation and techniques for dynamic in situ experiments are undergoing rapid development and have recently been applied to a wide range of problems. This book focuses on time-resolved electron microscopy (including diffraction and spectroscopy), as well as novel instrumentation for temperature and pressure control. In addition to discussing the application of electron microscopy techniques to the in situ study of the kinetics, thermodynamics and mechanisms of reaction, the book also explores their utility as efficient methods of optimizing processing conditions. Imaging techniques featured include: scanning tunneling microscopy, high-resolution electron microscopy, dark field transmission and reflection electron microscopy, Lorentz microscopy, electron holography, scanning and low-energy electron microscopy and photoemission electron microscopy
Author: I. Yamada
Publisher: Elsevier
ISBN: 1483164047
Category : Technology & Engineering
Languages : en
Pages : 646
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Book Description
Laser and Ion Beam Modification of Materials is a compilation of materials from the proceedings of the symposium U: Material Synthesis and Modification by Ion beams and Laser Beams. This collection discusses the founding of the KANSAI Science City in Japan, and the structures, equipment, and research projects of two institutions are discussed pertaining to eV-MeV ion beams. A description of ion beams as used in materials research and in manufacturing processes, along with trends in ion implantation technology in semiconductors, is discussed. Research into ion beams by China and its industrial uses in non-semiconductor area is noted. For industrial applications, developing technology in terms of high speed, large surface modifications and use of high doses is important. Thus, the development of different ion beam approaches is examined. Industrial applications of ion and laser processing are discussed as cluster beams are used in solid state physics and chemistry. Mention is made on a high power discharge pumped solid state physics (ArF) excimer laser as a potential light source for better material processing. Under ion beam material processing is nanofabrication using focused ion beams, important for research work in mesoscopic systems. Progress in the use of ion-beam mixing using kinetic energy of ion-beams to mingle with pre-deposited surface layers of substrate materials has shown promise. Advanced materials researchers and scientists, as well as academicians in the field of nuclear physics, will find this collection helpful.
