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Author: Roman Louban
Publisher: Springer
ISBN: 9783642007590
Category : Technology & Engineering
Languages : en
Pages : 168
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Book Description
The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.
Author: Roman Louban
Publisher: Springer
ISBN: 9783642007590
Category : Technology & Engineering
Languages : en
Pages : 168
Get Book
Book Description
The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.
Author: Roman Louban
Publisher: Springer Science & Business Media
ISBN: 3642006833
Category : Technology & Engineering
Languages : en
Pages : 174
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Book Description
The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.
Author: Jürgen Beyerer
Publisher: KIT Scientific Publishing
ISBN: 3866449887
Category : Computers
Languages : en
Pages : 160
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Book Description
This book is a collection of 11 review technical reports summarizing the presentations at the 2012 Joint Workshop of Fraunhofer IOSB and Vision and Fusion Laboratory at KIT Karlsruhe, made by the students of the both institutions. The topics include image processing, visual inspection, pattern recognition and classification, human-machine interaction, world modeling, and optical signal processing.
Author: Aboul Ella Hassanien
Publisher: Springer Nature
ISBN: 3031206010
Category : Technology & Engineering
Languages : en
Pages : 844
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Book Description
This proceedings book constitutes the refereed proceedings of the 8th International Conference on Advanced Intelligent Systems and Informatics (AISI 2021), which took place in Cairo, Egypt, during November 20–22, 2022, and is an international interdisciplinary conference that presents a spectrum of scientific research on all aspects of informatics and intelligent systems, technologies, and applications.
Author: Zekâi Şen
Publisher: Springer Nature
ISBN: 9819960622
Category : Technology & Engineering
Languages : en
Pages : 824
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Book Description
This book comprises the proceedings of the 12th International Symposium on Intelligent Manufacturing and Service Systems 2023. The contents of this volume focus on recent technological advances in the field of artificial intelligence in manufacturing & service systems including machine learning, autonomous control, bioinformatics, human-artificial intelligence interaction, digital twin, robotic systems, sybersecurity, etc. This volume will prove a valuable resource for those in academia and industry.
Author: J. Doneker
Publisher: Routledge
ISBN: 1351456474
Category : Science
Languages : en
Pages : 524
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Book Description
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Author: Xin Jin
Publisher: Frontiers Media SA
ISBN: 2832524591
Category : Science
Languages : en
Pages : 180
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Book Description
Author: Van Toi Vo
Publisher: Springer Nature
ISBN: 3031446305
Category : Technology & Engineering
Languages : en
Pages : 1140
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Book Description
This book presents cutting-edge research and developments in the field of biomedical engineering, with a special emphasis on results achieved in Vietnam and neighboring low- and middle-income countries. Covering both fundamental and applied research, and focusing on the theme of “Translational Healthcare Technology from Advanced to Low and Middle Income Countries in the Era of Covid and Digital Transformation”, it reports on the design, fabrication, and application of low-cost and portable medical devices, biosensors, and microfluidic devices, on improved methods for biological data acquisition and analysis, on nanoparticles for biological applications, and on new achievements in biomechanics, tissue engineering, and regeneration. It describes the developments of molecular and cellular biology techniques, neuroengineering techniques, and statistical and computational methods, including artificial intelligence, for biomedical applications. It also discusses strategies to address some relevant issues in biomedical education and entrepreneurship. Gathering the proceedings of the 9th International Conference on The Development of Biomedical Engineering in Vietnam, BME 9, held on December 27-29, 2022, in Ho Chi Minh, Vietnam, the book offers important answers to current challenges in the field and a source of inspiration for scientists, engineers, and researchers with various backgrounds working in different research institutes, companies, and countries.
Author: Banh Tien Long
Publisher: Springer Nature
ISBN: 3030696103
Category : Technology & Engineering
Languages : en
Pages : 1088
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Book Description
This book presents selected, peer-reviewed proceedings of the 2nd International Conference on Material, Machines and Methods for Sustainable Development (MMMS2020), held in the city of Nha Trang, Vietnam, from 12 to 15 November, 2020. The purpose of the conference is to explore and ensure an understanding of the critical aspects contributing to sustainable development, especially materials, machines and methods. The contributions published in this book come from authors representing universities, research institutes and industrial companies, and reflect the results of a very broad spectrum of research, from micro- and nanoscale materials design and processing, to mechanical engineering technology in industry. Many of the contributions selected for these proceedings focus on materials modeling, eco-material processes and mechanical manufacturing.
Author: Heikki Kalviainen
Publisher: Springer Science & Business Media
ISBN: 3540263209
Category : Computers
Languages : en
Pages : 1289
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Book Description
This book constitutes the refereed proceedings of the 14th Scandinavian Conference on Image Analysis, SCIA 2005, held in Joensuu, Finland in June 2005. The 124 papers presented together with 6 invited papers were carefully reviewed and selected from 236 submissions. The papers are organized in topical sections on image segmentation and understanding, color image processing, applications, theory, medical image processing, image compression, digitalization of cultural heritage, computer vision, machine vision, and pattern recognition.
