Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
IEEE Std 960-1993, IEEE Std 1177-1993
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
IEEE Standards
Author: Institute of Electrical and Electronics Engineers
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 360
Book Description
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 360
Book Description
IEEE Standard FASTBUS Modular High-speed Data Acquisition and Control System and IEEE FASTBUS Standard Routines
Author: IEEE Nuclear and Plasma Sciences Society. Nuclear Instruments and Detectors Committee
Publisher: Inst of Elect & Electronic
ISBN: 9781559370264
Category : Automatic data collection systems
Languages : en
Pages : 352
Book Description
Publisher: Inst of Elect & Electronic
ISBN: 9781559370264
Category : Automatic data collection systems
Languages : en
Pages : 352
Book Description
The IEEE Standard Dictionary of Electrical and Electronics Terms
Author: Institute of Electrical and Electronics Engineers
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computers
Languages : en
Pages : 1304
Book Description
Früher u.d.T.: Institute of Electrical and Electronics Engineers: The new IEEE standard dictionary of electrical and electronics terms.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computers
Languages : en
Pages : 1304
Book Description
Früher u.d.T.: Institute of Electrical and Electronics Engineers: The new IEEE standard dictionary of electrical and electronics terms.
Catalog of American national standards. 1994
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 248
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 248
Book Description
Subject Guide to Books in Print
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 3054
Book Description
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 3054
Book Description
Paperbound Books in Print 1995
Author: Reed Reference Publishing
Publisher:
ISBN: 9780835236300
Category : Reference
Languages : en
Pages : 1542
Book Description
Publisher:
ISBN: 9780835236300
Category : Reference
Languages : en
Pages : 1542
Book Description
CD-ROM Book Index
Author: Ann Niles
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 232
Book Description
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 232
Book Description
Nuclear Science Symposium & Medical Imaging Conference
Author:
Publisher:
ISBN:
Category : Diagnostic imaging
Languages : en
Pages : 600
Book Description
Publisher:
ISBN:
Category : Diagnostic imaging
Languages : en
Pages : 600
Book Description
Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.