Author: Materials Research Society
Publisher: Pittsburgh, Pa. : Materials Research Society
ISBN:
Category : Science
Languages : en
Pages : 424
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
High Resolution Electron Microscopy of Defects in Materials: Volume 183
Author: Materials Research Society
Publisher: Pittsburgh, Pa. : Materials Research Society
ISBN:
Category : Science
Languages : en
Pages : 424
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher: Pittsburgh, Pa. : Materials Research Society
ISBN:
Category : Science
Languages : en
Pages : 424
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
High Resolution Electron Microscopy of Defects in Materials:
Author: Robert Sinclair
Publisher: Cambridge University Press
ISBN: 9781107410152
Category : Technology & Engineering
Languages : en
Pages : 418
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher: Cambridge University Press
ISBN: 9781107410152
Category : Technology & Engineering
Languages : en
Pages : 418
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Handbook of Microscopy for Nanotechnology
Author: Nan Yao
Publisher: Springer Science & Business Media
ISBN: 9781402080036
Category : Science
Languages : en
Pages : 772
Book Description
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Publisher: Springer Science & Business Media
ISBN: 9781402080036
Category : Science
Languages : en
Pages : 772
Book Description
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
High Tc Superconductor Materials
Author: E. Kaldis
Publisher: Elsevier
ISBN: 0444596674
Category : Technology & Engineering
Languages : en
Pages : 755
Book Description
The dynamic developments in high-temperature superconductivity over the last three years has augmented the importance of materials research not only for applications, but also for the understanding of underlying physical phenomena. The discovery of new superconductors has opened up new facets of High Tc research, and the perfection of already known materials has enabled reliable physical measurements to be carried out, providing a foundation for theoretical models. The papers in this volume present an overview of the recent developments in the field of High Tc-materials research. One of the highlights of this meeting was the plenary lecture by the Nobel laureate K. Alex Müller on the importance of the apical oxygen phenomena which are strongly connected with Tc changes.
Publisher: Elsevier
ISBN: 0444596674
Category : Technology & Engineering
Languages : en
Pages : 755
Book Description
The dynamic developments in high-temperature superconductivity over the last three years has augmented the importance of materials research not only for applications, but also for the understanding of underlying physical phenomena. The discovery of new superconductors has opened up new facets of High Tc research, and the perfection of already known materials has enabled reliable physical measurements to be carried out, providing a foundation for theoretical models. The papers in this volume present an overview of the recent developments in the field of High Tc-materials research. One of the highlights of this meeting was the plenary lecture by the Nobel laureate K. Alex Müller on the importance of the apical oxygen phenomena which are strongly connected with Tc changes.
纳米技术中的显微学手册
Author:
Publisher: 清华大学出版社有限公司
ISBN: 9787302097587
Category :
Languages : en
Pages : 440
Book Description
本书叙述了电子显微学的内容,共有12个专题。力图使读者对所叙述的方法有一个概念上的理解,而不是只停留在对理论的堆砌上。
Publisher: 清华大学出版社有限公司
ISBN: 9787302097587
Category :
Languages : en
Pages : 440
Book Description
本书叙述了电子显微学的内容,共有12个专题。力图使读者对所叙述的方法有一个概念上的理解,而不是只停留在对理论的堆砌上。
Proceedings of the Second Symposium on Defects in Silicon
Author: W. Murray Bullis
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 716
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 716
Book Description
Stability of Materials
Author: A. Gonis
Publisher: Springer Science & Business Media
ISBN: 1461303850
Category : Science
Languages : en
Pages : 742
Book Description
Engineering materials with desirable physical and technological properties requires understanding and predictive capability of materials behavior under varying external conditions, such as temperature and pressure. This immediately brings one face to face with the fundamental difficulty of establishing a connection between materials behavior at a microscopic level, where understanding is to be sought, and macroscopic behavior which needs to be predicted. Bridging the corresponding gap in length scales that separates the ends of this spectrum has been a goal intensely pursued by theoretical physicists, experimentalists, and metallurgists alike. Traditionally, the search for methods to bridge the length scale gap and to gain the needed predictive capability of materials properties has been conducted largely on a trial and error basis, guided by the skill of the metallurgist, large volumes of experimental data, and often ad hoc semi phenomenological models. This situation has persisted almost to this day, and it is only recently that significant changes have begun to take place. These changes have been brought about by a number of developments, some of long standing, others of more recent vintage.
Publisher: Springer Science & Business Media
ISBN: 1461303850
Category : Science
Languages : en
Pages : 742
Book Description
Engineering materials with desirable physical and technological properties requires understanding and predictive capability of materials behavior under varying external conditions, such as temperature and pressure. This immediately brings one face to face with the fundamental difficulty of establishing a connection between materials behavior at a microscopic level, where understanding is to be sought, and macroscopic behavior which needs to be predicted. Bridging the corresponding gap in length scales that separates the ends of this spectrum has been a goal intensely pursued by theoretical physicists, experimentalists, and metallurgists alike. Traditionally, the search for methods to bridge the length scale gap and to gain the needed predictive capability of materials properties has been conducted largely on a trial and error basis, guided by the skill of the metallurgist, large volumes of experimental data, and often ad hoc semi phenomenological models. This situation has persisted almost to this day, and it is only recently that significant changes have begun to take place. These changes have been brought about by a number of developments, some of long standing, others of more recent vintage.
Thin Films:: Volume 188
Author: M. Doerner
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 408
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 408
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Advanced Metallizations in Microelectronics: Volume 181
Author: Avishay Katz
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 672
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 672
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Electronic Packaging Materials Science V: Volume 203
Author: Edwin D. Lillie
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 488
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 488
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.