Author: Rene Van Grieken
Publisher: CRC Press
ISBN: 9780203908709
Category : Science
Languages : en
Pages : 1016
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Book Description
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Author: Rene Van Grieken
Publisher: CRC Press
ISBN: 0203908708
Category : Science
Languages : en
Pages : 1004
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Book Description
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Author: Günter H. Zschornack
Publisher: Springer Science & Business Media
ISBN: 3540286187
Category : Technology & Engineering
Languages : en
Pages : 969
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Book Description
This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.
Author: Rene Van Grieken
Publisher: CRC Press
ISBN: 9780824706005
Category : Science
Languages : en
Pages : 983
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Book Description
This work updates applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. It promotes the measurement of samples while reducing the scattered background in the x-ray spectrum.
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
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Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: René Grieken
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 728
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Book Description
Provides coverage of all aspects of X-ray spectrometry, including thorough treatments of each X-ray emission analysis technique. The book brings together in-depth discussions of radioisotope X-ray analysis, synchrotron radiation-induced X-ray emission, total reflection X-ray fluorescence analysis and polarized beam X-ray fluorescence analysis. environmental chemists and biochemists, applied physicists, biologists, geologists, metallurgists, and upper-level undergraduate and graduate students in these disciplines.
Author: J. Theo Kloprogge
Publisher: Elsevier
ISBN: 012804523X
Category : Science
Languages : en
Pages : 532
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Book Description
Handbook of Mineral Spectroscopy, Volume 1: X-ray Photoelectron Spectra presents a database of X-ray Photoelectron spectra showing both survey (with chemical analysis) and high-resolution spectra of more than 200 rock-forming and major ore minerals. XPS of minerals is a very powerful technique for analyzing not only the chemical composition of minerals – including, for other techniques, difficult elements such as F and Cl, but also the local environment of atoms in a crystal structure. The book includes a section on silicates and on non-silicates, and is further subdivided according to the normal mineral classes. Brings together and expands upon the limited information available on the XPS of minerals into one handbook Features 2,500 full color, X-ray Photoelectron survey and high-resolution Spectra for use by researchers in the lab and as a reference Includes the chemical information of each mineral Written by experts with more than 50 years of combined mineral spectroscopy experience
Author: G¿nter Gauglitz
Publisher: John Wiley & Sons
ISBN: 3527605029
Category : Science
Languages : de
Pages : 1168
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Book Description
This handbook provides a straightforward introduction to spectroscopy, showing what it can do and how it does it, together with a clear, integrated and objective account of the wealth of information that can be derived from spectra. The sequence of chapters covers a wide range of the electromagnetic spectrum, and the physical processes involved, from nuclear phenomena to molecular rotation processes. - A day-by-day laboratory guide: its design based on practical knowledge of spectroscopists at universities, industries and research institutes - A well-structured information source containing methods and applications sections framed by sections on general topics - Guides users to a decision about which spectroscopic method and which instrumentation will be the most appropriate to solve their own practical problem - Rapid access to essential information - Correct analysis of a huge number of measured spectra data and smart use of such information sources as databases and spectra libraries
Author: Eva Margui
Publisher: Momentum Press
ISBN: 1606503936
Category : Technology & Engineering
Languages : en
Pages : 160
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Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Author: John F. Moulder
Publisher:
ISBN: 9780964812413
Category : Electron spectroscopy
Languages : en
Pages : 261
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Book Description
