Carbon Nitrides PDF Download
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Author: Oleksandr Savateev
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110746972
Category : Science
Languages : en
Pages : 386
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Book Description
Author: Oleksandr Savateev
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110746972
Category : Science
Languages : en
Pages : 386
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Book Description
Author: Zia Karim
Publisher: The Electrochemical Society
ISBN: 1566778646
Category : Science
Languages : en
Pages : 546
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Book Description
This issue of ECS Transactions will cover the following topics in (a) Graphene Material Properties, Preparation, Synthesis and Growth; (b) Metrology and Characterization of Graphene; (c) Graphene Devices and Integration; (d) Graphene Transport and mobility enhancement; (e) Thermal Behavior of Graphene and Graphene Based Devices; (f) Ge & III-V devices for CMOS mobility enhancement; (g) III.V Heterostructures on Si substrates; (h) Nano-wires devices and modeling; (i) Simulation of devices based on Ge, III-V, nano-wires and Graphene; (j) Nanotechnology applications in information technology, biotechnology and renewable energy (k) Beyond CMOS device structures and properties of semiconductor nano-devices such as nanowires; (l) Nanosystem fabrication and processing; (m) nanostructures in chemical and biological sensing system for healthcare and security; and (n) Characterization of nanosystems; (f) Nanosystem modeling.
Author: Harland Tompkins
Publisher: William Andrew
ISBN: 0815517475
Category : Science
Languages : en
Pages : 887
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Book Description
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale. With the acceleration of new instruments and applications now occurring, this book provides an essential foundation for the current science and technology of ellipsometry for scientists and engineers in industry and academia at the forefront of nanotechnology developments in instrumentation, integrated circuits, biotechnology, and pharmaceuticals. Divided into four parts, this comprehensive handbook covers the theory of ellipsometry, instrumentation, applications, and emerging areas. Experts in the field contributed to its twelve chapters, covering various aspects of ellipsometry.
Author: Svetlana A Malinovskaya
Publisher: World Scientific
ISBN: 9814678716
Category : Science
Languages : en
Pages : 271
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Book Description
This volume presents the latest advancements and future developments of atomic, molecular and optical (AMO) physics and its vital role in modern sciences and technologies. The chapters are devoted to studies of a wide range of quantum systems, with an emphasis on understanding of quantum coherence and other quantum phenomena originated from light-matter interactions. The book intends to survey the current research landscape and to highlight major scientific trends in AMO physics as well as those interfacing with interdisciplinary sciences. The volume may be particularly useful for young researchers working on establishing their scientific interests and goals.
Author: Rointan F. Bunshah
Publisher: William Andrew
ISBN: 0815517467
Category : Science
Languages : en
Pages : 887
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Book Description
This second edition, edited by the world-renowned Dr. Rointain Bunshah, is an extensive update of the many improvements in deposition technologies, mechanisms, and applications. Considerably more material was added in Plasma Assisted Vapor Deposition processes, as well as Metallurgical Coating Applications.
Author: Wolfgang Osten
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 814
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Book Description
Includes Proceedings Vol. 7821
Author:
Publisher:
ISBN:
Category : Light
Languages : en
Pages : 334
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Book Description
Author: Rointan Framroze Bunshah
Publisher: William Andrew
ISBN: 0815513372
Category : Science
Languages : en
Pages : 888
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Book Description
This second edition, edited by the world-renowned Dr. Rointain Bunshah, is an extensive update of the many improvements in deposition technologies, mechanisms, and applications. Considerably more material was added in Plasma Assisted Vapor Deposition processes, as well as Metallurgical Coating Applications.
Author:
Publisher:
ISBN:
Category : Optical fibers
Languages : en
Pages : 190
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Book Description
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
