Focused Ion Beams (FIB) - Novel Methodologies and Recent Applications for Multidisciplinary Sciences PDF Download
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Author: Meltem Sezen
Publisher:
ISBN:
Category : Science
Languages : en
Pages :
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Book Description
Considered as the newest field of electron microscopy, focused ion beam (FIB) technologies are used in many fields of science for site-specific analysis, imaging, milling, deposition, micromachining, and manipulation. Dual-beam platforms, combining a high-resolution scanning electron microscope (HR-SEM) and an FIB column, additionally equipped with precursor-based gas injection systems (GIS), micromanipulators, and chemical analysis tools (such as energy-dispersive spectra (EDS) or wavelength-dispersive spectra (WDS)), serve as multifunctional tools for direct lithography in terms of nano-machining and nano-prototyping, while advanced specimen preparation for transmission electron microscopy (TEM) can practically be carried out with ultrahigh precision. Especially, when hard materials and material systems with hard substrates are concerned, FIB is the only technique for site-specific micro- and nanostructuring. Moreover, FIB sectioning and sampling techniques are frequently used for revealing the structural and morphological distribution of material systems with three-dimensional (3D) network at micro-/nanoscale.This book chapter includes many examples on conventional and novel processes of FIB technologies, ranging from analysis of semiconductors to electron tomography-based imaging of hard materials such as nanoporous ceramics and composites. In addition, recent studies concerning the active use of dual-beam platforms are mentioned.
Author: Meltem Sezen
Publisher:
ISBN:
Category : Science
Languages : en
Pages :
Get Book Here
Book Description
Considered as the newest field of electron microscopy, focused ion beam (FIB) technologies are used in many fields of science for site-specific analysis, imaging, milling, deposition, micromachining, and manipulation. Dual-beam platforms, combining a high-resolution scanning electron microscope (HR-SEM) and an FIB column, additionally equipped with precursor-based gas injection systems (GIS), micromanipulators, and chemical analysis tools (such as energy-dispersive spectra (EDS) or wavelength-dispersive spectra (WDS)), serve as multifunctional tools for direct lithography in terms of nano-machining and nano-prototyping, while advanced specimen preparation for transmission electron microscopy (TEM) can practically be carried out with ultrahigh precision. Especially, when hard materials and material systems with hard substrates are concerned, FIB is the only technique for site-specific micro- and nanostructuring. Moreover, FIB sectioning and sampling techniques are frequently used for revealing the structural and morphological distribution of material systems with three-dimensional (3D) network at micro-/nanoscale.This book chapter includes many examples on conventional and novel processes of FIB technologies, ranging from analysis of semiconductors to electron tomography-based imaging of hard materials such as nanoporous ceramics and composites. In addition, recent studies concerning the active use of dual-beam platforms are mentioned.
Author: Lucille A. Giannuzzi
Publisher: Springer Science & Business Media
ISBN: 038723313X
Category : Science
Languages : en
Pages : 362
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Book Description
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Author: Nan Yao
Publisher: Cambridge University Press
ISBN: 1107320569
Category : Technology & Engineering
Languages : en
Pages : 496
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Book Description
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
Author: Ozan Artun
Publisher: BoD – Books on Demand
ISBN: 1837691088
Category : Science
Languages : en
Pages : 112
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Book Description
The scientific and commercial purposes of ion beams are remarkable in many fields because ion beam technology is a primary tool that provides a wide range of applications in science, medicine, space, and engineering. This book presents theoretical and experimental knowledge about ion beam applications and technology. It includes six chapters that address such topics as the interaction of ion beams with matter, the evaluation of nuclear material damage, surface microstructure changes, oblique Ar+ sputtered SiC thin films, electron beam processing, and ribbon ion beams.
Author: Milos Janecek
Publisher: BoD – Books on Demand
ISBN: 9535122525
Category : Science
Languages : en
Pages : 302
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Book Description
This book brings a broad review of recent global developments in theory, instrumentation, and practical applications of electron microscopy. It was created by 13 contributions from experts in different fields of electron microscopy and technology from over 20 research institutes worldwide.
Author: David C. Cox
Publisher: Morgan & Claypool Publishers
ISBN: 1681741482
Category : Technology & Engineering
Languages : en
Pages : 119
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Book Description
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.
Author: Jon Orloff
Publisher: Springer Science & Business Media
ISBN: 1461507650
Category : Technology & Engineering
Languages : en
Pages : 304
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Book Description
In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.
Author: Nan Yao
Publisher:
ISBN: 9781139810104
Category : Focused ion beams
Languages : en
Pages : 395
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Book Description
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
Author:
Publisher: World Scientific
ISBN: 9811235155
Category : Science
Languages : en
Pages : 2475
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Book Description
World Scientific Reference on Plasmonic Nanomaterials: Principles, Design and Bio-applications is a book collection that encompasses multiple aspects of the exciting and timely field of nanoplasmonics, under the coordination of international plasmonic nanomaterials expert, Dr Luis Liz-Marzán. Plasmonics has a long history, from stained glass in ancient cathedrals, through pioneering investigations by Michael Faraday, all the way into the nanotechnology era, where it blossomed into an extremely active field of research with potential applications in a wide variety of technologies.Given the breadth of the materials, phenomena and applications related to plasmonics, this Reference Set offers a collection of chapters within dedicated volumes, focusing on the description of selected phenomena, with an emphasis in chemistry as an enabling tool for the fabrication of, often sophisticated, plasmonic nanoarchitectures and biomedicine as the target application.Basic principles of surface plasmon resonances are described, as well as those mechanisms related to related phenomena such as surface-enhanced spectroscopies or plasmonic chirality. Under the guidance of theoretical models, wet chemistry methods have been implemented toward the synthesis of a wide variety of nanoparticles with different compositions and tailored morphology. But often the optimal nanoarchitecture requires post-synthesis treatments, including functionalization of nanoparticle surfaces, application of external stimuli toward self-assembly into well-defined supraparticle structures and so-called supercrystals. All such nanomaterials can find applications in various biomedical aspects, most often in relation to diagnosis, through either the detection of disease biomarkers at extremely low concentrations or the design of bioimaging methods for in vivo monitoring. Additionally, novel therapeutic tools can also profit from plasmonic nanomaterials, such as photothermal therapy or nanocatalysis.The reference set thus offers comprehensive information of an extremely active subset within the world of plasmonic nanomaterials and their applications, which aims at not just collecting existing knowledge but also promoting further research and technology transfer into the market and the clinic.
Author: Ishaq Ahmad
Publisher: BoD – Books on Demand
ISBN: 178984570X
Category : Technology & Engineering
Languages : en
Pages : 115
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Book Description
A wide variety of ion beam techniques are being used in several versatile applications ranging from environmental science, nuclear physics, microdevice fabrication to materials science. In addition, new applications of ion beam techniques across a broad range of disciplines and fields are also being discovered frequently. In this book, the latest research and development on progress in ion beam techniques has been compiled and an overview of ion beam irradiation-induced applications in nanomaterial-focused ion beam applications, ion beam analysis techniques, as well as ion implantation application in cells is provided. Moreover, simulations of ion beam-induced damage to structural materials of nuclear fusion reactors are also presented in this book.
