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Author: Parag K. Lala
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 296
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Book Description
Author: Parag K. Lala
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 296
Get Book Here
Book Description
Author: Lala
Publisher:
ISBN: 9788178000381
Category : Electronic digital computers
Languages : en
Pages : 263
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Book Description
Author: Parag K. Lala
Publisher: Morgan Kaufmann
ISBN: 9780124343702
Category : Computers
Languages : en
Pages : 238
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Book Description
With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design
Author: Parag K. Lala
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Michel Banatre
Publisher: Springer Science & Business Media
ISBN: 9783540577676
Category : Computers
Languages : en
Pages : 332
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Book Description
Fault tolerance has been an active research area for many years. This volume presents papers from a workshop held in 1993 where a small number of key researchers and practitioners in the area met to discuss the experiences of industrial practitioners, to provide a perspective on the state of the art of fault tolerance research, to determine whether the subject is becoming mature, and to learn from the experiences so far in order to identify what might be important research topics for the coming years. The workshop provided a more intimate environment for discussions and presentations than usual at conferences. The papers in the volume were presented at the workshop, then updated and revised to reflect what was learned at the workshop.
Author: Olga Goloubeva
Publisher: Springer Science & Business Media
ISBN: 0387329374
Category : Technology & Engineering
Languages : en
Pages : 238
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Book Description
This book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects needed to put it to work on real examples. By evaluating accurately the advantages and disadvantages of the already available approaches, the book provides a guide to developers willing to adopt software-implemented hardware fault tolerance in their applications. Moreover, the book identifies open issues for researchers willing to improve the already available techniques.
Author: Parag K. Lala
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 296
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Book Description
Author: Parag K. Lala
Publisher: Springer Nature
ISBN: 303179785X
Category : Technology & Engineering
Languages : en
Pages : 99
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Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Shem-Tov Levi
Publisher: McGraw-Hill Companies
ISBN:
Category : Computers
Languages : en
Pages : 440
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Book Description
This book presents a comprehensive exploration of the practical issues, tested techniques, and accepted theory for developing fault tolerant systems. It is a ready reference to work already done in the field, with new approaches devised by the authors.
Author: P. A. Lee
Publisher: Springer
ISBN:
Category : Computers
Languages : en
Pages : 344
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Book Description
