Failure Rate Mathematical Models for Discrete Semiconductors PDF Download
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Author: Thomas W. Butler
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 128
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Book Description
This study revises and updates the appropriate sections of Military Handbook 217B, 'Reliability Prediction of Electronic Equipment, ' pertaining to semi-conductor devices, section 2.2. More than 200 billion part-hours of field operating data were collected and analyzed during the study effort. Significant revisions were made to environmental factors and some quality factors. (Author).
Author: Thomas W. Butler
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 128
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Book Description
This study revises and updates the appropriate sections of Military Handbook 217B, 'Reliability Prediction of Electronic Equipment, ' pertaining to semi-conductor devices, section 2.2. More than 200 billion part-hours of field operating data were collected and analyzed during the study effort. Significant revisions were made to environmental factors and some quality factors. (Author).
Author:
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 236
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Book Description
Author: Vincent R. Lalli
Publisher:
ISBN:
Category : Maintainability (Engineering)
Languages : en
Pages : 372
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Book Description
The theme of this manual is failure physics - the study of how products, hardware, software, and systems fail and what can be done about it. The intent is to impart useful information, to extend the limits of production capability, and to assist in achieving low-cost reliable products. In a broader sense the manual should do more. It should underscore the urgent need for mature attitudes toward reliability. Five of the chapters were originally presented as a classroom course to over 1000 Martin Marietta engineers and technicians. Another four chapters and three appendixes have been added. We begin with a view of reliability from the years 1940 to 2000. Chapter 2 starts the training material with a review of mathematics and a description of what elements contribute to product failures. The remaining chapters elucidate basic reliability theory and the disciplines that allow us to control and eliminate failures.
Author: P.A. Markowich
Publisher: Springer Science & Business Media
ISBN: 3709136784
Category : Technology & Engineering
Languages : en
Pages : 203
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Book Description
In the last two decades semiconductor device simulation has become a research area, which thrives on a cooperation of physicists, electrical engineers and mathe maticians. In this book the static semiconductor device problem is presented and analysed from an applied mathematician's point of view. I shall derive the device equations - as obtained for the first time by Van Roosbroeck in 1950 - from physical principles, present a mathematical analysis, discuss their numerical solu tion by discretisation techniques and report on selected device simulation runs. To me personally the most fascinating aspect of mathematical device analysis is that an interplay of abstract mathematics, perturbation theory, numerical analysis and device physics is prompting the design and development of new technology. I very much hope to convey to the reader the importance of applied mathematics for technological progress. Each chapter of this book is designed to be as selfcontained as possible, however, the mathematical analysis of the device problem requires tools which cannot be presented completely here. Those readers who are not interested in the mathemati cal methodology and rigor can extract the desired information by simply ignoring details and proofs of theorems. Also, at the beginning of each chapter I refer to textbooks which introduce the interested reader to the required mathematical concepts.
Author:
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ISBN:
Category : Aeronautics
Languages : en
Pages : 994
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1230
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Author: United States. Defense Logistics Studies Information Exchange
Publisher:
ISBN:
Category : Military research
Languages : en
Pages : 1070
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Author:
Publisher:
ISBN:
Category : Maintainability (Engineering)
Languages : en
Pages : 528
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Book Description
Author:
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 556
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Book Description
Author: Vincent R. Lalli
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 236
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Book Description
