Failure Analysis of Integrated Circuits PDF Download
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Author: Lawrence C. Wagner
Publisher: Springer Science & Business Media
ISBN: 1461549191
Category : Technology & Engineering
Languages : en
Pages : 256
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Book Description
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Author: Lawrence C. Wagner
Publisher: Springer Science & Business Media
ISBN: 1461549191
Category : Technology & Engineering
Languages : en
Pages : 256
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Book Description
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Author: Friedrich Beck
Publisher: John Wiley & Sons
ISBN: 9780471974017
Category : Technology & Engineering
Languages : en
Pages : 198
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Book Description
Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.
Author: Vijay K. Garg
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN: 9781538649299
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 378
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Book Description
Author: IEEE Staff
Publisher:
ISBN: 9781424455966
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN: 9781728135526
Category :
Languages : en
Pages :
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Author: IEEE Singapore Section
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: IEEE Staff
Publisher:
ISBN: 9781467382601
Category :
Languages : en
Pages :
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Book Description
IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies
