Epitaxial Growth and Characterization of Narrow Bandgap III-V Semiconductors and Related Semimetals

Epitaxial Growth and Characterization of Narrow Bandgap III-V Semiconductors and Related Semimetals PDF Author: Sukgeun Choi
Publisher:
ISBN:
Category :
Languages : en
Pages : 246

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Epitaxial Growth and Characterization of Thin Films and Superlattices of Wide Band Gap II-VI Semiconductors Grown by Pulsed Laser Deposition

Epitaxial Growth and Characterization of Thin Films and Superlattices of Wide Band Gap II-VI Semiconductors Grown by Pulsed Laser Deposition PDF Author: Shengxi Duan
Publisher:
ISBN:
Category : Epitaxy
Languages : en
Pages : 142

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High Purity Epitaxial Growth and Characterization of III-V Compound Semiconductors

High Purity Epitaxial Growth and Characterization of III-V Compound Semiconductors PDF Author: Thomas John Roth
Publisher:
ISBN:
Category :
Languages : en
Pages : 236

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The growth and characterization of epitaxial indium gallium arsenide phosphide compound semiconductor films are described. Methods have been developed to improve the purity of both InP and GaAs and to better assess the crystalline homogeneity of the InGaAsP alloy system. A thermodynamic analysis of impurity incorporation in the hydride vapor phase growth technique is presented for InP and GaAs. In this work techniques have been developed to produce state-of-the-art high purity InP epitaxial films. These films are then utilized in the chemical identification of acceptors in low temperature photoluminescence. The effects of adding oxygen and varying the input partial pressure of arsine on impurity incorporation in GaAs are examined in detail. A controlled amount of oxygen added to the reaction vessel is shown to reduce dramatically the amount of silicon (one of the primary impurity species) incorporated into GaAs. The input partial pressure of arsine is found to impact the incorporation of sulfur, germanium and silicon (germanium and silicon as acceptors as well as donors). Double crystal x-ray diffractometry is used to provide an improved method to assess the quality of alloys of InGaAsP. Diffraction profiles which approach the theoretical limit of this material system are presented. Furthermore, a nondestructive technique for determining curvature in nonplanar crystals is presented.

III-V Semiconductor Materials and Devices

III-V Semiconductor Materials and Devices PDF Author: R. J. Malik
Publisher: North Holland
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 748

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The main emphasis of this volume is on III-V semiconductor epitaxial and bulk crystal growth techniques. Chapters are also included on material characterization and ion implantation. In order to put these growth techniques into perspective a thorough review of the physics and technology of III-V devices is presented. This is the first book of its kind to discuss the theory of the various crystal growth techniques in relation to their advantages and limitations for use in III-V semiconductor devices.

Epitaxial Microstructures

Epitaxial Microstructures PDF Author:
Publisher: Academic Press
ISBN: 0080864376
Category : Science
Languages : en
Pages : 457

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Newly developed semiconductor microstructures can now guide light and electrons resulting in important consequences for state-of-the-art electronic and photonic devices. This volume introduces a new generation of epitaxial microstructures. Special emphasis has been given to atomic control during growth and the interrelationship between the atomic arrangements and the properties of the structures. Atomic-level control of semiconductor microstructures Molecular beam epitaxy, metal-organic chemical vapor deposition Quantum wells and quantum wires Lasers, photon(IR)detectors, heterostructure transistors

Organometallic Vapor-phase Epitaxial Growth and Characterization of III-V Semiconductor Alloys Emitting Visible Light

Organometallic Vapor-phase Epitaxial Growth and Characterization of III-V Semiconductor Alloys Emitting Visible Light PDF Author: Diansheng Cao
Publisher:
ISBN:
Category : Epitaxy
Languages : en
Pages : 298

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Epitaxial Growth, Characterization and Application of Novel Wide Bandgap Oxide Semiconductors

Epitaxial Growth, Characterization and Application of Novel Wide Bandgap Oxide Semiconductors PDF Author: Jeremy West Mares
Publisher:
ISBN:
Category : Molecular beam epitaxy
Languages : en
Pages : 136

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In this work, a body of knowledge is presented which pertains to the growth, characterization and exploitation of high quality, novel II-IV oxide epitaxial films and structures grown by plasma-assisted molecular beam epitaxy. The two compounds of primary interest within this research are the ternary films Ni[subscript x]Mg1[subscript x]O and Zn[subscript x]Mg1[subscript x]0 and the investigation focuses predominantly on the realization, assessment and implementation of these two oxides as optoelectronic materials. The functioning hypothesis for this largely experimental effort has been that these cubic ternary oxides can be exploited--and possibly even juxtaposed--to realize novel wide band gap optoelectronic technologies. The results of the research conducted presented herein overwhelmingly support this hypothesis in that they confirm the possibility to grow these films with sufficient quality by this technique, as conjectured. Ni[subscript x]Mg1−[subscript x]O films with varying Nickel concentrations ranging from x = 0 to x = 1 have been grown on lattice matched MgO substrates (lattice mismatch [epsilon][less than]0.01) and characterized structurally, morphologically, optically and electrically. Similarly, cubic Zn[subscript x]Mg1−[subscript x]0 films with Zinc concentrations ranging from x = 0 to x[almost equal to]0.53, as limited by phase segregation, have also been grown and characterized. Photoconductive devices have been designed and fabricated from these films and characterized. Successfully engineered films in both categories exhibit the desired deep ultraviolet photoresponse and therefore verify the hypothesis. While the culminating work of interest here focuses on the two compounds discussed above, the investigation has also involved the characterization or exploitation of related films including hexagonal phase Zn[subscript x]Mg1−[subscript x]O, ZnO, Cd[subscript x]Zn1−[subscript x]O and hybrid structures based on these compounds used in conjunction with GaN. These works were critical precursors to the growth of cubic oxides, however, and are closely relevant. Viewed in its entirety, this document can therefore be considered a multifaceted interrogation of several novel oxide compounds and structures, both cubic and wurtzite in structure. The conclusions of the research can be stated succinctly as a quantifiably successful effort to validate the use of these compounds and structures for wide bandgap optoelectronic technologies.

Synthesis and Characterization of Highly-mismatched III-V Semiconductors by Gas-source Molecular Beam Epitaxy

Synthesis and Characterization of Highly-mismatched III-V Semiconductors by Gas-source Molecular Beam Epitaxy PDF Author: Tsung-Pei Chin
Publisher:
ISBN:
Category :
Languages : en
Pages : 300

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Synthesis of Narrow Band-gap III-V Semiconductors Using Metal-organic Vapor Phase Epitaxy

Synthesis of Narrow Band-gap III-V Semiconductors Using Metal-organic Vapor Phase Epitaxy PDF Author: Smita Jha
Publisher:
ISBN:
Category :
Languages : en
Pages : 143

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Epitaxial Growth and Characterization of Multifunctional Heterostructures

Epitaxial Growth and Characterization of Multifunctional Heterostructures PDF Author: Swedesh Kumar Srivastava
Publisher:
ISBN:
Category :
Languages : en
Pages : 758

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