Electron Microscopy Ii - Proceedings Of The 5th Asia-pacific Electron Microscopy Conference PDF Download
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Author: Ke-hsin Kuo
Publisher: World Scientific
ISBN: 9814554812
Category :
Languages : en
Pages : 454
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Book Description
Author: Ke-hsin Kuo
Publisher: World Scientific
ISBN: 9814554812
Category :
Languages : en
Pages : 454
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Z H Zhai
Publisher: World Scientific
ISBN: 9814554820
Category :
Languages : en
Pages : 662
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Book Description
This unique one-volume handbook provides a quick and concise reference guide for practising ophthalmologists, retinal specialists, vitreo-retinal fellows, ophthalmology residents and optometrists on the latest recommendations for managing common vitreo-retinal disorders seen in everyday retina practise. It provides comprehensive and essential information on diagnosis and management in outline and table format for conciseness and quick access. Color illustrations of important clinical manifestations are provided in an appendix.Dr Susanna Park is a Professor of ophthalmology and Director of Vitreo-retinal Fellowship and Ocular Oncology at the University of California Davis Eye Center. She has over 20 years clinical experience as a vitreo-retinal specialist and published over 100 journal papers and book chapters on the subject.
Author: Partha Ghosal
Publisher: Springer Nature
ISBN: 981162982X
Category : Science
Languages : en
Pages : 265
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Book Description
This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume include papers on aberration corrected TEM & STEM, SEM – FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging associated with bio-nanotechnology, medical applications, host-pathogen interaction, etc. This book will be beneficial to researchers, educators, and practitioners alike.
Author: Ke-hsin Kuo
Publisher:
ISBN: 9789814537544
Category : SCIENCE
Languages : en
Pages : 662
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Book Description
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128134054
Category : Science
Languages : en
Pages : 766
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Book Description
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text
Author:
Publisher: Academic Press
ISBN: 0128025905
Category : Technology & Engineering
Languages : en
Pages : 269
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Book Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field
Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0081022573
Category : Science
Languages : en
Pages : 728
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Book Description
Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text
Author:
Publisher: Academic Press
ISBN: 9780080577623
Category : Science
Languages : en
Pages : 885
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Book Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562
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Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Includes authoritative coverage of the fundamental theory behind electron beams Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
