Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Silicon. MSC Report PDF Download
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Languages : en
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The diffraction effects expected from the periodic structure of twist boundaries in Si were determined by an examination of the reciprocal lattice of these boundaries. Methods of analysis were developed to distinguish between the real diffraction spots due to the periodic boundary structure and those due to double diffraction effects. The electron microscope images for the boundaries studied in Si bicrystals frequently were complex and contained Moire fringes which provided no information on the actual boundary structure. By analyzing the electron diffraction patterns from these boundaries for the presence of new diffraction spots it was possible to show that all the .sigma.1 (001), .sigma.1 (111), and .sigma.3 (111) twist boundaries examined have a periodic structure.
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Languages : en
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The diffraction effects expected from the periodic structure of twist boundaries in Si were determined by an examination of the reciprocal lattice of these boundaries. Methods of analysis were developed to distinguish between the real diffraction spots due to the periodic boundary structure and those due to double diffraction effects. The electron microscope images for the boundaries studied in Si bicrystals frequently were complex and contained Moire fringes which provided no information on the actual boundary structure. By analyzing the electron diffraction patterns from these boundaries for the presence of new diffraction spots it was possible to show that all the .sigma.1 (001), .sigma.1 (111), and .sigma.3 (111) twist boundaries examined have a periodic structure.
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Category : Power resources
Languages : en
Pages : 1472
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Author: Philip A. Lamarre
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Category : Diffraction
Languages : en
Pages : 314
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Languages : en
Pages :
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Electron diffraction and microscopy studies supplemented by electron spectroscopic techniques such as Auger electron spectroscopy and energy dispersive x-ray spectroscopy were used to characterize the nature of grain boundary segregation in commercial grade (Mn, Zn)Fe2O4 samples containing small quantities of CaO. Chemical analyses by AES and EDAX show an enrichment of Ca near the grain boundary region. Convergent beam electron diffraction experiments show that the crystal symmetry of the spinel structure is distorted in the vicinity of the grain boundary. In-situ heating experiments in HVEM show the existence of a disordered phase at the sintering temperature. Lorentz microscopy in TEM shows the interaction of magnetic domain wall motion with grain boundaries. These chemical and structural features are correlated with electrical resistivity and magnetic permeability of the ferrites. 4 figures.
Author: Jamie Hoyt Rose
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Category :
Languages : en
Pages : 392
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Category : Aeronautics
Languages : en
Pages : 308
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Author: Cornell University. College of Engineering
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Category : Engineering
Languages : en
Pages : 2034
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Author: Valerie Randle
Publisher: CRC Press
ISBN: 9780750302357
Category : Science
Languages : en
Pages : 182
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As the selection of material for particular engineering properties becomes increasingly important in keeping costs down, methods for evaluating material properties also become more relevant. One such method examines the geometry of grain boundaries, which reveals much about the properties of the material. Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications. The book also includes a glossary of terms. Exploring both the experimental and analytical aspects of the subject, this practical reference guide is essential for researchers and students involved in material properties, whether in physics, materials science, metallurgy, or physical chemistry.
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Category :
Languages : en
Pages : 900
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Author: Vicki J. Keast
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Category : Electron microscopy
Languages : en
Pages : 316
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Changes in the electronic structure, and hence bonding, at the grain boundaries in the presence of the segregants has been examined using the electron energy loss near edge structure (ELNES). In the embrittling systems of S-doped Ni and Sb-doped Cu, extra intensity in the ionization edge, just above the edge onset, was observed and is consistent with earlier measurements on Bi-doped Cu. No effect was seen with segregation of the non-embrittling Ag. The embrittling impurities are believed to reduce cohesion at the grain boundaries by changing the shape of the d-band, through bond rehybridization, and it is this change in shape that is observed as the extra intensity in the ELNES.
