Eighth International Congress on X-ray Optics and Microanalysis PDF Download
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Author: Donald Robert Beaman
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 690
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Book Description
Author: Donald Robert Beaman
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 690
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Book Description
Author: Robert Ogilvie
Publisher:
ISBN: 9780895000125
Category :
Languages : en
Pages :
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Author: Gottfried Möllenstedt
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : de
Pages : 624
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Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Author:
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ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 974
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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 964
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Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages :
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Book Description
First multi-year cumulation covers six years: 1965-70.
Author: Melissa A. Denecke
Publisher: American Institute of Physics
ISBN: 9780735407640
Category : Science
Languages : en
Pages : 0
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Book Description
ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
Author:
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ISBN:
Category : Power resources
Languages : en
Pages : 1332
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Author:
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ISBN:
Category : Science
Languages : en
Pages : 476
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Author: K.F.J. Heinrich
Publisher: Springer Science & Business Media
ISBN: 1489926178
Category : Science
Languages : en
Pages : 397
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Book Description
In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
