Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Eighth International Conference on X-ray Optics and Microanalysis and Twelfth Annual Conference of the Microbeam Analysis Society
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Eighth International Conference on X-ray Optics and Microanalysis and Twelfth Annual Conference of the Microbeam Analysis Society
Author:
Publisher:
ISBN:
Category : Materials
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Materials
Languages : en
Pages :
Book Description
Eighth International Conference on X-Ray Optics and Microanalysis and Twelfth Annual Conference of the Microbeam Analysis Society
Author:
Publisher:
ISBN:
Category : Microchemistry
Languages : en
Pages : 204
Book Description
Publisher:
ISBN:
Category : Microchemistry
Languages : en
Pages : 204
Book Description
Eighth International Conference on X-Ray Optics and Microanalysis and Twelfth Annual Conference of the Microbeam Analysis Society
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Eighth International Conference on X-ray Optics and Microanalysis and Twelfth Annaual Conference of the Microbeam Analysis Society, August 18-24, 1977, Boston Sheraton, Boston Massachusetts
Author: Microbeam Analysis Society
Publisher:
ISBN:
Category : Microchemistry
Languages : en
Pages : 850
Book Description
Publisher:
ISBN:
Category : Microchemistry
Languages : en
Pages : 850
Book Description
8. International Conference on X-ray Optics and Microanalysis and 12. Annual Conference of the Microbeam Analysis Society
Author: Microbeam Analysis Society
Publisher:
ISBN:
Category :
Languages : en
Pages : 204
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 204
Book Description
X-ray Optics and Microanalysis; and Twelfth Annual Conference of the Microbeam Analysis Society
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
PROCEEDINGS- 8TH INTERNATIONAL CONFERENCE ON X-RAY OPTICS AND MICROANALYSIS AND THE 12TH ANNUAL CONFERENCE OF THE MICROBEAM ANALYSIS SOCIETY.
Author:
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ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Eighth International Congress on X-ray Optics and Microanalysis
Author: Donald Robert Beaman
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 690
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 690
Book Description
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Author: Gottfried Möllenstedt
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : de
Pages : 624
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : de
Pages : 624
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.