Author: J. M. Drake
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 426
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Dynamics in Small Confining Systems: Volume 290
Author: J. M. Drake
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 426
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 426
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Liquid Crystals In Complex Geometries
Author: G P Crawford
Publisher: CRC Press
ISBN: 9780748404643
Category : Science
Languages : en
Pages : 528
Book Description
Focusing on the applied and basic aspects of confined liquid crystals, this book provides a current treatise of the subject matter and places it in the broader context of electrooptic applications. The book takes an interdisciplinary approach to the
Publisher: CRC Press
ISBN: 9780748404643
Category : Science
Languages : en
Pages : 528
Book Description
Focusing on the applied and basic aspects of confined liquid crystals, this book provides a current treatise of the subject matter and places it in the broader context of electrooptic applications. The book takes an interdisciplinary approach to the
Advances in Chemical Physics
Author: Ilya Prigogine
Publisher: John Wiley & Sons
ISBN: 0470142049
Category : Science
Languages : en
Pages : 488
Book Description
This series provides chemical physics with a forum for critical, authoritative evaluations of advances in every are of the discipline. Volume 92 continues to report recent advances with a significant, up-to-date selection of papers by internationally recognized researchers.
Publisher: John Wiley & Sons
ISBN: 0470142049
Category : Science
Languages : en
Pages : 488
Book Description
This series provides chemical physics with a forum for critical, authoritative evaluations of advances in every are of the discipline. Volume 92 continues to report recent advances with a significant, up-to-date selection of papers by internationally recognized researchers.
Liquid Dynamics
Author: John T. Fourkas
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 350
Book Description
The dynamics of liquids play a major role in many chemical, physical, and biological processes. However, the strong intermolecular interactions and high degree of disorder that characterize liquids pose a significant challenge to developing a detailed understanding of this state of matter. The chapters of this book describe current research using state-of-the-art techniques in experiment, simulation, and theory to unravel the mysteries of liquid behavior. Sections of the book are devoted to microscopic dynamics, photochemistry, vibrational dynamics, water, metastable liquids, and confined liquids. The introduction includes a detailed background discussion of terminology, major problems, and leading approaches in the context of these different topic areas.
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 350
Book Description
The dynamics of liquids play a major role in many chemical, physical, and biological processes. However, the strong intermolecular interactions and high degree of disorder that characterize liquids pose a significant challenge to developing a detailed understanding of this state of matter. The chapters of this book describe current research using state-of-the-art techniques in experiment, simulation, and theory to unravel the mysteries of liquid behavior. Sections of the book are devoted to microscopic dynamics, photochemistry, vibrational dynamics, water, metastable liquids, and confined liquids. The introduction includes a detailed background discussion of terminology, major problems, and leading approaches in the context of these different topic areas.
Scientific Basis for Nuclear Waste Management XVI: Volume 294
Author: Charles G. Interrante
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1006
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book was first published in 1993.
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1006
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book was first published in 1993.
Atomic-scale Imaging of Surfaces and Interfaces
Author: D. K. Biegelsen
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 312
Book Description
Materials tunneling microscopy for hydrogen-desorption-induced structural change of Si(111) surface; Steps on the (110) surface InP; Scanning tunneling microscopy on charge density waves in layered compounds; Design of ultra high vacuum scanning electron microscope combined with scanning tunneling microscope; Scanning tunneling microscopy perspective of structures on reduced SrTiO3(001) surfaces; Surface structure and electronic property of reduced SrTiO3(100) surface observed by STM/STS; Metastable structural surface excitations and concerted adatom motions: a STM study of atomic motions within a semiconductor surface; Mechanisms and energetics of surface atomic processes: an atom-probe field ion microscope study; Atomic arrangement of Al near the phase boundaries between square root 3X square root 3-Al and 7X7 structures on Si(111) surfaces; Growth and surface morphology of thin silicon films using an atomic force microscope; Solving interface structures by combined electron microscopy and X-ray diffraction; Quantitative hrem study of the atomic structure of the sum(310)/[001] symmetric tilt grain boundary in Nb; Hrtem observation of a sum =3 \{112\} bicrystal boundary in aluminum; Atomic structure of the (310) twin in niobium; theoretical predictions and comparison with experimental observation; Quantitative high-resolution electron microscopy of grain boundaries in gamma-Al2=3; Comparisons of observed and simulated atomic structures of Pd/NiO heterophase interfaces; Atomic structure of sum =5 (130) symmetrical tilt boundary in strontium titanate; Assessment of GaInAs/GaInAsP interdiffusion profiles obtained using stem-edx and hrem; Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes; Real-time viewinf of dynamic processes on CdTe surfaces at elevated temperature; AFM imaging of the crystalline-to-amorphous transition on the surface of ion-implanted mica; AFM imagings of ferritin molecules bound to LB films of poly-1-benzyl-L-histidine; Artifacts in atomic force microscopy of nanoporous and mesoporous fiducial samples; Al induced reconstructions on the Si(111) surfaces studied by scanning tunneling microscopy; Structure of the sum =3 (111) grain boundary in Cu-1.5%Sb; High resolution electron microscopy of sum =3 NiSi2 (111)/(115) Si and NiSi2(221)/(001)Si interfaces; Image simulations of Ge twin boundaries; Surface structure of oxide catalyst microcrystals: high resolution electron microscopy study; A microstructural study of reaction-bonded silicon carbide...
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 312
Book Description
Materials tunneling microscopy for hydrogen-desorption-induced structural change of Si(111) surface; Steps on the (110) surface InP; Scanning tunneling microscopy on charge density waves in layered compounds; Design of ultra high vacuum scanning electron microscope combined with scanning tunneling microscope; Scanning tunneling microscopy perspective of structures on reduced SrTiO3(001) surfaces; Surface structure and electronic property of reduced SrTiO3(100) surface observed by STM/STS; Metastable structural surface excitations and concerted adatom motions: a STM study of atomic motions within a semiconductor surface; Mechanisms and energetics of surface atomic processes: an atom-probe field ion microscope study; Atomic arrangement of Al near the phase boundaries between square root 3X square root 3-Al and 7X7 structures on Si(111) surfaces; Growth and surface morphology of thin silicon films using an atomic force microscope; Solving interface structures by combined electron microscopy and X-ray diffraction; Quantitative hrem study of the atomic structure of the sum(310)/[001] symmetric tilt grain boundary in Nb; Hrtem observation of a sum =3 \{112\} bicrystal boundary in aluminum; Atomic structure of the (310) twin in niobium; theoretical predictions and comparison with experimental observation; Quantitative high-resolution electron microscopy of grain boundaries in gamma-Al2=3; Comparisons of observed and simulated atomic structures of Pd/NiO heterophase interfaces; Atomic structure of sum =5 (130) symmetrical tilt boundary in strontium titanate; Assessment of GaInAs/GaInAsP interdiffusion profiles obtained using stem-edx and hrem; Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes; Real-time viewinf of dynamic processes on CdTe surfaces at elevated temperature; AFM imaging of the crystalline-to-amorphous transition on the surface of ion-implanted mica; AFM imagings of ferritin molecules bound to LB films of poly-1-benzyl-L-histidine; Artifacts in atomic force microscopy of nanoporous and mesoporous fiducial samples; Al induced reconstructions on the Si(111) surfaces studied by scanning tunneling microscopy; Structure of the sum =3 (111) grain boundary in Cu-1.5%Sb; High resolution electron microscopy of sum =3 NiSi2 (111)/(115) Si and NiSi2(221)/(001)Si interfaces; Image simulations of Ge twin boundaries; Surface structure of oxide catalyst microcrystals: high resolution electron microscopy study; A microstructural study of reaction-bonded silicon carbide...
Evolution of Surface and Thin Film Microstructure: Volume 280
Author: Harry A. Atwater
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 784
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 784
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Polymer/Inorganic Interfaces: Volume 304
Author: Robert L. Opila
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 264
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 264
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials Theory and Modelling: Volume 291
Author: Jeremy Broughton
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 696
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 696
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Amorphous Insulating Thin Films: Volume 284
Author: Jerzy Kanicki
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 670
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 670
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.