Doping Studies of Cadmium Telluride, Cadmium Magnesium Telluride, and CdTe/CdMgTe Double Heterostructures Grown Using Molecular Beam Epitaxy

Doping Studies of Cadmium Telluride, Cadmium Magnesium Telluride, and CdTe/CdMgTe Double Heterostructures Grown Using Molecular Beam Epitaxy PDF Author: Olanrewaju Sunday Ogedengbe
Publisher:
ISBN:
Category : Molecular beam epitaxy
Languages : en
Pages : 368

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Book Description
CdTe is one of the leading materials used in thin-film photovoltaic (PV) devices due to some of its basic properties such as its ability to permit both n- and p-type doping, its relatively high absorption coefficient for photons in the visible range, and its direct band gap of 1.514 eV at room temperature, which is near the optimal band gap for solar energy conversion. Despite the near optimal band gap, the highest power conversion efficiency in a CdTe solar cell to date, achieved using polycrystalline CdTe, stands at 21%. This is far less than the Shockley-Queisser limit, which is about 32% for a single-junction cell under AM 1.5 illumination condition. Research efforts have shown that short circuit current (Jsc) is near its theoretical limit, implying that strategies to improve cell efficiency will have to be contingent on improving open-circuit voltage (Voc) and fill factor. Heavy doping has the potential to improve Voc. There is also evidence that inclusion of a Cd1-xMgxTe barrier in a solar cell structure may improve open circuit voltage, and, ultimately, cell efficiency. Doped and undoped CdTe layers were grown by molecular beam epitaxy (MBE). Secondary ion mass spectrometry (SIMS) characterization was used to measure dopant concentration, while Hall measurement and the capacitance-voltage technique were used for determining carrier concentration. Photoluminescence intensity (PL-I) and time-resolved photoluminescence (TRPL) techniques were used for optical characterization. The incorporation and limits of iodine and arsenic dopants in CdTe were studied. Maximum n-type carrier concentrations of 7.4x1018 cm-3 for iodine-doped CdTe and 3x1017 cm-3 for iodine-doped Cd0.65Mg0.35Te were achieved. Studies suggest that electrically active doping with iodine is limited with dopant concentration much above these values. Dopant activation of about 80% was observed in most of the iodine-doped CdTe samples. The estimated activation energy is about 6 meV for CdTe and the value for Cd0.65Mg0.35Te is about 58 meV. Iodine-doped CdTe samples exhibit long lifetimes with no evidence of photoluminescence degradation with doping as high as 2x1018 cm-3 while indium shows substantial non-radiative recombination at carrier concentrations above 5x1016 cm-3. Also, maximum p-type carrier concentration of 2x1016 cm-3 for arsenic-doped CdTe was achieved. Dopant activation greater than 20% was observed in most of the arsenic-doped CdTe samples. The process compatibility of iodine and magnesium in CdTe was evaluated for the solar cell device. Iodine was shown to be thermally stable in CdTe at temperatures up to 600oC and magnesium showed a slow diffusion at 500oC. Doped CdTe structures were used to make solar cell device structures, where open circuit voltage up to 880 mV and fill factor up to ~60% were measured.

Doping Studies of Cadmium Telluride, Cadmium Magnesium Telluride, and CdTe/CdMgTe Double Heterostructures Grown Using Molecular Beam Epitaxy

Doping Studies of Cadmium Telluride, Cadmium Magnesium Telluride, and CdTe/CdMgTe Double Heterostructures Grown Using Molecular Beam Epitaxy PDF Author: Olanrewaju Sunday Ogedengbe
Publisher:
ISBN:
Category : Molecular beam epitaxy
Languages : en
Pages : 368

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Book Description
CdTe is one of the leading materials used in thin-film photovoltaic (PV) devices due to some of its basic properties such as its ability to permit both n- and p-type doping, its relatively high absorption coefficient for photons in the visible range, and its direct band gap of 1.514 eV at room temperature, which is near the optimal band gap for solar energy conversion. Despite the near optimal band gap, the highest power conversion efficiency in a CdTe solar cell to date, achieved using polycrystalline CdTe, stands at 21%. This is far less than the Shockley-Queisser limit, which is about 32% for a single-junction cell under AM 1.5 illumination condition. Research efforts have shown that short circuit current (Jsc) is near its theoretical limit, implying that strategies to improve cell efficiency will have to be contingent on improving open-circuit voltage (Voc) and fill factor. Heavy doping has the potential to improve Voc. There is also evidence that inclusion of a Cd1-xMgxTe barrier in a solar cell structure may improve open circuit voltage, and, ultimately, cell efficiency. Doped and undoped CdTe layers were grown by molecular beam epitaxy (MBE). Secondary ion mass spectrometry (SIMS) characterization was used to measure dopant concentration, while Hall measurement and the capacitance-voltage technique were used for determining carrier concentration. Photoluminescence intensity (PL-I) and time-resolved photoluminescence (TRPL) techniques were used for optical characterization. The incorporation and limits of iodine and arsenic dopants in CdTe were studied. Maximum n-type carrier concentrations of 7.4x1018 cm-3 for iodine-doped CdTe and 3x1017 cm-3 for iodine-doped Cd0.65Mg0.35Te were achieved. Studies suggest that electrically active doping with iodine is limited with dopant concentration much above these values. Dopant activation of about 80% was observed in most of the iodine-doped CdTe samples. The estimated activation energy is about 6 meV for CdTe and the value for Cd0.65Mg0.35Te is about 58 meV. Iodine-doped CdTe samples exhibit long lifetimes with no evidence of photoluminescence degradation with doping as high as 2x1018 cm-3 while indium shows substantial non-radiative recombination at carrier concentrations above 5x1016 cm-3. Also, maximum p-type carrier concentration of 2x1016 cm-3 for arsenic-doped CdTe was achieved. Dopant activation greater than 20% was observed in most of the arsenic-doped CdTe samples. The process compatibility of iodine and magnesium in CdTe was evaluated for the solar cell device. Iodine was shown to be thermally stable in CdTe at temperatures up to 600oC and magnesium showed a slow diffusion at 500oC. Doped CdTe structures were used to make solar cell device structures, where open circuit voltage up to 880 mV and fill factor up to ~60% were measured.

Cadmium Telluride

Cadmium Telluride PDF Author: Samuel Bigbee-Hansen
Publisher:
ISBN:
Category : Cadmium telluride
Languages : en
Pages : 0

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Book Description
In the pursuit of creating efficient CdTe p-n homojunctions, we developed iodine (I) n-type doped CdTe using Cadmium Iodide (CdI2) as a dopant in varying concentrations (1018 cm-3, 1019 cm-3 and 1020 atoms℗ʺcm-3 target concentrations) in CdTe. Iodide doped crystals were grown using a Modified Vertical Bridgman furnace (MVB). Single crystals were characterized using XRD (X-Ray Diffraction), Hall effect, IR (Infrared) Microscopy, UV-VIS-NIR (Ultraviolet-Visible-Near infrared Spectroscopy) and FTIR (Fourier Transform Infrared Spectroscopy). Partners at the National Renewable Energy Laboratory (NREL) also provided data for Hall Effect and Two Photon Excitation Time Resolved Photoluminescence (2PE TRPL) of wafers and films. Photoluminescence mapping (PL mapping) was obtained from Klar scientific, and glow discharge mass spectrometry (GDMS) for purity and final doping concentration was obtained from the National Research Council Canada. Due to poor carrier properties in the crystals as-grown, two annealing treatments were explored, in either tellurium or cadmium vapor. Homojunctions were made at NREL by depositing n-type films from these crystals on p-type single crystals, CdTe:P grown and WSU. The n-type films were created using the close-space sublimation epitaxy (CSSE) process. Herein is reported the results of the grown CdTe:I crystals and, to a lesser extent, the properties of the CdTe:I thin films formed by CSSE.

Research and Development on Single Crystal High Resistivity Cadmium Telluride for Use as a Gamma-ray Spectrometer

Research and Development on Single Crystal High Resistivity Cadmium Telluride for Use as a Gamma-ray Spectrometer PDF Author: Kenneth R. Zanio
Publisher:
ISBN:
Category : Cadmium telluride
Languages : en
Pages : 136

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Chemical Abstracts

Chemical Abstracts PDF Author:
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 2668

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Cadmium Telluride Quantum Dots

Cadmium Telluride Quantum Dots PDF Author: John Donegan
Publisher: CRC Press
ISBN: 9814316091
Category : Science
Languages : en
Pages : 244

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Book Description
In the last two decades, semiconductor quantum dots-small colloidal nanoparticles-have garnered a great deal of scientific interest because of their unique properties. Among nanomaterials, CdTe holds special technological importance as the only known II-VI material that can form conventional p-n junctions. This makes CdTe very important for the dev

Improved Techniques for the Growth of High Quality Cadmium Telluride Crystals

Improved Techniques for the Growth of High Quality Cadmium Telluride Crystals PDF Author: R. S. Feigelson
Publisher:
ISBN:
Category :
Languages : en
Pages : 79

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Book Description
This report summarizes two years' work as part of a multiyear program on improved techniques for the growth of high quality cadmium telluride crystals and represents one of the most comprehensive studies of melt growth and defect characterization in CdTe reported to date. Extensive melt growth studied were carried out using te vertical Bridgman method. Growth parameters were systematically varied in order to determine the influence of seed orientation, thermal environment, and growth rate on crystal quality. Growth interface shapes were revealed using autoradiographic dopant tracing methods. Melt thermal profiling was also carried out to further evaluate growth interface shapes. Controlled convex growth interface shapes were generated by using the heat exchanger method. By this means some improvement in grain structure of the typically polycrystalline boules was accomplished. Low frequency melt vibrations during growth were also observed to improve grain structure and reduce dislocation density. Extensive defect characterization was alos carried out using chemical etching methods, and later, synchrotron x-ray topography. Comparative studies of a broad selection of commercial CdTe substrates was carried out, and extensive defect structure was observed in all cases. Reduced dislocation densities and defect structures were accomplished using both low amplitude melt vibrations and doping with In 1IIC13. In the second case, solution hardening was assumed to be the mechanism responsible. For the case of melt vibration, the mechanism is not yet understood.

Ion Implantation in Cadmium Telluride

Ion Implantation in Cadmium Telluride PDF Author: Stanford University. Stanford Electronics Laboratories
Publisher:
ISBN:
Category : Cadmium
Languages : en
Pages : 114

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Book Description
Results of investigations conducted on cadmium telluride (CdTe) samples are presented in this two-part document. Part 1 describes the effects of ion implantation doping in CdTe using transmission electron microscopy (TEM) and electrical evaluation as investigative tools. Part 2 describes the investigation of microstructural defects in CdTe and interfacial reactions at the Pt/CdTe contact and subsequent correlations with electrical measurements on CdTe room-temperature gamma ray detectors, and possible solar cell uses. This study has shown that the previous experimental data obtained on arsenic and krypton-implanted samples can be explained by the radiation-induced formation of electrically active defects rather than by substitutional impurity doping. A model has been proposed entailing the liberation of cadmium vacancy acceptors from radiation-induced loops. Using column I dopants (potassium, sodium, and cesium) to fill available cadmium cacancy sites, high doping efficiencies and true chemical doping have been obtained in ion-implanted CdTe. Investigations of CdTe radiation detector materials have shown a direct correlation between defect content, excess leakage currents and polarization on fabricated devices.

Growth and Characterization of Cadmium Telluride Film Grown by Molecular Beam Epitaxy Technique

Growth and Characterization of Cadmium Telluride Film Grown by Molecular Beam Epitaxy Technique PDF Author: Majid M. Hashemi
Publisher:
ISBN:
Category : Cadmium telluride
Languages : en
Pages : 94

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Properties of Narrow Gap Cadmium-based Compounds

Properties of Narrow Gap Cadmium-based Compounds PDF Author: Peter Capper
Publisher: IET
ISBN: 9780852968802
Category : Science
Languages : en
Pages : 648

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Book Description
This highly structured volume contains sections on growth and device aspects of mercury cadmium telluride (MCT).

P-type Doping of Mercury Cadmium Telluride - the Possible Use of Single Source Compounds Containing Sb-Te Bonds

P-type Doping of Mercury Cadmium Telluride - the Possible Use of Single Source Compounds Containing Sb-Te Bonds PDF Author: Ron S. Dickson
Publisher:
ISBN:
Category :
Languages : en
Pages : 39

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Book Description
The preparation and characterization of such compounds will be described. The various criteria that must be evaluated in assessing these and other organometallic compounds for MOCVD will be critically discussed. [Authors' abstract].