Disorder and Order in Strongly Nonstoichiometric Compounds

Disorder and Order in Strongly Nonstoichiometric Compounds PDF Author: A.I. Gusev
Publisher: Springer Science & Business Media
ISBN: 3662045826
Category : Technology & Engineering
Languages : en
Pages : 618

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Book Description
Deals with the influence of stoiciometry and order/disorder on materials properties. It summarizes the knowledge available in a comprehensive way.

Disorder and Order in Strongly Nonstoichiometric Compounds

Disorder and Order in Strongly Nonstoichiometric Compounds PDF Author: A.I. Gusev
Publisher: Springer Science & Business Media
ISBN: 3662045826
Category : Technology & Engineering
Languages : en
Pages : 618

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Book Description
Deals with the influence of stoiciometry and order/disorder on materials properties. It summarizes the knowledge available in a comprehensive way.

Disorder and Order in Strongly Nonstoichiometric Compounds

Disorder and Order in Strongly Nonstoichiometric Compounds PDF Author: A. I. Gusev
Publisher:
ISBN: 9783662045831
Category :
Languages : en
Pages : 628

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Book Description


Predictive Simulation of Semiconductor Processing

Predictive Simulation of Semiconductor Processing PDF Author: Jarek Dabrowski
Publisher: Springer Science & Business Media
ISBN: 3662094320
Category : Technology & Engineering
Languages : en
Pages : 505

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Book Description
Predictive Simulation of Semiconductor Processing enables researchers and developers to extend the scaling range of semiconductor devices beyond the parameter range of empirical research. It requires a thorough understanding of the basic mechanisms employed in device fabrication, such as diffusion, ion implantation, epitaxy, defect formation and annealing, and contamination. This book presents an in-depth discussion of our current understanding of key processes and identifies areas that require further work in order to achieve the goal of a comprehensive, predictive process simulation tool.

Radiation Effects in Advanced Semiconductor Materials and Devices

Radiation Effects in Advanced Semiconductor Materials and Devices PDF Author: C. Claeys
Publisher: Springer Science & Business Media
ISBN: 3662049740
Category : Science
Languages : en
Pages : 424

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Book Description
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

SiC Power Materials

SiC Power Materials PDF Author: Zhe Chuan Feng
Publisher: Springer Science & Business Media
ISBN: 9783540206668
Category : Science
Languages : en
Pages : 480

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Book Description
In the 1950s Shockley predicted that SiC would quickly replace Si as a result of its superior material properties. In many ways he was right and today there is an active industry based on SiC, with new achievements being reported every year. This book reviews the progress achieved in SiC research and development, particularly over the past 10 years. It presents the essential properties of 3C-, 6H- and 4H-SiC polytypes including structural, electrical, optical, surface and interface properties; describes existing key SiC devices and also the challenges in materials growth and device fabrication of the 21st century. Overall it provides an up-to-date reference book suitable for a broad audience of newcomers, graduate students and engineers in industrial R&D.

Fundamentals of Ion-Irradiated Polymers

Fundamentals of Ion-Irradiated Polymers PDF Author: Dietmar Fink
Publisher: Springer Science & Business Media
ISBN: 3662073269
Category : Technology & Engineering
Languages : en
Pages : 410

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Book Description
Presented in two parts, this first comprehensive overview addresses all aspects of energetic ion irradiation of polymers. Earlier publications and review articles concentrated on selected topics only. And the need for such a work has grown with the dramatic increase of research and applications, such as in photoresists, waveguides, and medical dosimetry, during the last decade. The first part, Fundamentals of Ion Irradiation of Polymers covers the physical, chemical and instrumental fundamentals; treats the specific irradiation mechanisms of low- and high-energy ions (including similarities and differences); and details the potential for future technological application. All the new findings are carefully analyzed and presented in a systematic way, while open questions are identified.

Polymer Films with Embedded Metal Nanoparticles

Polymer Films with Embedded Metal Nanoparticles PDF Author: Andreas Heilmann
Publisher: Springer Science & Business Media
ISBN: 3662052334
Category : Technology & Engineering
Languages : en
Pages : 224

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Book Description
This book presents an overview of nanostructure determination and ways to find relationships to the electronic and optical properties. The methods described can be applied to a large number of other granular metal-insulator systems and used as a guideline for characterisation and modelling. In addition, the book describes the manufacture of artificially structured nanomaterials using laser or electron-beam irradiation.

Impurities Confined in Quantum Structures

Impurities Confined in Quantum Structures PDF Author: Olof Holtz
Publisher: Springer Science & Business Media
ISBN: 3642186572
Category : Science
Languages : en
Pages : 141

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Book Description
The dramatic impact of low dimensional semiconductor structures on c- rent and future device applications cannot be overstated. Research over the last decade has highlighted the use of quantum engineering to achieve p- viously unknown limits for device performance in research laboratories. The modi?ed electronic structure of semiconductor quantum structures results in transport and optical properties, which di?er from those of constituent bulk materials. The possibility to tailor properties, such as bandgap, strain, band o?set etc. , of two-dimensional (2D) semiconductors, e. g. quantum wells, for speci?c purposes has had an extensive impact on the electronics, which has resulted in a dramatic renewal process. For instance, 2D structures are today used in a large number of high speed electronics and optoelectronic appli- tions (e. g. detectors, light emitting diodes, modulators, switches and lasers) and in daily life, in e. g. LED-based tra?c lights, CD-players, cash registers. The introduction of impurities, also in very small concentrations, in a semiconductor can change its optical and electrical properties entirely. This attribute of the semiconductor is utilized in the manifoldness of their app- cations. This fact constitutes the principal driving force for investigation of the properties of the impurities in semiconductors. While the impurities in bulk materials have been investigated for a long time, and their properties are fairly well established by now, the corresponding studies of impurities in quantum wells is a more recent research area.

Multifunctional Barriers for Flexible Structure

Multifunctional Barriers for Flexible Structure PDF Author: Sophie Duquesne
Publisher: Springer Science & Business Media
ISBN: 3540719202
Category : Technology & Engineering
Languages : en
Pages : 302

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Book Description
This is the first complete overview of the present state of the art of flexible barrier materials such as textile, paper and leather, including methods for barrier evaluation. It will be of interest to readers in industries, consumers, and members of the scientific community. The scope of the field is clearly delineated here for the first time, and it deals with a number of specific topics such as barrier to fire and antibacterial properties.

Diffraction Analysis of the Microstructure of Materials

Diffraction Analysis of the Microstructure of Materials PDF Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557

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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.