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Author: British Standards Institute Staff
Publisher:
ISBN: 9780580435225
Category :
Languages : en
Pages : 56
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Book Description
Semiconductor devices, Integrated circuits, Electronic equipment and components, Electrical insulation devices, Electrical insulating materials, Integrated circuit technology, Circuit elements, Electrical testing, Letters (symbols), Symbols, Ratings, Verification, Measurement, Reliability
Author: Vítezslav Benda
Publisher: John Wiley & Sons
ISBN: 9780471976448
Category : Technology & Engineering
Languages : en
Pages : 438
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Book Description
Dieses Buch beschreibt in leicht verständlicher Weise Aufbau, Funktion, Eigenschaften und Anwendungsmöglichkeiten wichtiger Halbleiter-Bauelemente - von Leistungsdioden über Thyristoren und MOSFETs bis hin zu integrierten Systemen. Die Autoren verzichten dabei auf komplizierte Mathematik; sie stützen sich vielmehr auf grundlegende physikalische Modelle. (11/98)
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580435225
Category :
Languages : en
Pages : 56
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Book Description
Semiconductor devices, Integrated circuits, Electronic equipment and components, Electrical insulation devices, Electrical insulating materials, Integrated circuit technology, Circuit elements, Electrical testing, Letters (symbols), Symbols, Ratings, Verification, Measurement, Reliability
Author: P. Roggwiller
Publisher: Springer Science & Business Media
ISBN: 1468472631
Category : Technology & Engineering
Languages : en
Pages : 374
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Book Description
The Brown Boveri Symposia are by now part of firmly established tradition. This is the seventh event in a series which was initiated shortly afer Corporate Research was established as a separate entity within our Company; the Symposia are held every other year. The themes to date have been 1969 Flow Research on Blading 1971 Real-Time Control of Electric Power Systems 1973 High-Temperature Materials in Gas Turbines 1975 Nonemissive Electrooptic Displays 1977 Current Interruption in High-Voltage Networks 1979 Surges in High-Voltage Networks 1981 Semiconductor Devices for Power Conditioning Why have we chosen these titles? At the outset we established certain selection criteria; we felt that a subject for a Symposium should fulfill the following require ments: It should characterize a part of a thoroughly scientific discipline; in other words, it should describe an area of scholarly study and research. It should be of current interest in the sense that important results have recently been obtained and considerable research effort is underway in the international scientific community. It should bear some relation to the scientific and technological acitivity of our Company. Let us look at the requirement "current interest": Some of the topics on the list have been the subject of research for several decades, some even from the beginning of the century. One might wonder, then, why such fields could be regarded as particularly timely in the 1960s and 1970s. A few remarks on this subject therefore are in order.
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580584107
Category :
Languages : en
Pages : 30
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Book Description
Semiconductor devices, Integrated circuits, Electronic equipment and components, Electrical insulation devices, Electrical insulating materials, Integrated circuit technology, Circuit elements, Electrical testing, Letters (symbols), Symbols, Ratings, Verification, Measurement, Reliability
Author: Shubham Tayal
Publisher: John Wiley & Sons
ISBN: 1394167628
Category : Technology & Engineering
Languages : en
Pages : 325
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Book Description
ADVANCED ULTRA LOW-POWER SEMICONDUCTOR DEVICES Written and edited by a team of experts in the field, this important new volume broadly covers the design and applications of metal oxide semiconductor field effect transistors. This outstanding new volume offers a comprehensive overview of cutting-edge semiconductor components tailored for ultra-low power applications. These components, pivotal to the foundation of electronic devices, play a central role in shaping the landscape of electronics. With a focus on emerging low-power electronic devices and their application across domains like wireless communication, biosensing, and circuits, this book presents an invaluable resource for understanding this dynamic field. Bringing together experts and researchers from various facets of the VLSI domain, the book addresses the challenges posed by advanced low-power devices. This collaborative effort aims to propel engineering innovations and refine the practical implementation of these technologies. Specific chapters delve into intricate topics such as Tunnel FET, negative capacitance FET device circuits, and advanced FETs tailored for diverse circuit applications. Beyond device-centric discussions, the book delves into the design intricacies of low-power memory systems, the fascinating realm of neuromorphic computing, and the pivotal issue of thermal reliability. Authors provide a robust foundation in device physics and circuitry while also exploring novel materials and architectures like transistors built on pioneering channel/dielectric materials. This exploration is driven by the need to achieve both minimal power consumption and ultra-fast switching speeds, meeting the relentless demands of the semiconductor industry. The book’s scope encompasses concepts like MOSFET, FinFET, GAA MOSFET, the 5-nm and 7-nm technology nodes, NCFET, ferroelectric materials, subthreshold swing, high-k materials, as well as advanced and emerging materials pivotal for the semiconductor industry’s future.
Author: John Seymour
Publisher:
ISBN:
Category : Power electronics
Languages : en
Pages : 198
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Book Description
Author: Vladislav A. Vashchenko
Publisher: Springer Science & Business Media
ISBN: 0387745149
Category : Technology & Engineering
Languages : en
Pages : 337
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Book Description
Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 336
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Book Description
Author: Mauro Zambuto
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 430
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Book Description
Author: International Electrotechnical Commission
Publisher:
ISBN: 9782831881171
Category : Bipolar transistors
Languages : en
Pages : 26
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Book Description
