Author: Yoshitaka Takasaki
Publisher: Artech House Publishers
ISBN:
Category : Computers
Languages : en
Pages : 240
Book Description
This reference book shows the reader how to analyze jitter generations and accumulation more efficiently and provides guidance for designing transmission systems from the clock recovery viewpoint. This book presents the theory and technology behind digital transmission from three angles: line coding, waveform shaping and clock recovery. Also included is coverage of binary codes, multilevel codes and correlative codes. The text reviews the 3R functions of digital repeaters, and studies budget design based on an eye diagram showing amplitude and time crosshairs.
Digital Transmission Design and Jitter Analysis
Author: Yoshitaka Takasaki
Publisher: Artech House Publishers
ISBN:
Category : Computers
Languages : en
Pages : 240
Book Description
This reference book shows the reader how to analyze jitter generations and accumulation more efficiently and provides guidance for designing transmission systems from the clock recovery viewpoint. This book presents the theory and technology behind digital transmission from three angles: line coding, waveform shaping and clock recovery. Also included is coverage of binary codes, multilevel codes and correlative codes. The text reviews the 3R functions of digital repeaters, and studies budget design based on an eye diagram showing amplitude and time crosshairs.
Publisher: Artech House Publishers
ISBN:
Category : Computers
Languages : en
Pages : 240
Book Description
This reference book shows the reader how to analyze jitter generations and accumulation more efficiently and provides guidance for designing transmission systems from the clock recovery viewpoint. This book presents the theory and technology behind digital transmission from three angles: line coding, waveform shaping and clock recovery. Also included is coverage of binary codes, multilevel codes and correlative codes. The text reviews the 3R functions of digital repeaters, and studies budget design based on an eye diagram showing amplitude and time crosshairs.
Digital Transmission Design and Jitter Analysis
Author: Yoshitaka Takasaki
Publisher:
ISBN: 9780608005690
Category :
Languages : en
Pages : 228
Book Description
Publisher:
ISBN: 9780608005690
Category :
Languages : en
Pages : 228
Book Description
Jitter, Noise, and Signal Integrity at High-Speed
Author: Mike Peng Li
Publisher: Pearson Education
ISBN: 0132797194
Category : Technology & Engineering
Languages : en
Pages : 443
Book Description
State-of-the-art JNB and SI Problem-Solving: Theory, Analysis, Methods, and Applications Jitter, noise, and bit error (JNB) and signal integrity (SI) have become today‘s greatest challenges in high-speed digital design. Now, there’s a comprehensive and up-to-date guide to overcoming these challenges, direct from Dr. Mike Peng Li, cochair of the PCI Express jitter standard committee. One of the field’s most respected experts, Li has brought together the latest theory, analysis, methods, and practical applications, demonstrating how to solve difficult JNB and SI problems in both link components and complete systems. Li introduces the fundamental terminology, definitions, and concepts associated with JNB and SI, as well as their sources and root causes. He guides readers from basic math, statistics, circuit and system models all the way through final applications. Emphasizing clock and serial data communications applications, he covers JNB and SI simulation, modeling, diagnostics, debugging, compliance testing, and much more.
Publisher: Pearson Education
ISBN: 0132797194
Category : Technology & Engineering
Languages : en
Pages : 443
Book Description
State-of-the-art JNB and SI Problem-Solving: Theory, Analysis, Methods, and Applications Jitter, noise, and bit error (JNB) and signal integrity (SI) have become today‘s greatest challenges in high-speed digital design. Now, there’s a comprehensive and up-to-date guide to overcoming these challenges, direct from Dr. Mike Peng Li, cochair of the PCI Express jitter standard committee. One of the field’s most respected experts, Li has brought together the latest theory, analysis, methods, and practical applications, demonstrating how to solve difficult JNB and SI problems in both link components and complete systems. Li introduces the fundamental terminology, definitions, and concepts associated with JNB and SI, as well as their sources and root causes. He guides readers from basic math, statistics, circuit and system models all the way through final applications. Emphasizing clock and serial data communications applications, he covers JNB and SI simulation, modeling, diagnostics, debugging, compliance testing, and much more.
Digital Communications Test and Measurement
Author: Dennis Derickson
Publisher: Pearson Education
ISBN: 0132797216
Category : Technology & Engineering
Languages : en
Pages : 1242
Book Description
A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes Signal integrity from a measurement point of view Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes Bit error ratio measurements for both electrical and optical links Extensive coverage on the topic of jitter in high-speed networks State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing Channel and system characterization: TDR/T and frequency domain-based alternatives Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM
Publisher: Pearson Education
ISBN: 0132797216
Category : Technology & Engineering
Languages : en
Pages : 1242
Book Description
A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes Signal integrity from a measurement point of view Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes Bit error ratio measurements for both electrical and optical links Extensive coverage on the topic of jitter in high-speed networks State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing Channel and system characterization: TDR/T and frequency domain-based alternatives Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM
An Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition
Author: Jose Moreira
Publisher: Artech House
ISBN: 1608079864
Category : Technology & Engineering
Languages : en
Pages : 709
Book Description
This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.
Publisher: Artech House
ISBN: 1608079864
Category : Technology & Engineering
Languages : en
Pages : 709
Book Description
This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.
Digital Timing Measurements
Author: Wolfgang Maichen
Publisher: Springer Science & Business Media
ISBN: 0387314199
Category : Technology & Engineering
Languages : en
Pages : 250
Book Description
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this field an engineer needs to understand instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. This book gives a compact, practice-oriented overview on all these subjects with emphasis on useable concepts and real-life guidelines.
Publisher: Springer Science & Business Media
ISBN: 0387314199
Category : Technology & Engineering
Languages : en
Pages : 250
Book Description
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this field an engineer needs to understand instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. This book gives a compact, practice-oriented overview on all these subjects with emphasis on useable concepts and real-life guidelines.
High-Speed Signaling
Author: Kyung Suk (Dan) Oh
Publisher: Prentice Hall
ISBN: 0132827115
Category : Technology & Engineering
Languages : en
Pages : 608
Book Description
New System-Level Techniques for Optimizing Signal/Power Integrity in High-Speed Interfaces--from Pioneering Innovators at Rambus, Stanford, Berkeley, and MIT As data communication rates accelerate well into the multi-gigahertz range, ensuring signal integrity both on- and off-chip has become crucial. Signal integrity can no longer be addressed solely through improvements in package or board-level design: Diverse engineering teams must work together closely from the earliest design stages to identify the best system-level solutions. In High-Speed Signaling, several of the field’s most respected practitioners and researchers introduce cutting-edge modeling, simulation, and optimization techniques for meeting this challenge. Edited by pioneering experts Drs. Dan Oh and Chuck Yuan, these contributors explain why noise and jitter are no longer separable, demonstrate how to model their increasingly complex interactions, and thoroughly introduce a new simulation methodology for predicting link-level performance with unprecedented accuracy. The authors address signal integrity from architecture through high-volume production, thoroughly discussing design, implementation, and verification. Coverage includes New advances in passive-channel modeling, power-supply noise and jitter modeling, and system margin prediction Methodologies for balancing system voltage and timing budgets to improve system robustness in high-volume manufacturing Practical, stable formulae for converting key network parameters Improved solutions for difficult problems in the broadband modeling of interconnects Equalization techniques for optimizing channel performance Important new insights into the relationships between jitter and clocking topologies New on-chip measurement techniques for in-situ link performance testing Trends and future directions in signal integrity engineering High-Speed Signaling thoroughly introduces new techniques pioneered at Rambus and other leading high-tech companies and universities: approaches that have never before been presented with this much practical detail. It will be invaluable to everyone concerned with signal integrity, including signal and power integrity engineers, high-speed I/O circuit designers, and system-level board design engineers.
Publisher: Prentice Hall
ISBN: 0132827115
Category : Technology & Engineering
Languages : en
Pages : 608
Book Description
New System-Level Techniques for Optimizing Signal/Power Integrity in High-Speed Interfaces--from Pioneering Innovators at Rambus, Stanford, Berkeley, and MIT As data communication rates accelerate well into the multi-gigahertz range, ensuring signal integrity both on- and off-chip has become crucial. Signal integrity can no longer be addressed solely through improvements in package or board-level design: Diverse engineering teams must work together closely from the earliest design stages to identify the best system-level solutions. In High-Speed Signaling, several of the field’s most respected practitioners and researchers introduce cutting-edge modeling, simulation, and optimization techniques for meeting this challenge. Edited by pioneering experts Drs. Dan Oh and Chuck Yuan, these contributors explain why noise and jitter are no longer separable, demonstrate how to model their increasingly complex interactions, and thoroughly introduce a new simulation methodology for predicting link-level performance with unprecedented accuracy. The authors address signal integrity from architecture through high-volume production, thoroughly discussing design, implementation, and verification. Coverage includes New advances in passive-channel modeling, power-supply noise and jitter modeling, and system margin prediction Methodologies for balancing system voltage and timing budgets to improve system robustness in high-volume manufacturing Practical, stable formulae for converting key network parameters Improved solutions for difficult problems in the broadband modeling of interconnects Equalization techniques for optimizing channel performance Important new insights into the relationships between jitter and clocking topologies New on-chip measurement techniques for in-situ link performance testing Trends and future directions in signal integrity engineering High-Speed Signaling thoroughly introduces new techniques pioneered at Rambus and other leading high-tech companies and universities: approaches that have never before been presented with this much practical detail. It will be invaluable to everyone concerned with signal integrity, including signal and power integrity engineers, high-speed I/O circuit designers, and system-level board design engineers.
Design and Test for Multiple Gbps Communication Devices and Systems
Author: Mike Peng Li
Publisher: Intl. Engineering Consortiu
ISBN: 9781931695343
Category : Computers
Languages : en
Pages : 534
Book Description
Focuses on the multiple Gbps communication technologies and applications - from design to test - and covers the useful elements of device and system development (architecture, simulation and modeling, design techniques, and testing). This title helps you to choose the right methods and tools for your designs and tests.
Publisher: Intl. Engineering Consortiu
ISBN: 9781931695343
Category : Computers
Languages : en
Pages : 534
Book Description
Focuses on the multiple Gbps communication technologies and applications - from design to test - and covers the useful elements of device and system development (architecture, simulation and modeling, design techniques, and testing). This title helps you to choose the right methods and tools for your designs and tests.
Systematic Design of CMOS Switched-Current Bandpass Sigma-Delta Modulators for Digital Communication Chips
Author: José M. de la Rosa
Publisher: Springer Science & Business Media
ISBN: 0306481944
Category : Technology & Engineering
Languages : en
Pages : 478
Book Description
This very detailed book discusses architectures, circuits and procedures for the optimum design of bandpass sigma-delta A/D interfaces for mixed-signal chips in standard CMOS technologies. It provides uniquely in-depth coverage of switched-current errors, which supports the design of high performance SI chips.
Publisher: Springer Science & Business Media
ISBN: 0306481944
Category : Technology & Engineering
Languages : en
Pages : 478
Book Description
This very detailed book discusses architectures, circuits and procedures for the optimum design of bandpass sigma-delta A/D interfaces for mixed-signal chips in standard CMOS technologies. It provides uniquely in-depth coverage of switched-current errors, which supports the design of high performance SI chips.
Wavelet Analysis and Its Applications
Author: Yuan Y. Tang
Publisher: Springer
ISBN: 3540453334
Category : Computers
Languages : en
Pages : 470
Book Description
This book constitutes the refereed proceedings of the Second International Conference on Wavelet Analysis and Its Applications, WAA 2001, held in Hong Kong, China in December 2001. The 24 revised full papers and 27 revised short papers presented were carefully reviewed and selected from a total of 67 full paper submissions. The book offers topical sections on image compression and coding, video coding and processing, theory, image processing, signal processing, and systems and applications.
Publisher: Springer
ISBN: 3540453334
Category : Computers
Languages : en
Pages : 470
Book Description
This book constitutes the refereed proceedings of the Second International Conference on Wavelet Analysis and Its Applications, WAA 2001, held in Hong Kong, China in December 2001. The 24 revised full papers and 27 revised short papers presented were carefully reviewed and selected from a total of 67 full paper submissions. The book offers topical sections on image compression and coding, video coding and processing, theory, image processing, signal processing, and systems and applications.