Determination of the Optical Constants of Thin Silver-aluminium Layer Films Using the Attenuated Total Relection Technique PDF Download
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Author: Chen-Hau Lin
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages : 200
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Author: Chen-Hau Lin
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages : 200
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Book Description
Author: K. F. Palmer
Publisher:
ISBN:
Category :
Languages : en
Pages : 60
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Book Description
In this report, a new subtractive Kramers-Kronig computer program is described which can obtain accurate optical constants of a uniform thin film on a thick substrate using only the transmittance measurements of a single-film thickness. Preliminary results from existing data show that the optical properties of a dielectric film may depend, to a small degree, upon the thickness of the film. This effect seems to be more noticeable in films containing molecules, such as H2O and NH3, which readily form hydrogen bonds. Also described are two methods for extracting the optical constants of a dielectric thin film from measurements of the reflectance of a beam incident in a vacuum upon a film layer on a metal substrate. In one method, the dependence is observed of the reflectances of several thicknesses of the same film material upon its thickness. This method contains the assumption that the optical properties of a film material do not vary with changes in film thickness. The second method does not depend on this assumption. It uses the reflectance spectrum of a single-film thickness to compute the optical constants of the film from a dispersion relation.
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 836
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Author: Robert T. Cahill
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages : 122
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Author: Elio Passaglia
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 366
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Author:
Publisher:
ISBN:
Category : Metallurgy
Languages : en
Pages : 1516
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Book Description
Author: D. Moebius
Publisher: Elsevier
ISBN: 0080537774
Category : Technology & Engineering
Languages : en
Pages : 533
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Book Description
This book presents a number of selected papers given at the LB9 conference, held in Potsdam, Germany, in August 2000. It is dedicated to new techniques and methodologies for studying interfacial layers. One group of manuscripts deals with the application of surface plasmons at solid interfaces, used for example in resonance spectroscopy and light scattering. New applications of various types of Atomic Force Microscopy are reported making use of various modifications of tips. A number of chapters are dedicated to light emitting diodes built with the help of LB layers. The aim of these studies is the improvement of efficiency. Electrochemical methods were described as tools for developing sensors, in particular miniaturised pH or gas sensors.The application of synchrotron X-ray and NMR techniques have been described in detail in two extended chapters. It is demonstrated how molecular information can be detected by these methods for various types of interfacial layers.This monograph, along with 130 papers that have been submitted for publication in the special issues of relevant journals, represent the proceedings of the LBP conference.
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 1192
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 312
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Author: Shahina M. Rahman
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 158
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Book Description
