Author: R. G. BennettsPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 184
Book Description
Design of Testable Logic Circuits
Author: R. G. BennettsPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 184
Book Description
Logic Design Principles
Author: Edward J. McCluskeyPublisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 586
Book Description
An Introduction to Logic Circuit Testing
Author: Parag K. LalaPublisher: Springer Nature
ISBN: 303179785X
Category : Technology & Engineering
Languages : en
Pages : 99
Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
The Board Designer's Guide to Testable Logic Circuits
Author: Colin M. MaunderPublisher: Addison Wesley Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 216
Book Description
An Introduction to Logic Circuit Testing
Author: Parag K. LalaPublisher: Morgan & Claypool Publishers
ISBN: 1598293508
Category : Computers
Languages : en
Pages : 111
Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Logic Testing and Design for Testability
Author: Hideo FujiwaraPublisher:
ISBN: 9780262561990
Category : Computers
Languages : en
Pages : 0
Book Description
Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Today's computers must perform with increasing reliability, which in turn depends on the problem of determining whether a circuit has been manufactured properly or behaves correctly. However, the greater circuit density of VLSI circuits and systems has made testing more difficult and costly. This book notes that one solution is to develop faster and more efficient algorithms to generate test patterns or use design techniques to enhance testability - that is, design for testability. Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Because the cost of hardware is decreasing as the cost of testing rises, there is now a growing interest in these techniques for VLSI circuits.The first half of the book focuses on the problem of testing: test generation, fault simulation, and complexity of testing. The second half takes up the problem of design for testability: design techniques to minimize test application and/or test generation cost, scan design for sequential logic circuits, compact testing, built-in testing, and various design techniques for testable systems. Logic Testing and Design for Testability is included in the Computer Systems Series, edited by Herb Schwetman.
Logic Design Principles
Author: Edward J. McCluskeyPublisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 578
Book Description
Digital Circuit Testing and Testability
Author: Parag K. LalaPublisher: Academic Press
ISBN: 9780124343306
Category : Computers
Languages : en
Pages : 222
Book Description
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Design of Testable Logic Circuits
Author: R. G. BennettsPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 182
Book Description
VLSI Test Principles and Architectures
Author: Laung-Terng WangPublisher: Elsevier
ISBN: 9780080474793
Category : Technology & Engineering
Languages : en
Pages : 808
Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
