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Author: Michael Orshansky
Publisher: Springer Science & Business Media
ISBN: 0387690115
Category : Technology & Engineering
Languages : en
Pages : 319
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Book Description
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
Author: Michael Orshansky
Publisher: Springer Science & Business Media
ISBN: 0387690115
Category : Technology & Engineering
Languages : en
Pages : 319
Get Book Here
Book Description
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
Author: Charles Chiang
Publisher: Springer Science & Business Media
ISBN: 1402051883
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
Author: David M. Anderson
Publisher: CRC Press
ISBN: 1482204940
Category : Business & Economics
Languages : en
Pages : 472
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Book Description
Design for Manufacturability: How to Use Concurrent Engineering to Rapidly Develop Low-Cost, High-Quality Products for Lean Production shows how to use concurrent engineering teams to design products for all aspects of manufacturing with the lowest cost, the highest quality, and the quickest time to stable production. Extending the concepts of desi
Author: Stephen W. Director
Publisher: Springer Science & Business Media
ISBN: 1461315212
Category : Technology & Engineering
Languages : en
Pages : 299
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Book Description
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Author: Soha Hassoun
Publisher: Springer Science & Business Media
ISBN: 9780792376064
Category : Computers
Languages : en
Pages : 474
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Book Description
Research and development of logic synthesis and verification have matured considerably over the past two decades. Many commercial products are available, and they have been critical in harnessing advances in fabrication technology to produce today's plethora of electronic components. While this maturity is assuring, the advances in fabrication continue to seemingly present unwieldy challenges. Logic Synthesis and Verification provides a state-of-the-art view of logic synthesis and verification. It consists of fifteen chapters, each focusing on a distinct aspect. Each chapter presents key developments, outlines future challenges, and lists essential references. Two unique features of this book are technical strength and comprehensiveness. The book chapters are written by twenty-eight recognized leaders in the field and reviewed by equally qualified experts. The topics collectively span the field. Logic Synthesis and Verification fills a current gap in the existing CAD literature. Each chapter contains essential information to study a topic at a great depth, and to understand further developments in the field. The book is intended for seniors, graduate students, researchers, and developers of related Computer-Aided Design (CAD) tools. From the foreword: "The commercial success of logic synthesis and verification is due in large part to the ideas of many of the authors of this book. Their innovative work contributed to design automation tools that permanently changed the course of electronic design." by Aart J. de Geus, Chairman and CEO, Synopsys, Inc.
Author: Xin Li
Publisher: Now Publishers Inc
ISBN: 1601980566
Category : Computers
Languages : en
Pages : 161
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Book Description
Statistical Performance Modeling and Optimization reviews various statistical methodologies that have been recently developed to model, analyze and optimize performance variations at both transistor level and system level in integrated circuit (IC) design. The following topics are discussed in detail: sources of process variations, variation characterization and modeling, Monte Carlo analysis, response surface modeling, statistical timing and leakage analysis, probability distribution extraction, parametric yield estimation and robust IC optimization. These techniques provide the necessary CAD infrastructure that facilitates the bold move from deterministic, corner-based IC design toward statistical and probabilistic design. Statistical Performance Modeling and Optimization reviews and compares different statistical IC analysis and optimization techniques, and analyzes their trade-offs for practical industrial applications. It serves as a valuable reference for researchers, students and CAD practitioners.
Author: Anil Mital
Publisher: Elsevier
ISBN: 0128001909
Category : Technology & Engineering
Languages : en
Pages : 539
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Book Description
Product development teams are composed of an integrated group of professionals working from the nascent stage of new product planning through design creation and design review and then on to manufacturing planning and cost accounting. An increasingly large number of graduate and professional training programs are aimed at meeting that need by creating a better understanding of how to integrate and accelerate the entire product development process. This book is the perfect accompaniment and a comprehensive guide. The second edition of this instructional reference work presents invaluable insight into the concurrent nature of the multidisciplinary product development process. It can be used in the traditional classroom, in professional continuing education courses or for self-study. This book has a ready audience among graduate students in mechanical and industrial engineering, as well as in many MBA programs focused on manufacturing management. This is a global need that will find a receptive readership in the industrialized world particularly in the rapidly developing industrial economies of South Asia and Southeast Asia. - Reviews the precepts of Product design in a step-by-step structured process and focuses on the concurrent nature of product design - Helps the reader to understand the connection between initial design and interim and final design, including design review and materials selection - Offers insight into roles played by product functionality, ease-of assembly, maintenance and durability, and their interaction with cost estimation and manufacturability through the application of design principles to actual products
Author: Geoffrey Boothroyd
Publisher: CRC Press
ISBN: 1420089277
Category : Technology & Engineering
Languages : en
Pages : 710
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Book Description
Hailed as a groundbreaking and important textbook upon its initial publication, the latest iteration of Product Design for Manufacture and Assembly does not rest on those laurels. In addition to the expected updating of data in all chapters, this third edition has been revised to provide a top-notch textbook for university-level courses in product design and manufacturing design. The authors have added a comprehensive set of problems and student assignments to each chapter, making the new edition substantially more useful. See what’s in the Third Edition: Updated case studies on the application of DFMA techniques Extended versions of the classification schemes of the features of products that influence the difficulty of handling and insertion for manual, high-speed automatic, and robot assembly Discussions of changes in the industry such as increased emphasis on the use of surface mount devices New data on basic manufacturing processes Coverage of powder injection molding Recognized as international experts on the re-engineering of electro-mechanical products, the methods and guidelines developed by Boothroyd, Dewhurst, and Knight have been documented to provide significant savings in the product development process. Often attributed with creating a revolution in product design, the authors have been working in product design manufacture and assembly for more than 25 years. Based on theory yet highly practical, their text defines the factors that influence the ease of assembly and manufacture of products for a wide range of the basic processes used in industry. It demonstrates how to develop competitive products that are simpler in configuration and easier to manufacture with reduced overall costs.
Author: David Chinnery
Publisher: Springer Science & Business Media
ISBN: 1402071132
Category : Computers
Languages : en
Pages : 422
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Book Description
This book carefully details design tools and techniques for high-performance ASIC design. Using these techniques, the performance of ASIC designs can be improved by two to three times. Important topics include: Improving performance through microarchitecture; Timing-driven floorplanning; Controlling and exploiting clock skew; High performance latch-based design in an ASIC methodology; Automatically identifying and synthesizing complex logic gates; Automated cell sizing to increase performance and reduce power; Controlling process variation.These techniques are illustrated by designs running two to three times the speed of typical ASICs in the same process generation.
Author: J.-P. Colinge
Publisher: Springer Science & Business Media
ISBN: 038771751X
Category : Technology & Engineering
Languages : en
Pages : 350
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Book Description
This book explains the physics and properties of multi-gate field-effect transistors (MuGFETs), how they are made and how circuit designers can use them to improve the performances of integrated circuits. It covers the emergence of quantum effects due to the reduced size of the devices and describes the evolution of the MOS transistor from classical structures to SOI (silicon-on-insulator) and then to MuGFETs.
