Design and Construction of a Multi-environmental, Temperature Controlled Scanning Tunneling Microscope PDF Download
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Author: Rick De Jong
Publisher:
ISBN:
Category :
Languages : en
Pages : 120
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Author: Rick De Jong
Publisher:
ISBN:
Category :
Languages : en
Pages : 120
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Author: Chi Chen
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Dilushan R. Jayasundara
Publisher:
ISBN:
Category : High temperature superconductivity
Languages : en
Pages : 184
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Author: Mark Avrum Gubrud
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 129
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Author: C. Julian Chen
Publisher: Oxford University Press
ISBN: 0192598562
Category : Technology & Engineering
Languages : en
Pages : 523
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Book Description
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.
Author: H. Neddermeyer
Publisher: Springer Science & Business Media
ISBN: 9401118124
Category : Science
Languages : en
Pages : 275
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The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.
Author: Ashley R. Gans-Forrest
Publisher:
ISBN:
Category :
Languages : en
Pages : 61
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Author: Matthew Jon Honkanen
Publisher:
ISBN:
Category :
Languages : en
Pages : 360
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Author: N. Eric Wittry
Publisher:
ISBN:
Category : Microscopes
Languages : en
Pages : 112
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