Responce faicte à la declaration de Henry de Valois sur l'innocence par luy pretendue de la mort de Messeigneurs de Guyse PDF Download
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Author:
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Category :
Languages : en
Pages : 16
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Author:
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Category :
Languages : en
Pages : 16
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Author:
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Category :
Languages : en
Pages : 525
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Partial contents include: (1) Atomic defect configuration identified by nuclear techniques; (2) Combination of deep level transient spectroscopy; (3) Microscopy of Frenkel pairs in semiconductors by nuclear techniques; (4) Muon stopping sites in semiconductors from decay positron channeling; (5) Polarized spectroscopy of complex luminescence centers; (6) A re-evaluation of electric field enhanced emission measurements for use in type and charge state determination; (7) X ray spectroscopy following neutron irradiation of semi- conductor silicon; (8) Transition metals in silicon carbide (SiC) : vanadium and titanium; (9) Photoluminescence excitation spectroscopy of cubic SiC grown by chemical vapor deposition on Si substrates; (10) Luminescence and absorption of vanadium in 6H SiC; (11) Impurity defect reactions in ion implanted diamond; (12) Electron trapping defects in MBE-grown relaxed n-In0.05- Ga0.95 As on gallium arsenide; (13) Scanning tunneling microscopy studies of semiconductor surface defects; (14) Photoluminescence characterisation of the silicon surface exposed to plasma treatment; (15) An analysis of point defect fluxes during silicon dioxide precipitation in silicon; (16) Electrical properties of oxidation-induced stacking faults in n-type silicon; (17) Morphology change of oxygen precipitates in CZ-Si wafers during two-step heat-treatment; (18) Ion implantation induced sheet stress due to defects in thin (100) silicon films; and (19) Hydrogen induced defects and defect passivation in silicon solar cells.
Author: Gordon Davies
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ISBN:
Category : Semiconductors
Languages : en
Pages : 572
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Author: Gordon Davies
Publisher:
ISBN:
Category :
Languages : en
Pages : 548
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Partial contents of Part 1 of this symposium include: (1) Microstructure of hydrogen and dopants in hydrogenated amorphous Si; (2) Diffusion and drift of hydrogen in silicon and gallium arsenides; (3) Hydrogen-induced platelets in silicon: separation of nucleation and growth; (4) Hydrogen effusion from doped monocrystalline B-doped silicon; (5) Effect of multiple trapping on hydrogen diffusion in Si; (6) Measurements of the diffusion coefficient of hydrogen in silicon monitored by catalyzed enhanced oxygen diffusion jumps; (7) Passivation of shallow acceptors in Si and GaAs by annealing in H2; (8) Spectroscopy on transition metal defects in silicon; (9) Magneto-optical properties of iron -- aluminium pairs in silicon; (10) Interaction of a copper-induced defect with shallow acceptors; (11) Gettering of copper and iron to extended surface defects in Si; (12) Electronic states of Fe4 and manganese (Mn4) clusters in Si; (13) Magnetic resonance from a metastable sulfur-pair-related complex defect in Si; (14) Piezopectroscopy of two beryllium related double acceptors in Si; (15) Defect impurity complex formation at high donor concentration in Si; (16) electronic structure of isolated aluminium point defects and defect pairs in Si; (17) Photoluminescence of edge-defined film-fed growth Si; (18) Atomic structure of the interstitial defects in electron-irradiated Si and Ge; (19) Interaction between defects during the annealing of crystalline silicon; (20) Oxygen related point defects in GaAs; (21) Infrared absorption by interstitial oxygen in germanium doped silicon crystal; (22) Theory of nitrogen and platelets in diamond; and (23) The temperature dependence of trap cross section.
Author: Gordon Davies
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ISBN:
Category :
Languages : en
Pages : 648
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Partial contents include: (1) Hydrogen-dopant interactions in III-V semiconductors; (2) Interaction of hydrogen with impurities in semiconductors; (3) Carbon/hydrogen interaction in III-V compounds; (4) Quantum motion of muonium in gallium arsenides and copper chloride; (5) Acceptor passivation in GaP by positively charged hydrogen manifested by donor acceptor pair luminescence; (6) Local mode spectroscopy of OH and NH complexes in semi-insulating GaAs; (7) Effects of reverse bias annealing and zero bias annealing on Ti/n-GaAs and Au/n-GaAs schottky barriers containing hydrogen; (8) Equilibrium sites and relative stability of atomic and molecular hydrogen in GaAs; (9) Electrical properties of ytterbium erbium doped indium phosphides; (10) Vibrational mode Fourier transform spectroscopy with a diamond anvil cell; (11) A photoluminescence study of the charge states of a donor level in GaAs induced by hydrostatic pressure; (12) On the kinetics of photoconductivity in Al(x)Ga(1-x)As:Si; (13) Studies of deep level transient spectroscopy of DX centers of GaAlAs:Te under uniaxial stress; (14) Point defects and their reactions in semi-insulating GaAs after low temperature e( - ) irradiation; (15) Photoluminescence; (16) Positron annihilation in electron irradiated gallium arsenide; (17) Low temperature GaAs: electrical and optical properties; (18) Electron paramagnetic resonance studies of low temperature molecular beam epitaxial GaAs layers; and (19) Oxygen behavior during silicon epitaxial growth : recent advances.
Author: Gordon Davies
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ISBN:
Category : Semiconductors
Languages : en
Pages : 1604
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Author: International Conference on Defects in Semiconductors (16, 1991, Bethlehem, Pa.)
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ISBN:
Category :
Languages : en
Pages :
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Author: International Conference on Defects in Semiconductors
Publisher:
ISBN:
Category :
Languages : en
Pages : 399
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Author: International Conference on Defects in Semiconductors
Publisher:
ISBN: 9780878496280
Category :
Languages : en
Pages :
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Author: Gordon Davies
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 540
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