Data and Results of a Laboratory Investigation of Microprocessor Upset Caused by Simulated Lightning-induced Analog Transients PDF Download
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Languages : en
Pages : 32
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Category :
Languages : en
Pages : 32
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Category : Aeronautics
Languages : en
Pages : 1346
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Languages : en
Pages : 36
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Flight-critical computer-based control systems designed for advanced aircraft must exhibit ultrareliable performance in lightning-charged environments. Digital system upset can occur as a result of lightning-induced electrical transients, and a methodology has been developed to test specific digital systems for upset susceptibility. Initial upset data indicates that there are several distinct upset modes and that the occurrence of upset is related to the relative synchronization of the transient input with the processing state of the digital system. A large upset test data base will aid in the formulation and verification of analytical upset reliability modeling techniques which are being developed. (Author).
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Category : Atmospheric electricity
Languages : en
Pages : 528
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Category :
Languages : en
Pages : 24
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Author: International Aerospace and Ground Conference on Lightning and Static Electricity
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Category : Atmospheric electricity
Languages : en
Pages : 80
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Category :
Languages : en
Pages : 76
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Author: National Aeronautics and Space Administration (NASA)
Publisher: Createspace Independent Publishing Platform
ISBN: 9781725589797
Category :
Languages : en
Pages : 36
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Flight critical computer based control systems designed for advanced aircraft must exhibit ultrareliable performance in lightning charged environments. Digital system upset can occur as a result of lightning induced electrical transients, and a methodology was developed to test specific digital systems for upset susceptibility. Initial upset data indicates that there are several distinct upset modes and that the occurrence of upset is related to the relative synchronization of the transient input with the processing sate of the digital system. A large upset test data base will aid in the formulation and verification of analytical upset reliability modeling techniques which are being developed. Belcastro, C. M. Langley Research Center NASA-TM-84652, NAS 1.15:84652 RTOP 505-34-13-34...
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Category : Atmospheric electricity
Languages : en
Pages : 76
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Author:
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ISBN:
Category : Atmospheric electricity
Languages : en
Pages : 78
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