Coincidence Nuclear Spectrometry, with Applications to Eul¿♯ and Eul¿¿ PDF Download
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Author: Jose Ochoa Juliano
Publisher:
ISBN:
Category : Europium
Languages : en
Pages : 232
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Author: Jose Ochoa Juliano
Publisher:
ISBN:
Category : Europium
Languages : en
Pages : 232
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Book Description
Author: Jose O. Juliano
Publisher:
ISBN:
Category : Europium
Languages : en
Pages : 108
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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1472
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Author: Derek K Jones
Publisher: Oxford University Press
ISBN: 0199708703
Category : Science
Languages : en
Pages : 784
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Book Description
Professor Derek Jones, a world authority on diffusion MRI, has assembled most of the world's leading scientists and clinicians developing and applying diffusion MRI to produce an authorship list that reads like a "Who's Who" of the field and an essential resource for those working with diffusion MRI. Destined to be a modern classic, this definitive and richly illustrated work covers all aspects of diffusion MRI from basic theory to clinical application. Oxford Clinical Neuroscience is a comprehensive, cross-searchable collection of resources offering quick and easy access to eleven of Oxford University Press's prestigious neuroscience texts. Joining Oxford Medicine Online these resources offer students, specialists and clinical researchers the best quality content in an easy-to-access format.
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1482
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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1150
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Book Description
Author: Sven A. E. Johansson
Publisher: John Wiley & Sons
ISBN: 9780471589440
Category : Science
Languages : en
Pages : 496
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Book Description
The authoritative handbook to exploiting the full power and versatility of PIXE— now and in the next century Respected for its practical accuracy and detection range of parts per million, particle-induced X-ray emission has enjoyed a secure place in the analytical arsenal of the nuclear physics laboratory. Yet, its undeniable analytical potential in other areas of science has scarcely been tapped. This unique reference, from PIXE specialists in biomedicine, atmospheric science, earth science, and art and archaeology, features a user-based look at PIXE's conceptual basics and methodology, with a view toward new and creative analytical work. Touching on every facet of PIXE technology, from basic instrumentation, specimens, the characteristics of X-ray spectroscopy, standardization of quantitative analysis, to the accuracy of PIXE analysis and its limits of detection, the book offers an unprecedented look at the newer uses of PIXE in such areas as: Applications of macro- and micro-PIXE in medicine, zoology, and botany Analysis of atmospheric aerosols Geological and extra-terrestrial material Analysis of gem stones, pottery, glass, and alloys As an exploratory tool for pigments and paintings and "paper-like" materials Complete with a comparative look contrasting PIXE with more conventional forms of analysis, this important reference is key to grasping the technique's practical specifics and exploiting its full analytical potential.
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 0387881360
Category : Technology & Engineering
Languages : en
Pages : 406
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Book Description
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1280
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Author: K. E. Mironov
Publisher:
ISBN:
Category : Earths, Rare
Languages : en
Pages : 454
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Book Description
