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Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0443193258
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series
Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0443193258
Category : Technology & Engineering
Languages : en
Pages : 252
Get Book Here
Book Description
Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series
Author: Giuseppe Mario Caruso (docteur en physique).)
Publisher:
ISBN:
Category :
Languages : en
Pages : 195
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Book Description
The investigation of the physics of nanoscale systems ideally requires atomic spatial resolution and femtosecond time-resolution. Ultrafast Transmission Electron Microscopy (UTEM) combining subpicosecond temporal resolution and nanometer spatial resolution has recently emerged as a unique tool with unprecedented spatio-temporal resolutions. However, the performances of the first UTEMs were limited by the brightness of the photocathodes used as ultrafast electron source. In this context, it was soon realized that UTEMs relying on laser-driven electron sources based on nanoscale emitters would overcome this limitation. The aim of this thesis is to report the development of an ultrafast Transmission Electron Microscope based on a cold field emission source, which can operate either in DC or ultrafast mode. Electron emission from a tungsten nanotip is triggered by femtosecond laser pulses, which are tightly focused by optical components integrated inside a cold-field emission source close to the cathode. The measured brightness is the largest reported so far for UTEMs. Combining this new high brightness source with an injection/Cathodoluminescence system, composed of a parabolic mirror placed above the sample holder, the UTEM can be used to perform time-resolved ultrafast pump-probe TEM experiments. The possibilities of such an instrument for ultrafast imaging, diffraction, electron holography and spectroscopy are presented. Particular attention has been paid on applications in nano-optics. In particular, Electron Energy Gain Spectroscopy (EEGS) allows to investigate the optical excitations of nanosystems in the energy domain. The ability to easily synchronize ultrashort free electron pulses with the optical excitation of the sample in UTEMs is essential for the observation of strongly nonlinear electron/photon interactions. These experiments will enable us to characterize the spectro-temporal properties of the ultrashort electron beam. Off-axis electron holography performed with ultrafast electron pulses are finally discussed. The electron dose in the specimen plane is considerably reduced due to the low repetition rate of the electron pulse train. This peculiar property of ultrafast FE-TEMs implies that ultrafast holograms are acquired in low-dose-like conditions. As a consequence, the experimental parameters commonly used for the acquisition of off-axis electron holograms with conventional TEMs cannot be directly implemented in the ultrafast mode. Experimental studies were performed to find the optimum conditions for ultrafast off-axis electron holography. Influence of the dose, the coherence length of the source, the illumination condition and the instrument instabilities have been addressed.
Author: John C. H. Spence
Publisher: Clarendon Press
ISBN: 9780198509158
Category : Business & Economics
Languages : en
Pages : 401
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Book Description
The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us to seeatoms, together with highly practical advice for electron microscope operators. The book covers the usefulness of seeing atoms in the semiconductor industry, in materials science (where scientists strive to make new lighter, stronger, cheaper materials), and condensed matter physics (for example inthe study of the new superconductors). Biologists have recently used the atomic-resolution electron microscope to obtain three-dimensional images of the Ribosome, work which is covered in this book. The book also shows how the ability to see atomic arrangements has helped us understand theproperties of matter.This new third edition of the standard text retains the early sections on the fundamentals of electron optics, linear imaging theory with partial coherence and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of theprocedures needed to obtain the highest quality images of the arrangement of atoms in thin crystals using a modern electron microscope. The sections on applications of atomic-resolution transmission electron microscopy (HREM) have been extensively updated, including descriptions of HREM in thesemiconductor industry, superconductor research, solid state chemistry and nanoscience, as well as metallurgy, mineralogy, condensed matter physics, materials science and biology. Entirely new sections have been added on electron holography, aberration correctors, field-emission guns, imagingfilters, HREM in biology and on organic crystals, super-resolution methods, Ptychography, CCD cameras and Image plates. New chapters are devoted entirely to scanning transmission electron microscopy and Z-contrast, and also to associated techniques, such as energy-loss spectrocospy, Alchemi,nanodiffraction and cathodoluminescence. Sources of software for image interpretation and electron-optical design are also given.
Author: S. Amelinckx
Publisher: Wiley-VCH
ISBN:
Category : Science
Languages : en
Pages : 536
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Book Description
Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 1475725191
Category : Science
Languages : en
Pages : 708
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Book Description
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Author: P.W. Hawkes
Publisher: Springer Science & Business Media
ISBN: 0387497625
Category : Technology & Engineering
Languages : en
Pages : 1336
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Book Description
This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Category : Technology & Engineering
Languages : en
Pages : 543
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Book Description
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 652
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Book Description
Author: Frances M. Ross
Publisher: Cambridge University Press
ISBN: 1107116570
Category : Science
Languages : en
Pages : 529
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Book Description
2.6.2 Electrodes for Electrochemistry
Author: United States. Congress. House. Committee on Appropriations. Subcommittee on Energy and Water Development
Publisher:
ISBN:
Category : Federal aid to energy development
Languages : en
Pages : 1490
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Book Description
