Characterization of Very High Speed Semiconductor Devices and Integrated Circuits PDF Download
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Author: Ravi Jain
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 378
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Book Description
Author: Ravi Jain
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 378
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Book Description
Author: R. Jain
Publisher:
ISBN: 9780892528301
Category :
Languages : en
Pages : 359
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Book Description
Author: Chi-Liang Ni
Publisher:
ISBN:
Category :
Languages : en
Pages : 324
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Book Description
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 852
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Book Description
Author: Mark Rodwell
Publisher: World Scientific
ISBN: 9814490938
Category : Technology & Engineering
Languages : en
Pages : 372
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Book Description
This book reviews the state of the art of very high speed digital integrated circuits. Commercial applications are in fiber optic transmission systems operating at 10, 40, and 100 Gb/s, while the military application is ADCs and DACs for microwave radar. The book contains detailed descriptions of the design, fabrication, and performance of wideband Si/SiGe-, GaAs-, and InP-based bipolar transistors. The analysis, design, and performance of high speed CMOS, silicon bipolar, and III-V digital ICs are presented in detail, with emphasis on application in optical fiber transmission and mixed signal ICs. The underlying physics and circuit design of rapid single flux quantum (RSFQ) superconducting logic circuits are reviewed, and there is extensive coverage of recent integrated circuit results in this technology.
Author: H. Beneking
Publisher: Springer Science & Business Media
ISBN: 9780412562204
Category : Technology & Engineering
Languages : en
Pages : 276
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Book Description
High Speed Semiconductor Devices is the first textbook to focus on this topic. It gives a comprehensive introduction suitable for advanced students of electrical engineering and physics. It is practically oriented considering both physical limits and technical feasibility. It is illustrated with extensive exercises, full solutions and worked examples that give practical insight to and extend the treatment of the text.
Author:
Publisher: ASM International
ISBN: 0871707454
Category : Technology & Engineering
Languages : en
Pages : 162
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Book Description
Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Author:
Publisher:
ISBN:
Category : Computer engineering
Languages : en
Pages : 654
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Book Description
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 812
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Book Description
