Characterization of Organic Semiconductors Via Conducting Probe Atomic Force Microscopy PDF Download
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Author: Tommie Wilson Kelley
Publisher:
ISBN:
Category :
Languages : en
Pages : 236
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Author: Tommie Wilson Kelley
Publisher:
ISBN:
Category :
Languages : en
Pages : 236
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Book Description
Author: Rafi Shikler
Publisher:
ISBN:
Category : Scanning probe microscopy
Languages : en
Pages : 186
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Book Description
Author: Chiara Manfredotti
Publisher: Elsevier Inc. Chapters
ISBN: 0128083441
Category : Science
Languages : en
Pages : 66
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Book Description
Author: Alexander Schwarzman
Publisher:
ISBN:
Category : Scanning probe microscopy
Languages : en
Pages : 214
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Book Description
Author: Umberto Celano
Publisher: Springer
ISBN: 3030156125
Category : Science
Languages : en
Pages : 408
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Book Description
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Author: Gordon Alex MacDonald
Publisher:
ISBN:
Category :
Languages : en
Pages : 342
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Book Description
This dissertation focuses on characterizing the nanoscale and surface averaged electrical properties of transparent conducting oxide (TCO) electrodes such as indium tin oxide (ITO) and transparent metal-oxide (MO) electron selective interlayers (ESLs), such as zinc oxide (ZnO), the ability of these materials to rapidly extract photogenerated charges from organic semiconductors (OSCs) used in organic photovoltaic (OPV) cells, and evaluating their impact on the power conversion efficiency (PCE) of OPV devices. In Chapter 1, we will introduce the fundamental principles regarding the need for low cost power generation, the benefits of OPV technologies, as well as the key principles that govern the operation of OPV devices and the key innovations that have advanced this technology. In Chapter 2 of this dissertation, we demonstrate an innovative application of conductive probe atomic force microscopy (CAFM) to map the nanoscale electrical heterogeneity at the interface between an electrode, such as ITO, and an OSC such as the p-type OSC copper phthalocyanine (CuPc).(MacDonald et al. (2012) ACS Nano, 6, p. 9623) In this work we collected arrays of J-V curves, using a CAFM probe as the top contact of CuPc/ITO systems, to map the local J-V responses. By comparing J-V responses to known models for charge transport, we were able to determine if the local rate-limiting step for charge transport is through the OSC (ohmic) or the CuPc/ITO interface (nonohmic). These results strongly correlate with device PCE, as demonstrated through the controlled addition of insulating alkylphosphonic acid self-assembled monolayers (SAMs) at the ITO/CuPc interface. Subsequent chapters focus on the electrical property characterization of RF-magnetron sputtered ZnO (sp-ZnO) ESL films on ITO substrates. We have shown that the energetic alignment of ESLs and the organic semiconducting (OSC) active materials plays a critical role in determining the PCE of OPV devices and the appearance of, or lack thereof, UV light soaking sensitivity. For ZnO and fullerene interfaces, we have shown that either minimizing the oxygen partial pressure during ZnO deposition or exposure of ZnO to UV light minimizes the energetic offset at this interface and maximizes device PCE. We have used a combination of device testing, device modeling, and impedance spectroscopy to fully characterize the effects that energetic alignment has on the charge carrier transport and charge carrier distribution within the OPV device. This work can be found in Chapter 3 of this dissertation and is in preparation for publication. We have also shown that the local properties of sp-ZnO films varies as a function of the underlying ITO crystal face. We show that the local ITO crystal face determines the local nucleation and growth of the sp-ZnO films. We demonstrate that this effects the morphology, the chemical resistance to etching as well as the surface electrical properties of the sp-ZnO films. This is likely due to differences in the surface mobility of sputtered Zn and O atoms on these crystal faces during film nucleation. This affects the nanoscale distribution of electrical and chemical properties. As a result we demonstrate that the PCE, and UV sensitivity of the J-V response of OPVs using sp-ZnO ESLs are strongly impacted by the distribution of ITO crystal faces at the surface of the substrate. This work can be found in Chapter 4 of this dissertation and is in preparation for publication. These studies have contributed to a detailed understanding of the role that electrical heterogeneity, insulating barriers and energetic alignment at the MO/OSC interface play in OPV PCE.
Author: Mario Lanza
Publisher: John Wiley & Sons
ISBN: 3527699783
Category : Science
Languages : en
Pages : 385
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Book Description
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Author: Sudipta Seal
Publisher: Springer Science & Business Media
ISBN: 0387488057
Category : Technology & Engineering
Languages : en
Pages : 607
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Book Description
This is the first book about functional nanostructures. Nanocrystalline materials exhibit outstanding properties and represent a new class of structural materials having a wide range of applications. In particular, there is considerable interest in developing nanocrystalline materials to be used as functional materials in aerospace applications, automotive industry, wear applications, etc. Future progress in these high technological applications of nanocrystalline materials depends on development of new methods of their fabrication and understanding of the underlying nano-scale and interface effects causing their unique mechanical properties.
Author: Xiaotian Zhou
Publisher:
ISBN: 9789984343143
Category :
Languages : en
Pages : 127
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Book Description
As semiconductor devices shrink in size, it becomes more important to characterize and understand electronic properties of the materials and devices at the nanoscale. Scanning probe techniques offers numerous advantages over traditional tools used for semiconductor materials and devices characterization including high spatial resolution, ease of use and multi-functionality for electrical characterization, such as current, potential and capacitance, etc.
Author:
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 848
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