Author: Yu Sheng Huang
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
The Bi1-xSbx alloy has garnered significant attention in the fields of semimetals and narrow bandgap semiconductors due to its unique properties in temperature and magnetic fields. The presence of topological surface states in bulk single crystals of the Bi1-xSbx alloy has sparked interest in exploring its potential for spin-orbit-torque (SOT) devices. Thin films of Bi1-xSbx exhibit high electrical conductivity, making them promising candidates for energy-efficient SOT devices. Previous studies have reported remarkable spin Hall angles and magnetization switching at ultralow current densities in Bi1-xSbx films interfaced with metallic ferromagnets, as well as giant unidirectional spin Hall magnetoresistance when interfaced with ferromagnetic semiconductors. These exciting findings have motivated further investigation into the growth of high-quality, single-crystal Bi1-xSbx films using molecular beam epitaxy (MBE) on various substrates. In this dissertation, we present a systematic study of epitaxial Bi1-xSbx thin films grown on (0001) sapphire substrates using MBE, incorporating a thin (Bi0.95,Sb0.05)2Te3 buffer layer. Various characterization techniques, including transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), atomic force microscopy (AFM), electrical transport, and Raman spectroscopy, were employed to investigate the microscopic structure, quality, and composition of the films. Raman spectroscopy provided valuable insights into the influence of strain on the phonon modes within the thin films. Our results demonstrate the successful growth of epitaxial Bi1-xSbx films with a well-defined growth direction, a crucial aspect for achieving high spin Hall angles in SOT devices. Furthermore, this dissertation emphasizes the effectiveness of characterization techniques for thin films, with a particular focus on XRD pole figure scans. Addressing the lack of standardized documentation in pole figure measurements, we present a clear and consistent approach, contributing to the development of a more standardized methodology in this area. To illustrate the capabilities of pole figure scans, analysis results from our own samples are presented. By comparing peak locations between the sample and substrate, we could assess the quality of epitaxial growth. Moreover, we suggest the potential for qualitative analysis of sample quality through pole figure measurements by examining the full width at half maximum (FWHM) values obtained from azimuthal scans at the maximum intensity, which may provide further insights into sample characteristics. Additionally, this dissertation provides an in-depth overview of two other characterization methods: XPS and Raman spectroscopy. XPS enables accurate analysis of elemental composition, oxidation states, and element migration in thin films. Precise determination of the composition ratio of Bi-Sb thin films using XPS measurements allows for adjustments in the growth process to enhance film quality. Raman spectroscopy, on the other hand, offers insights into bonding, crystal structure, contamination, strain, and material composition. By utilizing these complementary characterization techniques, a comprehensive understanding of Bi1-xSbx thin films can be achieved. Further investigations, such as detailed comparisons with Raman spectroscopy or the utilization of pole figure measurements, have the potential to enable the quantified reporting of strains and other challenging-to-measure information in thin film samples.
Characterization and Synthesis of BiSb Thin Films
Author: Yu Sheng Huang
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
The Bi1-xSbx alloy has garnered significant attention in the fields of semimetals and narrow bandgap semiconductors due to its unique properties in temperature and magnetic fields. The presence of topological surface states in bulk single crystals of the Bi1-xSbx alloy has sparked interest in exploring its potential for spin-orbit-torque (SOT) devices. Thin films of Bi1-xSbx exhibit high electrical conductivity, making them promising candidates for energy-efficient SOT devices. Previous studies have reported remarkable spin Hall angles and magnetization switching at ultralow current densities in Bi1-xSbx films interfaced with metallic ferromagnets, as well as giant unidirectional spin Hall magnetoresistance when interfaced with ferromagnetic semiconductors. These exciting findings have motivated further investigation into the growth of high-quality, single-crystal Bi1-xSbx films using molecular beam epitaxy (MBE) on various substrates. In this dissertation, we present a systematic study of epitaxial Bi1-xSbx thin films grown on (0001) sapphire substrates using MBE, incorporating a thin (Bi0.95,Sb0.05)2Te3 buffer layer. Various characterization techniques, including transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), atomic force microscopy (AFM), electrical transport, and Raman spectroscopy, were employed to investigate the microscopic structure, quality, and composition of the films. Raman spectroscopy provided valuable insights into the influence of strain on the phonon modes within the thin films. Our results demonstrate the successful growth of epitaxial Bi1-xSbx films with a well-defined growth direction, a crucial aspect for achieving high spin Hall angles in SOT devices. Furthermore, this dissertation emphasizes the effectiveness of characterization techniques for thin films, with a particular focus on XRD pole figure scans. Addressing the lack of standardized documentation in pole figure measurements, we present a clear and consistent approach, contributing to the development of a more standardized methodology in this area. To illustrate the capabilities of pole figure scans, analysis results from our own samples are presented. By comparing peak locations between the sample and substrate, we could assess the quality of epitaxial growth. Moreover, we suggest the potential for qualitative analysis of sample quality through pole figure measurements by examining the full width at half maximum (FWHM) values obtained from azimuthal scans at the maximum intensity, which may provide further insights into sample characteristics. Additionally, this dissertation provides an in-depth overview of two other characterization methods: XPS and Raman spectroscopy. XPS enables accurate analysis of elemental composition, oxidation states, and element migration in thin films. Precise determination of the composition ratio of Bi-Sb thin films using XPS measurements allows for adjustments in the growth process to enhance film quality. Raman spectroscopy, on the other hand, offers insights into bonding, crystal structure, contamination, strain, and material composition. By utilizing these complementary characterization techniques, a comprehensive understanding of Bi1-xSbx thin films can be achieved. Further investigations, such as detailed comparisons with Raman spectroscopy or the utilization of pole figure measurements, have the potential to enable the quantified reporting of strains and other challenging-to-measure information in thin film samples.
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
The Bi1-xSbx alloy has garnered significant attention in the fields of semimetals and narrow bandgap semiconductors due to its unique properties in temperature and magnetic fields. The presence of topological surface states in bulk single crystals of the Bi1-xSbx alloy has sparked interest in exploring its potential for spin-orbit-torque (SOT) devices. Thin films of Bi1-xSbx exhibit high electrical conductivity, making them promising candidates for energy-efficient SOT devices. Previous studies have reported remarkable spin Hall angles and magnetization switching at ultralow current densities in Bi1-xSbx films interfaced with metallic ferromagnets, as well as giant unidirectional spin Hall magnetoresistance when interfaced with ferromagnetic semiconductors. These exciting findings have motivated further investigation into the growth of high-quality, single-crystal Bi1-xSbx films using molecular beam epitaxy (MBE) on various substrates. In this dissertation, we present a systematic study of epitaxial Bi1-xSbx thin films grown on (0001) sapphire substrates using MBE, incorporating a thin (Bi0.95,Sb0.05)2Te3 buffer layer. Various characterization techniques, including transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), atomic force microscopy (AFM), electrical transport, and Raman spectroscopy, were employed to investigate the microscopic structure, quality, and composition of the films. Raman spectroscopy provided valuable insights into the influence of strain on the phonon modes within the thin films. Our results demonstrate the successful growth of epitaxial Bi1-xSbx films with a well-defined growth direction, a crucial aspect for achieving high spin Hall angles in SOT devices. Furthermore, this dissertation emphasizes the effectiveness of characterization techniques for thin films, with a particular focus on XRD pole figure scans. Addressing the lack of standardized documentation in pole figure measurements, we present a clear and consistent approach, contributing to the development of a more standardized methodology in this area. To illustrate the capabilities of pole figure scans, analysis results from our own samples are presented. By comparing peak locations between the sample and substrate, we could assess the quality of epitaxial growth. Moreover, we suggest the potential for qualitative analysis of sample quality through pole figure measurements by examining the full width at half maximum (FWHM) values obtained from azimuthal scans at the maximum intensity, which may provide further insights into sample characteristics. Additionally, this dissertation provides an in-depth overview of two other characterization methods: XPS and Raman spectroscopy. XPS enables accurate analysis of elemental composition, oxidation states, and element migration in thin films. Precise determination of the composition ratio of Bi-Sb thin films using XPS measurements allows for adjustments in the growth process to enhance film quality. Raman spectroscopy, on the other hand, offers insights into bonding, crystal structure, contamination, strain, and material composition. By utilizing these complementary characterization techniques, a comprehensive understanding of Bi1-xSbx thin films can be achieved. Further investigations, such as detailed comparisons with Raman spectroscopy or the utilization of pole figure measurements, have the potential to enable the quantified reporting of strains and other challenging-to-measure information in thin film samples.
Thin Films: Preparation, Characterization, Applications
Author: Manuel P. Soriaga
Publisher: Springer Science & Business Media
ISBN: 1461507758
Category : Science
Languages : en
Pages : 362
Book Description
This book is about thin films; what they are, how they are prepared, how they are characterized, and what they are used for. The contents of this book not only showcase the diversity of thin films, but also reveals the commonality among the work performed in a variety of areas. The chapters in this volume are based on invited papers presented by prominent researchers in the field at a Symposium on "Thin Films: Preparation, Characterization, Applications" at the 221st National Meeting of the American Chemical Society held in San Diego, California. The coverage of the symposium was extensive; topics ranged from highly-ordered metal adlayers on well-defined electrode surfaces to bio-organic films on non-metallic nanoparticles. An objective of this book is for the readers to be able to draw from the experience and results of others in order to improve and expand the understanding of the science and technology of their own thin films systems.
Publisher: Springer Science & Business Media
ISBN: 1461507758
Category : Science
Languages : en
Pages : 362
Book Description
This book is about thin films; what they are, how they are prepared, how they are characterized, and what they are used for. The contents of this book not only showcase the diversity of thin films, but also reveals the commonality among the work performed in a variety of areas. The chapters in this volume are based on invited papers presented by prominent researchers in the field at a Symposium on "Thin Films: Preparation, Characterization, Applications" at the 221st National Meeting of the American Chemical Society held in San Diego, California. The coverage of the symposium was extensive; topics ranged from highly-ordered metal adlayers on well-defined electrode surfaces to bio-organic films on non-metallic nanoparticles. An objective of this book is for the readers to be able to draw from the experience and results of others in order to improve and expand the understanding of the science and technology of their own thin films systems.
Synthesis and Characterization of Bi [sub] 12 SiO [sub] 20 Thin Films Prepared by Sol-gel Method
Author: Asja Veber
Publisher:
ISBN:
Category :
Languages : en
Pages : 116
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 116
Book Description
Synthesis and Characterization of Skutterudite Thin Films and Superlattice Structures
Author: James Christopher Caylor
Publisher:
ISBN:
Category :
Languages : en
Pages : 304
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 304
Book Description
Synthesis and Characterization of Multiferroic Thin Films
Author: Sung Hwan Lim
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Synthesis and Characterization of Bi12SiO20 Thin Films
Author: Asja Veber
Publisher:
ISBN: 9783844385526
Category :
Languages : en
Pages : 132
Book Description
Publisher:
ISBN: 9783844385526
Category :
Languages : en
Pages : 132
Book Description
Synthesis and Characterization of Organic Thin Films Incorporating Macrocycles
Author: Daniel L. Dermody
Publisher:
ISBN:
Category :
Languages : en
Pages : 396
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 396
Book Description
Methods for Film Synthesis and Coating Procedures
Author: Laszlo Nanai
Publisher:
ISBN: 1789855667
Category :
Languages : en
Pages : 174
Book Description
Publisher:
ISBN: 1789855667
Category :
Languages : en
Pages : 174
Book Description
Synthesis and Characterization of Organic Thin Films for Optoelectronic Applications
Author: Suming Ye
Publisher:
ISBN:
Category :
Languages : en
Pages : 210
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 210
Book Description
Characterization of Organic Thin Films
Author: Abraham Ulman
Publisher: Butterworth-Heinemann
ISBN:
Category : Science
Languages : en
Pages : 302
Book Description
Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.
Publisher: Butterworth-Heinemann
ISBN:
Category : Science
Languages : en
Pages : 302
Book Description
Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.