Cathodoluminescence Microscopy of Inorganic Solids

Cathodoluminescence Microscopy of Inorganic Solids PDF Author: B.G. Yacobi
Publisher: Springer Science & Business Media
ISBN: 1475795955
Category : Science
Languages : en
Pages : 294

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Book Description
Microcharacterization of materials is a rapidly advancing field. Among the many electron and ion probe techniques, the cathodoluminescence mode of an electron probe instrument has reached a certain maturity, which is reflected by an increas ing number of publications in this field. The rapid rate of progress in applications of cathodoluminescence techniques in characterizing inorganic solids has been especially noticeable in recent years. The main purpose of the book is to outline the applications of cath odoluminescence techniques in the assessment of optical and electronic proper ties of inorganic solids, such as semiconductors, phosphors, ceramics, and min erals. The assessment provides, for example, information on impurity levels derived from cathodoluminescence spectroscopy, analysis of dopant concentra tions at a level that, in some cases, is several orders of magnitude lower than that attainable by x-ray microanalysis, the mapping of defects, and the determination of carrier lifetimes and the charge carrier capture cross sections of impurities. In order to make the book self-contained, some basic concepts of solid-state phys ics, as well as various cathodoluminescence techniques and the processes leading to luminescence phenomena in inorganic solids, are also described. We hope that this book will be useful to both scientists and graduate students interested in microcharacterization of inorganic solids. This book, however, was not intended as a definitive account of cathodoluminescence analysis of in organic solids. In considering the results presented here, readers should re member that many materials have properties that vary widely as a function of preparation conditions.

Cathodoluminescence Microscopy of Inorganic Solids

Cathodoluminescence Microscopy of Inorganic Solids PDF Author: B.G. Yacobi
Publisher: Springer Science & Business Media
ISBN: 1475795955
Category : Science
Languages : en
Pages : 294

Get Book Here

Book Description
Microcharacterization of materials is a rapidly advancing field. Among the many electron and ion probe techniques, the cathodoluminescence mode of an electron probe instrument has reached a certain maturity, which is reflected by an increas ing number of publications in this field. The rapid rate of progress in applications of cathodoluminescence techniques in characterizing inorganic solids has been especially noticeable in recent years. The main purpose of the book is to outline the applications of cath odoluminescence techniques in the assessment of optical and electronic proper ties of inorganic solids, such as semiconductors, phosphors, ceramics, and min erals. The assessment provides, for example, information on impurity levels derived from cathodoluminescence spectroscopy, analysis of dopant concentra tions at a level that, in some cases, is several orders of magnitude lower than that attainable by x-ray microanalysis, the mapping of defects, and the determination of carrier lifetimes and the charge carrier capture cross sections of impurities. In order to make the book self-contained, some basic concepts of solid-state phys ics, as well as various cathodoluminescence techniques and the processes leading to luminescence phenomena in inorganic solids, are also described. We hope that this book will be useful to both scientists and graduate students interested in microcharacterization of inorganic solids. This book, however, was not intended as a definitive account of cathodoluminescence analysis of in organic solids. In considering the results presented here, readers should re member that many materials have properties that vary widely as a function of preparation conditions.

Cathodoluminescence in Geosciences

Cathodoluminescence in Geosciences PDF Author: M. Pagel
Publisher: Springer Science & Business Media
ISBN: 3662040867
Category : Science
Languages : en
Pages : 518

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Book Description
An up-to-date overview of cathodoluminescence microscopy and spectroscopy in the field of geosciences, including new important data on cathodoluminescence spectroscopy, physical parameters and systematic spectral analysis of doped minerals. Each chapter, written by a well-known specialist, covers classic and new fields of application such as carbonate diagenesis, silicates, brittle deformation in sandstones, gemstone recognition, biomineralization, economic geology or geochronology. Useful to all scientists, graduates and professional engineers throughout the geosciences community.

Cathodoluminescence and its Application in the Planetary Sciences

Cathodoluminescence and its Application in the Planetary Sciences PDF Author: Arnold Gucsik
Publisher: Springer Science & Business Media
ISBN: 3540875298
Category : Science
Languages : en
Pages : 168

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Book Description
Cathodoluminescence microscopy/spectroscopy is a powerful technique providing detailed information on the shock metamorphism of target rocks, biosignatures of meteorites and mineralogy of the pre-solar grains. Moreover, it can be used as an in-situ method to classify the solid-atmospheric-liquid interactions on the surface of Mars.

Advanced Optical Spectroscopy Techniques for Semiconductors

Advanced Optical Spectroscopy Techniques for Semiconductors PDF Author: Masanobu Yoshikawa
Publisher: Springer Nature
ISBN: 3031197224
Category : Technology & Engineering
Languages : en
Pages : 227

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Book Description
This book focuses on advanced optical spectroscopy techniques for the characterization of cutting-edge semiconductor materials. It covers a wide range of techniques such as Raman, infrared, photoluminescence, and cathodoluminescence (CL) spectroscopy, including an introduction to their physical fundamentals and best operating principles. Aimed at professionals working in the research and development of semiconductors and semiconductor materials, this book looks at a broad class of materials such as silicon and silicon dioxide, nano-diamond thin films, quantum dots, and gallium oxide. In addition to the spectroscopic techniques covered, this book features a chapter devoted to the use of a scanning electron transmission microscope as an excitation source for CL spectroscopy. Written by a practicing industry expert in the field, this book is an ideal source of reference and best-practices guide for physicists, as well as materials scientists and engineers involved in the area of spectroscopy of semiconductor materials. Further, this book introduces the cutting-edge spectroscopy such as optical photothermal IR and Raman spectroscopy or terahertz time-domain spectroscopy (THz-TDS) etc.

Luminescence and Related Properties of II-VI Semiconductors

Luminescence and Related Properties of II-VI Semiconductors PDF Author: D. R. Vij
Publisher: Nova Publishers
ISBN: 9781560724339
Category : Science
Languages : en
Pages : 406

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Book Description
This volume provides the readers an in-depth, yet concise, overview of the physico-chemical structures, luminescence and related properties of II-VI compounds which are being utilised and exhaustively studied these days for their applications in LED's, modern optoelectronic devices, flat EL screens and panels, infrared detectors, photovoltaic and thermal solar energy converters etc. The book, therefore, should be useful to a wide variety of people (working in the field of luminescence and related properties of II-VI compounds, i.e. advanced graduate students) and serve as a review to researchers entering in this field and working on these materials. It should also be useful to solid state spectroscopists, lasers physicists; electronic and illuminating engineering people, and all those professionals using these materials.

In-situ Electron Microscopy

In-situ Electron Microscopy PDF Author: Gerhard Dehm
Publisher: John Wiley & Sons
ISBN: 3527652183
Category : Technology & Engineering
Languages : en
Pages : 403

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Book Description
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Microanalysis of Solids

Microanalysis of Solids PDF Author: B.G. Yacobi
Publisher: Springer Science & Business Media
ISBN: 1489914927
Category : Science
Languages : en
Pages : 459

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Book Description
The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences.

Luminescence of Solids

Luminescence of Solids PDF Author: D.R. Vij
Publisher: Springer Science & Business Media
ISBN: 146155361X
Category : Science
Languages : en
Pages : 435

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Book Description
Luminescence of Solids gathers together much of the latest work on luminescent inorganic materials and new physical phenomena. The volume includes chapters covering -- the achievements that have led to the establishment of the fundamental laws of luminescence -- light sources, light-dispersing elements, detectors, and other experimental techniques -- models and mechanisms -- materials preparation, and -- future trends. This international collection of cutting-edge luminescence research is complemented by over 170 illustrations that bring to life the text's many vital concepts.

Combinatorial Materials Synthesis

Combinatorial Materials Synthesis PDF Author: Xiao-Dong Xiang
Publisher: CRC Press
ISBN: 020391273X
Category : Science
Languages : en
Pages : 484

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Book Description
Pioneered by the pharmaceutical industry and adapted for the purposes of materials science and engineering, the combinatorial method is now widely considered a watershed in the accelerated discovery, development, and optimization of new materials. Combinatorial Materials Synthesis reveals the gears behind combinatorial materials chemistry and thin-

Microprobe Characterization of Optoelectronic Materials

Microprobe Characterization of Optoelectronic Materials PDF Author: Juan Jimenez
Publisher: CRC Press
ISBN: 1040283829
Category : Technology & Engineering
Languages : en
Pages : 731

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Book Description
Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.