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Author: Michael J. Buckingham
Publisher: Ellis Horwood
ISBN:
Category : Science
Languages : en
Pages : 380
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Book Description
Author: Michael J. Buckingham
Publisher: Ellis Horwood
ISBN:
Category : Science
Languages : en
Pages : 380
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Book Description
Author: Stephen B. Alexander
Publisher: SPIE Press
ISBN: 9780819420237
Category : Technology & Engineering
Languages : en
Pages : 344
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Book Description
This Tutorial Text provides an overview of design principles for receivers used in optical communication systems, intended for practicing engineers. The author reviews technologies used to construct optical links and illustrates the flow of system performance specifications into receiver requirements. Photodetector fundamentals, associated statistics, characteristics and performance issues are presented, together with a tutorial on noise analysis and the specific techniques needed to model optical receivers.
Author: Jerry C. Whitaker
Publisher: CRC Press
ISBN: 1420036661
Category : Technology & Engineering
Languages : en
Pages : 2636
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Book Description
During the ten years since the appearance of the groundbreaking, bestselling first edition of The Electronics Handbook, the field has grown and changed tremendously. With a focus on fundamental theory and practical applications, the first edition guided novice and veteran engineers along the cutting edge in the design, production, installation, operation, and maintenance of electronic devices and systems. Completely updated and expanded to reflect recent advances, this second edition continues the tradition. The Electronics Handbook, Second Edition provides a comprehensive reference to the key concepts, models, and equations necessary to analyze, design, and predict the behavior of complex electrical devices, circuits, instruments, and systems. With 23 sections that encompass the entire electronics field, from classical devices and circuits to emerging technologies and applications, The Electronics Handbook, Second Edition not only covers the engineering aspects, but also includes sections on reliability, safety, and engineering management. The book features an individual table of contents at the beginning of each chapter, which enables engineers from industry, government, and academia to navigate easily to the vital information they need. This is truly the most comprehensive, easy-to-use reference on electronics available.
Author: Michael J. Buckingham
Publisher:
ISBN: 9780853128762
Category :
Languages : en
Pages : 372
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Book Description
Author: C Claeys
Publisher: World Scientific
ISBN: 9814546143
Category :
Languages : en
Pages : 702
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Book Description
The recent conferences in this series were organised in Montreal (1987), Budapest (1989), Kyoto (1991), St Louis (1993) and Palanga (1995). The aim of the conference was to bring together specialists in fluctuation phenomena from different fields and to make a bridge between theoretical scientists and more applied or engineering oriented researchers. Therefore a broad variety of topics covering the fundamental aspects of noise and fluctuations as well as applications in various fields are addressed. Noise in materials, components, circuits and electronic, biological and other physical systems are discussed.
Author: Gabriel Vasilescu
Publisher: Springer Science & Business Media
ISBN: 3540265104
Category : Technology & Engineering
Languages : en
Pages : 716
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Book Description
Electronic Noise and Interfering Signals is a comprehensive reference book on noise and interference in electronic circuits, with particular focus on low-noise design. The first part of the book deals with mechanisms, modelling, and computation of intrinsic noise which is generated in every electronic device. The second part analyzes the coupling mechanisms which can lead to a contamination of circuits by parasitic signals and provides appropriate solutions to this problem. The last part contains more than 100 practical, elaborate case studies. The book requires no advanced mathematical training as it introduces the fundamental methods. Moreover, it provides insight into computational noise analysis with SPICE and NOF, a software developed by the author. The book addresses designers of electronic circuits as well as researchers from electrical engineering, physics, and material science. It should also be of interest for undergraduate and graduate students.
Author: Hans Hartnagel
Publisher: John Wiley & Sons
ISBN: 9780471384328
Category : Technology & Engineering
Languages : en
Pages : 316
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Book Description
A thorough reference work bridging the gap between contemporary and traditional approaches to noise problems Noise in semiconductor devices refers to any unwanted signal or disturbance in the device that degrades performance. In semiconductor devices, noise is attributed to hot-electron effects. Current advances in information technology have led to the development of ultrafast devices that are required to provide low-noise, high-speed performance. Microwave Noise in Semiconductor Devices considers available data on the speed versus noise trade-off and discusses optimal solutions in semiconductors and semiconductor structures. These solutions are of direct interest in the research and development for fast, efficient, and reliable communications systems. As the only book of its kind accessible to practicing engineers, the material is divided into four parts-the kinetic theory of fluctuations and its corollaries, the methods of measurements of microwave noise, low-dimensional structures, and, finally, devices. With over 100 illustrations presenting recent experimental data for up-to-date semiconductor structures designed for ultrafast electronics, together with results of microscopic simulation where available, these examples, tables, and references offer a full comprehension of electronic processes and fluctuation in dimensionally quantizing structures. Bridging the apparent gap between the microscopic approach and the equivalent circuit approach, Microwave Noise in Semiconductor Devices considers microwave fluctuation phenomena and noise in terms of ultrafast kinetic processes specific to modern quantum-well structures. Scientists in materials science, semiconductor and solid-state physics, electronic engineers, and graduate students will all appreciate this indispensable review of contemporary and future microwave and high-speed electronics.
Author: Gijs Bosman
Publisher: World Scientific
ISBN: 9812811168
Category : Electronic noise
Languages : en
Pages : 850
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Book Description
The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide. Contents: Noise in Nanoscale Devices (S Bandyopadhyay et al.); 1/f Voltage Noise Induced by Magnetic Flux Flow in Granular Superconductors (O V Gerashchenko); Low Frequency Noise Analysis of Different Types of Polysilicon Resistors (A Penarier et al.); Low Frequency Noise in CMOS Transistors: An Experimental and Comparative Study on Different Technologies (P Fantini et al.); Modeling of Current Transport and 1/f Noise in GaN Based HBTs (H Unlu); Low Frequency Noise in CdSe Thin Film Transistors (M J Deen & S Rumyanstsev); NIST Program on Relative Intensity Noise Standards for Optical Fiber Sources Near 1550 nm (G Obarski); Physical Model of the Current Noise Spectral Density Versus Dark Current in CdTe Detectors (A Imad et al.); Time and Frequency Study of RTS in Bipolar Transistors (A Penarier et al.); Neural Network Based Adaptive Processing of Electrogastrogram (S Selvan); Shot Noise as a Test of Entanglement and Nonlocality of Electrons in Mesoscopic Systems (E V Sukhorukov et al.); The Readout of Time, Continued Fractions and 1/f Noise (M Planat & J Cresson); Longitudinal and Transverse Noise of Hot Electrons in 2DEG Channels (J Liberis et al.); 1/f Noise, Intermittency and Clustering Poisson Process (F Gruneis); Noise Modeling for PDE Based Device Simulations (F Bonani & G Ghione); Methods of Slope Estimation of Noise Power Spectral Density (J Smulko); and other papers. Readership: Researchers, academics and graduate students in electrical and electronic engineering, biophysics, nanoscience, applied physics, statistical physics and semiconductor science.
Author: Vytautas Bareikis
Publisher: World Scientific
ISBN: 9814549177
Category :
Languages : en
Pages : 770
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Book Description
The volume constitutes the proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF'95) held in Palanga, Lithuania, in the period 29 May - 3 June 1995.International conference of fluctuation phenomena has a rich history. Previous ones were held in St. Louis (USA, 1993), Kyoto (Japan, 1991), Budapest (Hungary, 1989), Montreal (Canada, 1983), etc. The conference proved to be successful in bringing together specialists in fluctuation phenomena in very different areas, and providing a bridge linking theorists and applied scientists involved in the design of new generation of electronic devices. Correspondingly, the volume covers fundamental aspects of noise in various fields of science and modern technology. Mesoscopic fluctuations, noise in high temperature superconductors, in nanoscale structures, in optoelectronic and microwave devices, fluctuation phenomena in biological systems and human body are in the spotlight.
Author: Gijs Bosman
Publisher: World Scientific
ISBN: 9814490695
Category : Technology & Engineering
Languages : en
Pages : 850
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Book Description
The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide.
