Atomic-scale Imaging of Surfaces and Interfaces PDF Download
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Author:
Publisher:
ISBN:
Category : Atomic structure
Languages : en
Pages : 288
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Book Description
Author:
Publisher:
ISBN:
Category : Atomic structure
Languages : en
Pages : 288
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 290
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Book Description
The gap between imagining and imaging is getting ever smaller. Atomic-Scale Imaging of Surfaces and Interfaces, Symposium W at the 1992 MRS fall Meeting in Boston, Massachusetts, brought together researchers using most state-of-the-art imaging techniques capable of resolving atomic features. Methods represented were scanning tunneling microscopy (STM), atomic force microscopy (AFM), low energy electron microscopy (LEEM), transmission (TEM) and reflection (REM) electron microscopy, scanning electron microscopy (SEM), atom probe field ion microscopy (APFIM or POSAP), high and low energy external source electron holographies and internal source electron holographies. Some highlights from the STM papers included discussions of the limitations and future potential of STM as well as current findings. Several papers presented work with STM at elevated temperatures. Jene Golovchenko reviewed STM work showing cooperative diffusion events (Pb on Ge) involving many tens of substrate atoms. Don Eigler focused on atomic manipulation and some of its uses to enable fundamental studies of small atomic clusters.
Author: D. K. Biegelsen
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 312
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Book Description
Materials tunneling microscopy for hydrogen-desorption-induced structural change of Si(111) surface; Steps on the (110) surface InP; Scanning tunneling microscopy on charge density waves in layered compounds; Design of ultra high vacuum scanning electron microscope combined with scanning tunneling microscope; Scanning tunneling microscopy perspective of structures on reduced SrTiO3(001) surfaces; Surface structure and electronic property of reduced SrTiO3(100) surface observed by STM/STS; Metastable structural surface excitations and concerted adatom motions: a STM study of atomic motions within a semiconductor surface; Mechanisms and energetics of surface atomic processes: an atom-probe field ion microscope study; Atomic arrangement of Al near the phase boundaries between square root 3X square root 3-Al and 7X7 structures on Si(111) surfaces; Growth and surface morphology of thin silicon films using an atomic force microscope; Solving interface structures by combined electron microscopy and X-ray diffraction; Quantitative hrem study of the atomic structure of the sum(310)/[001] symmetric tilt grain boundary in Nb; Hrtem observation of a sum =3 \{112\} bicrystal boundary in aluminum; Atomic structure of the (310) twin in niobium; theoretical predictions and comparison with experimental observation; Quantitative high-resolution electron microscopy of grain boundaries in gamma-Al2=3; Comparisons of observed and simulated atomic structures of Pd/NiO heterophase interfaces; Atomic structure of sum =5 (130) symmetrical tilt boundary in strontium titanate; Assessment of GaInAs/GaInAsP interdiffusion profiles obtained using stem-edx and hrem; Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes; Real-time viewinf of dynamic processes on CdTe surfaces at elevated temperature; AFM imaging of the crystalline-to-amorphous transition on the surface of ion-implanted mica; AFM imagings of ferritin molecules bound to LB films of poly-1-benzyl-L-histidine; Artifacts in atomic force microscopy of nanoporous and mesoporous fiducial samples; Al induced reconstructions on the Si(111) surfaces studied by scanning tunneling microscopy; Structure of the sum =3 (111) grain boundary in Cu-1.5%Sb; High resolution electron microscopy of sum =3 NiSi2 (111)/(115) Si and NiSi2(221)/(001)Si interfaces; Image simulations of Ge twin boundaries; Surface structure of oxide catalyst microcrystals: high resolution electron microscopy study; A microstructural study of reaction-bonded silicon carbide...
Author: Weronika Walkosz
Publisher: Springer Science & Business Media
ISBN: 1441978178
Category : Technology & Engineering
Languages : en
Pages : 114
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Book Description
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications. The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before. The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Author: Jacek Lipkowski
Publisher: Wiley-VCH
ISBN:
Category : Science
Languages : en
Pages : 368
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Book Description
Pushing the frontiers of electrochemistry-a survey of new surface imaging techniques. This latest installment in the Frontiers of Electrochemistry series helps readers gain insight into one of the hottest areas of modern electrochemistry. Tracing recent advances in the imaging of electrified surfaces, this volume describes cutting-edge techniques that allow us to record real-time and real-space images with atomic resolution, observe structures of surfaces and interfaces directly on a display, study the distribution of atoms and molecules during a surface reaction, and much more. Leading international authorities discuss surface imaging techniques used in technologies involving electrocrystallization and electrodeposition of metals-employing numerous examples to demonstrate site specificity of electrode processes, and discussing applications to electronic materials such as the capacity to print nanopatterns at electrode surfaces. They cover techniques that advance our understanding of the properties of organic films and surfaces and interfaces, including scanning electron microscopy and microprobes and atomic force microscopy. Finally, they review the theory of electron tunneling at the metal/solution interface, helping readers interpret images of electrode surfaces obtained by scanning tunneling microscopy. Designed to meet the needs of specialists and nonspecialists alike, Imaging of Surfaces and Interfaces provides plenty of background material along with eight color plates. It is an important resource for scientists involved in electrochemistry, surface science, materials science, and electrodeposition technologies.
Author: Victor Bellitto
Publisher: BoD – Books on Demand
ISBN: 9535104144
Category : Science
Languages : en
Pages : 272
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Book Description
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
Author: Klaus Wandelt
Publisher: John Wiley & Sons
ISBN: 3527411569
Category : Science
Languages : en
Pages : 1010
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Book Description
Covering interface science from a novel surface science perspective, this unique handbook offers a comprehensive overview of this burgeoning field. Eight topical volumes cover basic concepts and methods, elemental and composite surfaces, solid-gas, solid-liquid and inorganic biological interfaces, as well as applications of surface science in nanotechnology, materials science and molecular electronics. With its broad scope and clear structure, it is ideal as a reference for scientists in the field, as well as an introduction for newcomers.
Author: Klaus Heinz
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Patricia Maurice
Publisher: John Wiley & Sons
ISBN: 0470400366
Category : Science
Languages : en
Pages : 469
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Book Description
An advanced exploration ofwater-rock interactions Based on the author's fifteen years of teaching and tried-and-tested experiences in the classroom, here is a comprehensive exploration of water-rock interactions. Environmental Surfaces and Interfaces from the Nanoscale to the Global Scale covers aspects ranging from the theory of charged particle surfaces to how minerals grow and dissolve to new frontiers in W-R interactions such as nanoparticles, geomicrobiology, and climate change. Providing basic conceptual understanding along with more complex subject matter, Professor Patricia Maurice encourages students to look beyond the text to ongoing research in the field. Designed to engage the learner, the book features: Numerous case studies to contextualize concepts Practice and thought questions at the end of each chapter Broad coverage from basic theory to cutting-edge topics such as nanotechnology Both basic and applied science This text goes beyond W-R interactions to touch on a broad range of environmental disciplines. While written for advanced undergraduate and graduate students primarily in geochemistry and soil chemistry, Environmental Surfaces and Interfaces from the Nanoscale to the Global Scale will serve the needs of such diverse fields as environmental engineering, hydrogeology, physics, biology, and environmental chemistry.
Author: N. John DiNardo
Publisher: John Wiley & Sons
ISBN: 3527615946
Category : Technology & Engineering
Languages : en
Pages : 173
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Book Description
Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them. Topics include: Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information
