Applications Of X-ray Photoelectron Spectroscopy To Catalytic Studies: From Routine Analysis To Cutting-edge Surface Characterization PDF Download
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Author: Spyridon Zafeiratos
Publisher: World Scientific
ISBN: 180061330X
Category : Science
Languages : en
Pages : 548
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Book Description
X-ray photoelectron spectroscopy (XPS) has become a standard practice technique, and automated XPS facilities can be found in industry and in universities all over the world. This transformed XPS from an advanced characterization method for dedicated research, to a rather standard analysis technique of surface analysis. The catalyst's surface state is probably the most prominent factor that influences the catalytic performance. It is therefore no surprise that XPS has become an indispensable tool in studies of solid catalysts. It has been directly used to investigate issues such as the surface composition of the active catalyst and reaction and deactivation mechanisms.The objective of this book is to provide a comprehensive overview of the current status and future perspectives of X-ray photoelectron spectroscopy dedicated to catalytic applications, including thermal catalysis, electrocatalysis, and photo(electro)catalysis. The book contains 13 chapters, starting with the necessary introduction of the technique background, including basic phenomena and instrumentation aspects. The second part of the book focuses on the presentation of long-established applications of the technique, such as XPS studies of model catalysts. Finally, the book describes relatively recent developments of this method for cutting-edge surface characterization mainly using synchrotron X-ray radiation.
Author: Spyridon Zafeiratos
Publisher: World Scientific
ISBN: 180061330X
Category : Science
Languages : en
Pages : 548
Get Book Here
Book Description
X-ray photoelectron spectroscopy (XPS) has become a standard practice technique, and automated XPS facilities can be found in industry and in universities all over the world. This transformed XPS from an advanced characterization method for dedicated research, to a rather standard analysis technique of surface analysis. The catalyst's surface state is probably the most prominent factor that influences the catalytic performance. It is therefore no surprise that XPS has become an indispensable tool in studies of solid catalysts. It has been directly used to investigate issues such as the surface composition of the active catalyst and reaction and deactivation mechanisms.The objective of this book is to provide a comprehensive overview of the current status and future perspectives of X-ray photoelectron spectroscopy dedicated to catalytic applications, including thermal catalysis, electrocatalysis, and photo(electro)catalysis. The book contains 13 chapters, starting with the necessary introduction of the technique background, including basic phenomena and instrumentation aspects. The second part of the book focuses on the presentation of long-established applications of the technique, such as XPS studies of model catalysts. Finally, the book describes relatively recent developments of this method for cutting-edge surface characterization mainly using synchrotron X-ray radiation.
Author: Spyridon Zafeiratos
Publisher: Wspc (Europe)
ISBN: 9781800613287
Category : Catalysis
Languages : en
Pages : 0
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Book Description
"XPS has become a mature technique and automated XPS facilities can be found in industry and in universities all over the world. This transformed XPS from an advanced characterization method for dedicated research, to a rather standard analysis technique of surface analysis. The catalyst's surface state is probably the most prominent factor that influences the catalytic performance. It is therefore no surprise that XPS has become an indispensable tool in studies of solid catalysts. It has been directly used to investigate issues such as the surface composition of the active catalyst and the reaction and deactivation mechanisms. Several excellent essays describe in detail the theoretical and practical aspects of X-ray photoelectron spectroscopy. The objective of the book is to provide a comprehensive overview of the current status and future perspectives of X-ray photoelectron spectroscopy dedicated to catalytic applications, including thermal catalysis, electrocatalysis, and photo(electro)catalysis. The book contains 13 chapters, starting with the necessary introduction of the technique background, including basic phenomena and instrumentation aspects. The second part of the book focuses on the presentation of long-established applications of the technique such as XPS studies of model catalysts. In the last part, the book describes relatively recent developments of this method for cutting edge surface characterization mainly using synchrotron X-ray radiation"--
Author: Rutger A Van Santen
Publisher: World Scientific
ISBN: 1800614020
Category : Science
Languages : en
Pages : 719
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Book Description
Heterogeneous catalysis has developed over the past two centuries as a technology driven by the needs of society, and is part of Nobel Prize-winning science. This book describes the spectacular increase in molecular understanding of heterogenous catalytic reactions in important industrial processes. Reaction mechanism and kinetics are discussed with a unique focus on their relation with the inorganic chemistry of the catalyst material. An introductory chapter presents the development of catalysis science and catalyst discovery from a historical perspective. Five chapters that form the thrust of the book are organized by type of reaction, reactivity principles, and mechanistic theories, which provide the scientific basis to structure-function relationships of catalyst performance. Present-day challenges to catalysis are sketched in a final chapter. Written by one of the world's leading experts on the topic, this definitive text is an essential reference for students, researchers and engineers working in this multibillion-dollar field.
Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
ISBN: 3642273807
Category : Science
Languages : en
Pages : 544
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Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author: Gernot Friedbacher
Publisher: Wiley-VCH
ISBN: 9783527320479
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Author:
Publisher:
ISBN:
Category : Power (Mechanics)
Languages : en
Pages : 858
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Book Description
Author: Eda Jagst
Publisher:
ISBN: 9783981385342
Category :
Languages : en
Pages : 129
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Book Description
Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 030645887X
Category : Science
Languages : en
Pages : 316
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Book Description
This book is intended for professionals, researchers, technicians and students who are newcomers to the field as well as those with experience. It will be an important resource in the following fields: surface science, electronic materials and processes, thin film deposition, surface compositional analysis and related topical areas such as corrosion, oxidation, reduction, adsorption, desorption, adhesion, epitaxial growth and contamination. The presentation uses a tutorial and pedagogical approach.
Author: B. Vincent Crist
Publisher: John Wiley & Sons
ISBN: 0471492655
Category : Science
Languages : de
Pages : 562
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Book Description
These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other materials. Offers a clear presentation of spectra with the rightamount of experimental detail. All of the experiments have been conducted under controlled conditions on the same instrument by aworld-renowned expert.
