An Optimal Algorithm for Detecting Pattern Sensitive Faults PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download An Optimal Algorithm for Detecting Pattern Sensitive Faults PDF full book. Access full book title An Optimal Algorithm for Detecting Pattern Sensitive Faults by Richard Ira Subrin. Download full books in PDF and EPUB format.
Author: Richard Ira Subrin
Publisher:
ISBN:
Category : Pattern recognition systems
Languages : en
Pages : 170
Get Book Here
Book Description
Author: Richard Ira Subrin
Publisher:
ISBN:
Category : Pattern recognition systems
Languages : en
Pages : 170
Get Book Here
Book Description
Author: Ireneusz Mrozek
Publisher: Springer
ISBN: 3319912046
Category : Technology & Engineering
Languages : en
Pages : 142
Get Book Here
Book Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Author: Wade Shafer
Publisher: Springer Science & Business Media
ISBN: 1461337003
Category : Science
Languages : en
Pages : 335
Get Book Here
Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volume were handled by an international publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 26 (thesis year 1981) a total of 11 ,048 theses titles from 24 Canadian and 21 8 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this important annual reference work. While Volume 26 reports theses submitted in 1981, on occasion, certain univer sities do report theses submitted in previous years but not reported at the time.
Author: Manoj Franklin
Publisher:
ISBN:
Category :
Languages : en
Pages : 30
Get Book Here
Book Description
Author: Hans-Joachim Wunderlich
Publisher: Springer Science & Business Media
ISBN: 9048132827
Category : Computers
Languages : en
Pages : 263
Get Book Here
Book Description
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 264
Get Book Here
Book Description
Author: G. Russell
Publisher: Springer Science & Business Media
ISBN: 9780747600015
Category : Computers
Languages : en
Pages : 406
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Electronic data processing
Languages : en
Pages : 468
Get Book Here
Book Description
Author: Franco P. Preparata
Publisher: Springer
ISBN: 3540738142
Category : Computers
Languages : en
Pages : 357
Get Book Here
Book Description
This book constitutes the refereed proceedings of the First Annual International Frontiers of Algorithmics Workshop, FAW 2007, held in Lanzhou, China in August 2007. Topics covered in the papers include bioinformatics, discrete structures, geometric information processing and communication, games and incentive analysis, graph algorithms, internet algorithms and protocols, and algorithms in medical applications.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
Get Book Here
Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
