An in Situ High Voltage Electron Microscopy Technique for the Study of Deformation and Fracture: In Multilayered Materials PDF Download
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Languages : en
Pages : 0
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Languages : en
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Author: Florian Banhart
Publisher: World Scientific
ISBN: 9814471461
Category : Technology & Engineering
Languages : en
Pages : 318
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Book Description
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Author: Renu Sharma
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 250
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Electron microscopy techniques are among the most powerful methods for characterization of materials, with the ability to reveal both the atomic-scale structure and composition. This information may be used to elucidate macroscopic properties or to optimize materials synthesis and processing. Instrumentation and techniques for dynamic in situ experiments are undergoing rapid development and have recently been applied to a wide range of problems. This book focuses on time-resolved electron microscopy (including diffraction and spectroscopy), as well as novel instrumentation for temperature and pressure control. In addition to discussing the application of electron microscopy techniques to the in situ study of the kinetics, thermodynamics and mechanisms of reaction, the book also explores their utility as efficient methods of optimizing processing conditions. Imaging techniques featured include: scanning tunneling microscopy, high-resolution electron microscopy, dark field transmission and reflection electron microscopy, Lorentz microscopy, electron holography, scanning and low-energy electron microscopy and photoemission electron microscopy
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Languages : en
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Author: Renu Sharma
Publisher: John Wiley & Sons
ISBN: 3527347984
Category : Science
Languages : en
Pages : 389
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In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.
Author: Ron M. Anderson
Publisher:
ISBN: 9781558993846
Category : Science
Languages : en
Pages : 320
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Book Description
Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This book from MRS, the fourth in a successful series, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the book are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semiconducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.
Author: Hiroshi Fujita
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 576
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Author: Gareth Thomas
Publisher: Univ of California Press
ISBN: 0520323238
Category : Non-Classifiable
Languages : en
Pages : 1315
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Book Description
This title is part of UC Press's Voices Revived program, which commemorates University of California Press’s mission to seek out and cultivate the brightest minds and give them voice, reach, and impact. Drawing on a backlist dating to 1893, Voices Revived makes high-quality, peer-reviewed scholarship accessible once again using print-on-demand technology. This title was originally published in 1972.
Author: Klaus Wetzig
Publisher: Wiley-VCH
ISBN:
Category : Science
Languages : en
Pages : 252
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Book Description
The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.
![In Situ High Voltage Electron Microscope Studies of Ion- and Electron-beam Induced Modification of Materials. [Ni-Al]. PDF](https://books.google.com/books/content/images/frontcover/X_9LAQAACAAJ?fife=w80-h100)
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Languages : en
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In situ high-voltage electron microscope (HVEM) studies have shown that the highly focused electron beams normally employed for irradiation purposes in the HVEM can cause easily measurable composition changes in the irradiated volume of thin alloy films (Ni-Al). The kinetics of this ''beam-induced'' composition change has been investigated and found to exhibit a strong dependence not only on temperature and peak electron flux, but also on the beam diameter. The dependence on beam diameter has far reaching implications for HVEM studies of radiation effects in alloys, and for microchemical analysis techniques such as EDX and EELS.
