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Author:
Publisher:
ISBN:
Category : Bibliography, National
Languages : en
Pages : 3116
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Book Description
Author:
Publisher:
ISBN:
Category : Bibliography, National
Languages : en
Pages : 3116
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Book Description
Author: Arthur James Wells
Publisher:
ISBN:
Category : Bibliography, National
Languages : en
Pages : 1150
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Book Description
Author: Iain Rice
Publisher: Kalmbach Publishing, Co.
ISBN: 0890246904
Category : Railroads
Languages : en
Pages : 90
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Book Description
Includes specific pointers on shelf layouts. Uses examples for N scale, HO scale, and ON30 scale trains. Covers a variety of scales, modeling eras, and room applications.
Author: Dorian Pyle
Publisher: Morgan Kaufmann
ISBN: 9781558605299
Category : Computers
Languages : en
Pages : 566
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Book Description
This book focuses on the importance of clean, well-structured data as the first step to successful data mining. It shows how data should be prepared prior to mining in order to maximize mining performance.
Author: Iain Rice
Publisher: Haynes Publishing UK
ISBN: 9781844256358
Category : Crafts & Hobbies
Languages : en
Pages : 0
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Book Description
This book is the first title in a new series, Realistic Railway Modeling, written by a highly regarded expert. Aimed at really keen modelers who want to learn how to achieve the highest standards, this all-color book, packed with photos and diagrams, provides the very last word in detail in seven themed chapters, and concludes with easy-to-follow step-by-step instructions for a worked example. Layout planning, of course, is where the hobby essentially starts, and no stone is left unturned in the author's comprehensive coverage.
Author: Iain Rice
Publisher:
ISBN: 9781874103004
Category : Railroad tracks
Languages : en
Pages : 110
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Book Description
Author:
Publisher:
ISBN:
Category : Railroads
Languages : en
Pages : 1054
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Book Description
Author: Michael F. Ashby
Publisher: Elsevier
ISBN: 1483297217
Category : Technology & Engineering
Languages : en
Pages : 380
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Book Description
Provides a thorough explanation of the basic properties of materials; of how these can be controlled by processing; of how materials are formed, joined and finished; and of the chain of reasoning that leads to a successful choice of material for a particular application. The materials covered are grouped into four classes: metals, ceramics, polymers and composites. Each class is studied in turn, identifying the families of materials in the class, the microstructural features, the processes or treatments used to obtain a particular structure and their design applications. The text is supplemented by practical case studies and example problems with answers, and a valuable programmed learning course on phase diagrams.
Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Category : Technology & Engineering
Languages : en
Pages : 543
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Book Description
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author: Scott Krig
Publisher: Apress
ISBN: 1430259302
Category : Computers
Languages : en
Pages : 498
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Book Description
Computer Vision Metrics provides an extensive survey and analysis of over 100 current and historical feature description and machine vision methods, with a detailed taxonomy for local, regional and global features. This book provides necessary background to develop intuition about why interest point detectors and feature descriptors actually work, how they are designed, with observations about tuning the methods for achieving robustness and invariance targets for specific applications. The survey is broader than it is deep, with over 540 references provided to dig deeper. The taxonomy includes search methods, spectra components, descriptor representation, shape, distance functions, accuracy, efficiency, robustness and invariance attributes, and more. Rather than providing ‘how-to’ source code examples and shortcuts, this book provides a counterpoint discussion to the many fine opencv community source code resources available for hands-on practitioners.
