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Author: Basel Halak
Publisher: Springer Nature
ISBN: 3030237818
Category : Technology & Engineering
Languages : en
Pages : 231
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Book Description
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Author: Basel Halak
Publisher: Springer Nature
ISBN: 3030237818
Category : Technology & Engineering
Languages : en
Pages : 231
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Book Description
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Author: Mark (Mohammad) Tehranipoor
Publisher: Springer
ISBN: 3319118242
Category : Technology & Engineering
Languages : en
Pages : 282
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Book Description
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.
Author: Friedrich Beck
Publisher: John Wiley & Sons
ISBN: 9780471974017
Category : Technology & Engineering
Languages : en
Pages : 198
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Book Description
Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.
Author: Sheldon Tan
Publisher: Springer Nature
ISBN: 3030261727
Category : Technology & Engineering
Languages : en
Pages : 487
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Book Description
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.
Author: Jon Gertner
Publisher: Penguin
ISBN: 1101561084
Category : Business & Economics
Languages : en
Pages : 434
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Book Description
The definitive history of America’s greatest incubator of innovation and the birthplace of some of the 20th century’s most influential technologies “Filled with colorful characters and inspiring lessons . . . The Idea Factory explores one of the most critical issues of our time: What causes innovation?” —Walter Isaacson, The New York Times Book Review “Compelling . . . Gertner's book offers fascinating evidence for those seeking to understand how a society should best invest its research resources.” —The Wall Street Journal From its beginnings in the 1920s until its demise in the 1980s, Bell Labs-officially, the research and development wing of AT&T-was the biggest, and arguably the best, laboratory for new ideas in the world. From the transistor to the laser, from digital communications to cellular telephony, it's hard to find an aspect of modern life that hasn't been touched by Bell Labs. In The Idea Factory, Jon Gertner traces the origins of some of the twentieth century's most important inventions and delivers a riveting and heretofore untold chapter of American history. At its heart this is a story about the life and work of a small group of brilliant and eccentric men-Mervin Kelly, Bill Shockley, Claude Shannon, John Pierce, and Bill Baker-who spent their careers at Bell Labs. Today, when the drive to invent has become a mantra, Bell Labs offers us a way to enrich our understanding of the challenges and solutions to technological innovation. Here, after all, was where the foundational ideas on the management of innovation were born.
Author: Paul M. Chirlian
Publisher: HarperCollins Publishers
ISBN: 9780060412531
Category : Circuits intégrés
Languages : en
Pages : 1019
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Book Description
Author: Sung-Mo Kang
Publisher:
ISBN: 9780071243421
Category : Digital integrated circuits
Languages : en
Pages : 655
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Book Description
The fourth edition of CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehensive coverage of digital CMOS circuit design, as well as addressing state-of-the-art technology issues highlighted by the widespread use of nanometer-scale CMOS technologies. In this latest edition, virtually all chapters have been re-written, the transistor model equations and device parameters have been revised to reflect the sigificant changes that must be taken into account for new technology generations, and the material has been reinforced with up-to-date examples. The broad-ranging coverage of this textbook starts with the fundamentals of CMOS process technology, and continues with MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, arithmetic building blocks, clock and I/O circuits, low power design techniques, design for manufacturability and design for testability.
Author: Ronald Quan
Publisher: McGraw Hill Professional
ISBN: 1260143570
Category : Technology & Engineering
Languages : en
Pages : 465
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Book Description
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product. Debug, Tweak and fine-tune your DIY electronics projects This hands-on guide shows, step by step, how to build, debug, and troubleshoot a wide range of analog electronic circuits. Written by electronics guru Ronald Quan, Troubleshooting Electronic Circuits: A Guide to Learning Analog Circuits clearly explains proper debugging techniques as well as testing and modifying methods. In multiple chapters, poorly-conceived circuits are analyzed and improved. Inside, you will discover how to design or re-design high-quality circuits that are repeatable and manufacturable. Coverage includes: • An introduction to electronics troubleshooting • Breadboards • Power sources, batteries, battery holders, safety issues, and volt meters • Basic electronic components • Diodes, rectifiers, and Zener diodes • Light emitting diodes (LEDs) • Bipolar junction transistors (BJTs) • Troubleshooting discrete circuits (simple transistor amplifiers) • Analog integrated circuits, including amplifiers and voltage regulators • Audio circuits • Troubleshooting analog integrated circuits • Ham radio circuits related to SDR • Trimmer circuits, including the 555 chip and CMOS circuits
Author: Behzad Razavi
Publisher: 清华大学出版社有限公司
ISBN: 9787302108863
Category : Linear integrated circuits
Languages : zh-CN
Pages : 712
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Book Description
本书介绍了模拟电路设计的基本概念, 说明了CMOS模拟集成电路设计技术的重要作用, 描述了MOS器件的物理模型及工作特性等.
Author: Ross Knox Bassett
Publisher: JHU Press
ISBN: 9780801886393
Category : Science
Languages : en
Pages : 440
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Book Description
The metal-oxide-semiconductor (MOS) transistor is the fundamental element of digital electronics. The tens of millions of transistors in a typical home -- in personal computers, automobiles, appliances, and toys -- are almost all derive from MOS transistors. To the Digital Age examines for the first time the history of this remarkable device, which overthrew the previously dominant bipolar transistor and made digital electronics ubiquitous. Combining technological with corporate history, To the Digital Age examines the breakthroughs of individual innovators as well as the research and development power (and problems) of large companies such as IBM, Intel, and Fairchild. Bassett discusses how the MOS transistor was invented but spurned at Bell Labs, and then how, in the early 1960s, spurred on by the possibilities of integrated circuits, RCA, Fairchild, and IBM all launched substantial MOS R & D programs. The development of the MOS transistor involved an industry-wide effort, and Bassett emphasizes how communication among researchers from different firms played a critical role in advancing the new technology. Bassett sheds substantial new light on the development of the integrated circuit, Moore's Law, the success of Silicon Valley start-ups as compared to vertically integrated East Coast firms, the development of the microprocessor, and IBM's multi-billion-dollar losses in the early 1990s. To the Digital Age offers a captivating account of the intricate R & D process behind a technological device that transformed modern society.
