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Author: Yanwen Wu
Publisher: Trans Tech Publications Ltd
ISBN: 3038133531
Category : Technology & Engineering
Languages : en
Pages : 1730
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Book Description
This special collection on Advanced Measurement and Test is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. Design, testing and yield professionals were invited to confront the challenges which the industry faces, and to learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers and test engineers.
Author: Yanwen Wu
Publisher: Trans Tech Publications Ltd
ISBN: 3038133531
Category : Technology & Engineering
Languages : en
Pages : 1730
Get Book
Book Description
This special collection on Advanced Measurement and Test is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. Design, testing and yield professionals were invited to confront the challenges which the industry faces, and to learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers and test engineers.
Author: Yanwen Wu
Publisher: Trans Tech Publications
ISBN: 9780878492718
Category : Electric measurements
Languages : en
Pages : 0
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Book Description
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Author:
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 446
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Book Description
Author: Ankdrew Parvel
Publisher: Trans Tech Publications Ltd
ISBN: 3038267597
Category : Technology & Engineering
Languages : en
Pages : 230
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Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Author: Riza Esa
Publisher:
ISBN: 9783037851975
Category : Electronics
Languages : en
Pages : 0
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Book Description
Deals with the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis... and back to process and design improvement.
Author: Hadley Wickham
Publisher: CRC Press
ISBN: 1498759807
Category : Mathematics
Languages : en
Pages : 476
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Book Description
An Essential Reference for Intermediate and Advanced R Programmers Advanced R presents useful tools and techniques for attacking many types of R programming problems, helping you avoid mistakes and dead ends. With more than ten years of experience programming in R, the author illustrates the elegance, beauty, and flexibility at the heart of R. The book develops the necessary skills to produce quality code that can be used in a variety of circumstances. You will learn: The fundamentals of R, including standard data types and functions Functional programming as a useful framework for solving wide classes of problems The positives and negatives of metaprogramming How to write fast, memory-efficient code This book not only helps current R users become R programmers but also shows existing programmers what’s special about R. Intermediate R programmers can dive deeper into R and learn new strategies for solving diverse problems while programmers from other languages can learn the details of R and understand why R works the way it does.
Author: John G. Webster
Publisher: CRC Press
ISBN: 1351833340
Category : Medical
Languages : en
Pages : 1640
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Book Description
The Second Edition of the bestselling Measurement, Instrumentation, and Sensors Handbook brings together all aspects of the design and implementation of measurement, instrumentation, and sensors. Reflecting the current state of the art, it describes the use of instruments and techniques for performing practical measurements in engineering, physics, chemistry, and the life sciences and discusses processing systems, automatic data acquisition, reduction and analysis, operation characteristics, accuracy, errors, calibrations, and the incorporation of standards for control purposes. Organized according to measurement problem, the Spatial, Mechanical, Thermal, and Radiation Measurement volume of the Second Edition: Contains contributions from field experts, new chapters, and updates to all 96 existing chapters Covers instrumentation and measurement concepts, spatial and mechanical variables, displacement, acoustics, flow and spot velocity, radiation, wireless sensors and instrumentation, and control and human factors A concise and useful reference for engineers, scientists, academic faculty, students, designers, managers, and industry professionals involved in instrumentation and measurement research and development, Measurement, Instrumentation, and Sensors Handbook, Second Edition: Spatial, Mechanical, Thermal, and Radiation Measurement provides readers with a greater understanding of advanced applications.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 522
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Book Description
Author: Andy Wu
Publisher:
ISBN: 9783037857168
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systems--covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
