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Author: Wade H. Shafer
Publisher: Springer Science & Business Media
ISBN: 1461573947
Category : Science
Languages : en
Pages : 430
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Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Oata Analysis and Synthesis (CINOAS) * at Purdue. University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volumes were handled by an interna tional publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 33 (thesis year 1988) a total of 13,273 theses titles from 23 Canadian and 1 85 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this important annual reference work. While Volume 33 reports theses submitted in 1988, on occasion, certain univer sities do report theses submitted in previous years but not reported at the time.
Author: Wade H. Shafer
Publisher: Springer Science & Business Media
ISBN: 1461573947
Category : Science
Languages : en
Pages : 430
Get Book Here
Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Oata Analysis and Synthesis (CINOAS) * at Purdue. University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volumes were handled by an interna tional publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 33 (thesis year 1988) a total of 13,273 theses titles from 23 Canadian and 1 85 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this important annual reference work. While Volume 33 reports theses submitted in 1988, on occasion, certain univer sities do report theses submitted in previous years but not reported at the time.
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: Klaus Echtle
Publisher: Springer Science & Business Media
ISBN: 9783540584261
Category : Computers
Languages : en
Pages : 642
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Book Description
This book presents the proceedings of the First European Dependable Computing Conference (EDCC-1), held in Berlin, Germany, in October 1994. EDCC is the merger of two former European events on dependable computing. The volume comprises 34 refereed full papers selected from 106 submissions. The contributions address all current aspects of dependable computing and reflect the state of the art in dependable systems research and advanced applications; among the topics covered are hardware and software reliability, safety-critical and secure systems, fault-tolerance and detection, verification and validation, formal methods, hardware and software testing, and parallel and distributed systems.
Author:
Publisher:
ISBN:
Category : Computer storage devices
Languages : en
Pages : 1012
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Book Description
Author: Matteo Sonza Reorda
Publisher: Springer Science & Business Media
ISBN: 1846281458
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Author:
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Category :
Languages : en
Pages : 88
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Book Description
Author: Institut national polytechnique (Grenoble). Club conception de circuits à la demande
Publisher:
ISBN:
Category : Application specific integrated circuits
Languages : en
Pages : 506
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Book Description
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Category : Aeronautics
Languages : en
Pages : 994
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Book Description
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 508
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Book Description
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 550
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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
