34th International Field Emission Symposium PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download 34th International Field Emission Symposium PDF full book. Access full book title 34th International Field Emission Symposium by Shogo Nakamura. Download full books in PDF and EPUB format.
Author: Shogo Nakamura
Publisher:
ISBN:
Category : Electric discharges
Languages : en
Pages : 644
Get Book Here
Book Description
Author: Shogo Nakamura
Publisher:
ISBN:
Category : Electric discharges
Languages : en
Pages : 644
Get Book Here
Book Description
Author: A. Cerezo
Publisher:
ISBN:
Category : Field emission
Languages : en
Pages : 596
Get Book Here
Book Description
Author: Michael K. Miller
Publisher: Springer Science & Business Media
ISBN: 1461542812
Category : Technology & Engineering
Languages : en
Pages : 247
Get Book Here
Book Description
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Author: J. H. Block
Publisher:
ISBN:
Category : Field emission
Languages : en
Pages : 644
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 624
Get Book Here
Book Description
Author: ASM International
Publisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 536
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 308
Get Book Here
Book Description
Author: Oak Ridge National Laboratory
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 564
Get Book Here
Book Description
Author: Flavio Manenti
Publisher: Elsevier
ISBN: 0443288259
Category : Technology & Engineering
Languages : en
Pages : 3634
Get Book Here
Book Description
The 34th European Symposium on Computer Aided Process Engineering / 15th International Symposium on Process Systems Engineering, contains the papers presented at the 34th European Symposium on Computer Aided Process Engineering / 15th International Symposium on Process Systems Engineering joint event. It is a valuable resource for chemical engineers, chemical process engineers, researchers in industry and academia, students, and consultants for chemical industries. - Presents findings and discussions from the 34th European Symposium on Computer Aided Process Engineering / 15th International Symposium on Process Systems Engineering joint event
