Author: IEEE Staff
Publisher:
ISBN: 9781479983056
Category :
Languages : en
Pages :
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Book Description
The Conference presents new developments in test structures, their implementation, and or application in the fields of silicon, compound semiconductor, nanotechnology, and MEMS research, including their implementation and applications, as well as test structures aimed at the characterization of new materials and devices
Author: Colin McAndrew
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN: 9781479983049
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN: 9781479983025
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN: 9781467387934
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 230
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Book Description
Author: IEEE Staff
Publisher:
ISBN: 9781509036165
Category :
Languages : en
Pages :
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Book Description
The scope of this conference is to bring together designers and users of test structures to discuss recent developments and futures directions
Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780308572
Category : Integrated circuits
Languages : en
Pages : 298
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Book Description
This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.
