2012 ESD Basics for the Program Manager Tutorial PDF Download
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Author: EOS/ESD Association, Incorporated
Publisher:
ISBN: 9781585372201
Category :
Languages : en
Pages :
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Book Description
Author: EOS/ESD Association, Incorporated
Publisher:
ISBN: 9781585372201
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: EOS/ESD Association, Incorporated
Publisher:
ISBN: 9781585371099
Category :
Languages : en
Pages : 86
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Book Description
Author: EOS/ESD Association, Incorporated
Publisher:
ISBN: 9781585371303
Category :
Languages : en
Pages : 86
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Book Description
Author: Steven H. Voldman
Publisher: John Wiley & Sons
ISBN: 0470979712
Category : Technology & Engineering
Languages : en
Pages : 244
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Book Description
Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as provides a coherent overview of the semiconductor manufacturing environment and the final system assembly. It provides an illuminating look into the integration of ESD protection networks followed by examples in specific technologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturing issues, ESD semiconductor chip design, and system problems confronted today as well as the future of ESD phenomena and nano-technology. Look inside for extensive coverage on: The fundamentals of electrostatics, triboelectric charging, and how they relate to present day manufacturing environments of micro-electronics to nano-technology Semiconductor manufacturing handling and auditing processing to avoid ESD failures ESD, EOS, EMI, EMC, and latchup semiconductor component and system level testing to demonstrate product resilience from human body model (HBM), transmission line pulse (TLP), charged device model (CDM), human metal model (HMM), cable discharge events (CDE), to system level IEC 61000-4-2 tests ESD on-chip design and process manufacturing practices and solutions to improve ESD semiconductor chip solutions, also practical off-chip ESD protection and system level solutions to provide more robust systems System level concerns in servers, laptops, disk drives, cell phones, digital cameras, hand held devices, automobiles, and space applications Examples of ESD design for state-of-the-art technologies, including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, magnetic recording technology, micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to Product Use complements the author’s series of books on ESD protection. For those new to the field, it is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic Era.
Author: G. Theodore Dangelmayer
Publisher: Springer Science & Business Media
ISBN: 1461311799
Category : Technology & Engineering
Languages : en
Pages : 343
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Book Description
In today's electronics business, managing an ESD progranris an integral part of a complete quality program. In fact, any electronics firm without an active ESD program puts itself and its customers at risk. This book illustrates one good example of the detail and dedication to quality that AT&T expects within its own operations and from its suppliers. Writing of the book began at a time when Ted Dangelmayer was burdened with many demands. These demands were from AT&T's own operations, internal suppliers, external suppliers, customers and others looking for a better understanding of the phenomenon of ESD, its impact and, most of all, ways to control and manage it. In a way, this book is a response to these demands by making available a reader friendly document that distills the hard-won experiences of Ted and AT&T. The information and methods in this book have been gained at no small cost and produce results that far exceed eXRenses. There is, however, a caveat: Success will not be obtained unless there is real management commitment. This means management must allocate the necessary resources and provide active support to ensure that training, auditing, reporting, tracking and an aggressive corrective action program all take place successfully. Ted is an internationally recognized authority, and you will benefit greatly by listening to his advice and following his recommendations.
Author: United States. Office of the Chief of Naval Operations
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 828
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Book Description
Author: John Stark
Publisher: Springer Nature
ISBN: 3030985784
Category : Technology & Engineering
Languages : en
Pages : 630
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Book Description
This fifth edition of “Product Lifecycle Management” updates and adds to the successful fourth edition, the most frequently cited PLM publication. It gives the reader a thorough explanation of Product Lifecycle Management (PLM) and provides them with a full understanding and the skills to implement PLM within their own business environment. This new and expanded edition is fully updated to reflect the many technological and management advances made in PLM since the release of the fourth edition. “Product Lifecycle Management” will broaden the reader’s understanding of PLM, nurturing the skills needed to implement PLM successfully and to achieve world-class product performance across the lifecycle. Among the components of PLM described are product-related business processes, product data, product data management (PDM) systems, other PLM applications, best practices, company objectives and organisation. This book also describes the relationships of PLM with the Internet of Things, Industry 4.0, Digital Twins and Digital Threads. “Product Lifecycle Management” (5th edition) explains what PLM is, and why it is needed. It describes the environment in which products are ideated, developed, manufactured, supported and retired, before addressing the main components of PLM and PLM Initiatives. Key activities in PLM Initiatives described include organisational change management (OCM) and project management. The final part of the book addresses the PLM Initiative, showing the typical steps and activities of a PLM project or initiative.
Author: Mike Meyers
Publisher: McGraw Hill Professional
ISBN: 0071795561
Category : Computers
Languages : en
Pages : 625
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Book Description
Bestselling CompTIA A+ author Mike Meyers provides 130+ hands-on, step-by-step labs—updated for the 2012 exams—so you can practice the IT skills essential for your success With coverage of CompTIA A+ certification exams 220-801 and 220-802, Mike Meyers’ CompTIA A+ Guide to Managing and Troubleshooting PCs Lab Manual, Fourth Edition contains more than 130 labs that challenge you to solve real-world problems with key concepts. Clear, measurable lab objectives map to certification exam objectives, ensuring direct correspondence to Mike Meyers’ CompTIA A+ Guide to Managing and Troubleshooting PCs, Fourth Edition. Lab solutions are only available to instructors and are not printed inside the book. The Lab Manual also includes materials lists and lab set-up instructions. Step-by-step, not click-by click, lab scenarios require you to think critically, and Hint and Warning icons guide you through potentially tricky situations. Post-lab observation questions measure your understanding of lab results and the key term quiz helps to build your vocabulary.
Author: Mike Meyers
Publisher: McGraw Hill Professional
ISBN: 007179591X
Category : Computers
Languages : en
Pages : 1363
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Book Description
"Written by the leading authority on CompTIA A+ certification and training, this instructive, full-color guide will help you pass CompTIA A+ exams 220-801 and 220-802 and become an expert hardware technician. Mike Meyers' CompTIA A+ Guide to Managing and Troubleshooting PCs, Fourth Edition is completely up-to-date with the new CompTIA A+ standards. Inside, you'll find helpful on-the-job tips, end-of-chapter practice questions, and hundreds of photographs and illustrations. Answers and solutions to the end-of-chapter sections are only available to instructors and are not printed inside the book." Amazon.com viewed 6/5/2020
Author: Buckler, Carolee
Publisher: UNESCO
ISBN: 9231000535
Category : Environmental education
Languages : en
Pages : 198
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Book Description
