2011 IEEE International Conference on Microelectronic Test Structures (ICMTS 2011) PDF Download
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Author:
Publisher:
ISBN: 9781424485277
Category :
Languages : en
Pages : 179
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Author:
Publisher:
ISBN: 9781424485277
Category :
Languages : en
Pages : 179
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Book Description
Author:
Publisher:
ISBN: 9781424485284
Category : Electronic apparatus and appliances
Languages : en
Pages :
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Author: IEEE Electron Devices Society
Publisher:
ISBN: 9781424485260
Category :
Languages : en
Pages : 179
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 48
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Author:
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ISBN: 9781467387934
Category :
Languages : en
Pages :
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Author: Bernhard Beckert
Publisher: Springer
ISBN: 364235887X
Category : Computers
Languages : en
Pages : 363
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Book Description
Formal methods have been applied successfully to the verification of medium-sized programs in protocol and hardware design for some time. However, their application to the development of large systems requires more emphasis on specification, modeling, and validation techniques supporting the concepts of reusability and modifiability, and their implementation in new extensions of existing programming languages like Java. This book contains 20 revised papers submitted after the 10th Symposium on Formal Methods for Components and Objects, FMCO 2011, which was held in Turin, Italy, in October 2011. Topics covered include autonomic service-component ensembles; trustworthy eternal systems via evolving software, data, and knowledge; parallel patterns for adaptive heterogeneous multicore systems; programming for future 3D architectures with many cores; formal verification of object oriented software; and an infrastructure for reliable computer systems.
Author: Yoichi Tomaki
Publisher:
ISBN:
Category :
Languages : en
Pages : 34
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Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780308572
Category : Integrated circuits
Languages : en
Pages : 298
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Book Description
This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.
Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780352704
Category : Technology & Engineering
Languages : en
Pages : 235
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Book Description
The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.
Author:
Publisher:
ISBN: 9781479921928
Category : Microelectronics
Languages : en
Pages :
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