17th IEEE VLSI Test Symposium PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download 17th IEEE VLSI Test Symposium PDF full book. Access full book title 17th IEEE VLSI Test Symposium by . Download full books in PDF and EPUB format.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769501468
Category : Computers
Languages : en
Pages : 534
Get Book Here
Book Description
The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769501468
Category : Computers
Languages : en
Pages : 534
Get Book Here
Book Description
The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Get Book Here
Book Description
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
Get Book Here
Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769506135
Category : Computers
Languages : en
Pages : 528
Get Book Here
Book Description
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Author: S. Rajaram
Publisher: Springer
ISBN: 9811359504
Category : Computers
Languages : en
Pages : 728
Get Book Here
Book Description
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 580
Get Book Here
Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author: Manoj Singh Gaur
Publisher: Springer
ISBN: 3642420249
Category : Computers
Languages : en
Pages : 403
Get Book Here
Book Description
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Author: Gordon Brebner
Publisher: Springer Science & Business Media
ISBN: 3540424997
Category : Computers
Languages : en
Pages : 681
Get Book Here
Book Description
This book constitutes the refereed proceedings of the 11th International Conference on Field-Programmable Logic and Application, FPL 2001, held in Belfast, Northern Ireland, UK, in August 2001. The 56 revised full papers and 15 short papers presented were carefully reviewed and selected from a total of 117 submissions. The book offers topical sections on architectural framework, place and route, architecture, DSP, synthesis, encryption, runtime reconfiguration, graphics and vision, networking, processor interaction, applications, methodology, loops and systolic, image processing, faults, and arithmetic.
Author: Anirban Sengupta
Publisher: Springer
ISBN: 9813297670
Category : Computers
Languages : en
Pages : 782
Get Book Here
Book Description
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Author: Heinrich Begehr
Publisher: Springer Science & Business Media
ISBN: 9783764359430
Category : Mathematics
Languages : en
Pages : 1840
Get Book Here
Book Description
This little book is conceived as a service to mathematicians attending the 1998 International Congress of Mathematicians in Berlin. It presents a comprehensive, condensed overview of mathematical activity in Berlin, from Leibniz almost to the present day (without, however, including biographies of living mathematicians). Since many towering figures in mathematical history worked in Berlin, most of the chapters of this book are concise biographies. These are held together by a few survey articles presenting the overall development of entire periods of scientific life at Berlin. Overlaps between various chapters and differences in style between the chap ters were inevitable, but sometimes this provided opportunities to show different aspects of a single historical event - for instance, the Kronecker-Weierstrass con troversy. The book aims at readability rather than scholarly completeness. There are no footnotes, only references to the individual bibliographies of each chapter. Still, we do hope that the texts brought together here, and written by the various authors for this volume, constitute a solid introduction to the history of Berlin mathematics.
