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Author: D.M. Walker
Publisher: Springer Science & Business Media
ISBN: 1475719310
Category : Computers
Languages : en
Pages : 214
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Book Description
In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately half of the chip area, so I considered adding spare rows and columns to increase ROM yield. Laser-programmed polysilicon fuses would be used to switch between good and bad circuits. Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. The fabrication technology did not yet exist, so I was unable to experimentally verify the benefits of redundancy. When the technology did become available, it would be too late in the development schedule to spend time running test chips. The yield analysis had to be done analytically or by simulation. Analytic yield analysis techniques did not offer sufficient accuracy for dealing with complex structures. The simulation techniques then available were very labor-intensive and seemed more suitable for redundant memories and other very regular structures [Stapper 80J. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator. Since I was unable to convince anyone to build such a simulator for me, I embarked on the research myself.
Author: D.M. Walker
Publisher: Springer Science & Business Media
ISBN: 1475719310
Category : Computers
Languages : en
Pages : 214
Get Book Here
Book Description
In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately half of the chip area, so I considered adding spare rows and columns to increase ROM yield. Laser-programmed polysilicon fuses would be used to switch between good and bad circuits. Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. The fabrication technology did not yet exist, so I was unable to experimentally verify the benefits of redundancy. When the technology did become available, it would be too late in the development schedule to spend time running test chips. The yield analysis had to be done analytically or by simulation. Analytic yield analysis techniques did not offer sufficient accuracy for dealing with complex structures. The simulation techniques then available were very labor-intensive and seemed more suitable for redundant memories and other very regular structures [Stapper 80J. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator. Since I was unable to convince anyone to build such a simulator for me, I embarked on the research myself.
Author: José Pineda de Gyvez
Publisher: John Wiley & Sons
ISBN: 0780334477
Category : Technology & Engineering
Languages : en
Pages : 338
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Book Description
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Author: Rob A. Rutenbar
Publisher: John Wiley & Sons
ISBN: 047122782X
Category : Technology & Engineering
Languages : en
Pages : 773
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Book Description
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Author: Egon Börger
Publisher: Springer Science & Business Media
ISBN: 3642571999
Category : Computers
Languages : en
Pages : 363
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Book Description
This state-of-the-art survey gives a systematic presentation of recent advances in the design and validation of computer architectures. The book covers a comprehensive range of architecture design and validation methods, from computer aided high-level design of VLSI circuits and systems to layout and testable design, including the modeling and synthesis of behavior and dataflow, cell-based logic optimization, machine assisted verification, and virtual machine design.
Author: Andreas Kuehlmann
Publisher: Springer Science & Business Media
ISBN: 1461502926
Category : Computers
Languages : en
Pages : 699
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Book Description
In 2002, the International Conference on Computer Aided Design (ICCAD) celebrates its 20th anniversary. This book commemorates contributions made by ICCAD to the broad field of design automation during that time. The foundation of ICCAD in 1982 coincided with the growth of Large Scale Integration. The sharply increased functionality of board-level circuits led to a major demand for more powerful Electronic Design Automation (EDA) tools. At the same time, LSI grew quickly and advanced circuit integration became widely avail able. This, in turn, required new tools, using sophisticated modeling, analysis and optimization algorithms in order to manage the evermore complex design processes. Not surprisingly, during the same period, a number of start-up com panies began to commercialize EDA solutions, complementing various existing in-house efforts. The overall increased interest in Design Automation (DA) re quired a new forum for the emerging community of EDA professionals; one which would be focused on the publication of high-quality research results and provide a structure for the exchange of ideas on a broad scale. Many of the original ICCAD volunteers were also members of CANDE (Computer-Aided Network Design), a workshop of the IEEE Circuits and Sys tem Society. In fact, it was at a CANDE workshop that Bill McCalla suggested the creation of a conference for the EDA professional. (Bill later developed the name).
Author: Bruno Ciciani
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computers
Languages : en
Pages : 452
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Book Description
A practical understanding of these concepts and their application can help to reduce the chance of having device failures.
Author: Charles Chiang
Publisher: Springer Science & Business Media
ISBN: 1402051883
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
Author: Larry M. Augustin
Publisher: Springer Science & Business Media
ISBN: 1461540429
Category : Technology & Engineering
Languages : en
Pages : 325
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Book Description
The VHSIC Hardware Description Language (VHDL) provides a standard machine processable notation for describing hardware. VHDL is the result of a collaborative effort between IBM, Intermetrics, and Texas Instruments; sponsored by the Very High Speed Integrated Cir cuits (VHSIC) program office of the Department of Defense, beginning in 1981. Today it is an IEEE standard (1076-1987), and several simulators and other automated support tools for it are available commercially. By providing a standard notation for describing hardware, especially in the early stages of the hardware design process, VHDL is expected to reduce both the time lag and the cost involved in building new systems and upgrading existing ones. VHDL is the result of an evolutionary approach to language devel opment starting with high level hardware description languages existing in 1981. It has a decidedly programming language flavor, resulting both from the orientation of hardware languages of that time, and from a ma jor requirement that VHDL use Ada constructs wherever appropriate. During the 1980's there has been an increasing current of research into high level specification languages for systems, particularly in the software area, and new methods of utilizing specifications in systems de velopment. This activity is worldwide and includes, for example, object oriented design, various rigorous development methods, mathematical verification, and synthesis from high level specifications. VAL (VHDL Annotation Language) is a simple further step in the evolution of hardware description languages in the direction of applying new methods that have developed since VHDL was designed.
Author: Manoj Sachdev
Publisher: Springer Science & Business Media
ISBN: 0387465472
Category : Technology & Engineering
Languages : en
Pages : 343
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Book Description
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Author: Donald E. Thomas
Publisher: Springer Science & Business Media
ISBN: 1461315190
Category : Technology & Engineering
Languages : en
Pages : 313
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Book Description
Recently there has been increased interest in the development of computer-aided design programs to support the system level designer of integrated circuits more actively. Such design tools hold the promise of raising the level of abstraction at which an integrated circuit is designed, thus releasing the current designers from many of the details of logic and circuit level design. The promise further suggests that a whole new group of designers in neighboring engineering and science disciplines, with far less understanding of integrated circuit design, will also be able to increase their productivity and the functionality of the systems they design. This promise has been made repeatedly as each new higher level of computer-aided design tool is introduced and has repeatedly fallen short of fulfillment. This book presents the results of research aimed at introducing yet higher levels of design tools that will inch the integrated circuit design community closer to the fulfillment of that promise. 1. 1. SYNTHESIS OF INTEGRATED CmCUITS In the integrated circuit (Ie) design process, a behavior that meets certain specifications is conceived for a system, the behavior is used to produce a design in terms of a set of structural logic elements, and these logic elements are mapped onto physical units. The design process is impacted by a set of constraints as well as technological information (i. e. the logic elements and physical units used for the design).
